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公开(公告)号:US20090321893A1
公开(公告)日:2009-12-31
申请号:US12215761
申请日:2008-06-30
申请人: Dinesh Somasekhar , Tanay Karnik , Jianping Xu , Yibin Ye
发明人: Dinesh Somasekhar , Tanay Karnik , Jianping Xu , Yibin Ye
IPC分类号: H01L29/40
CPC分类号: H01L25/18 , G11C5/02 , G11C5/063 , H01L23/481 , H01L23/5286 , H01L2224/05573 , H01L2224/13025 , H01L2224/16225 , H01L2225/06513 , H01L2225/06527 , H01L2225/06541 , H01L2924/00014 , H01L2224/05599
摘要: In some embodiments, provided is an integrated circuit with a first die coupled to a second die. The second die has through-silicon vias disposed through it to provide power references to the first die. The through-silicon vias are laterally re-positionable without inhibiting circuit sections in the second die.
摘要翻译: 在一些实施例中,提供了具有与第二管芯耦合的第一管芯的集成电路。 第二裸片具有穿过其设置的通硅通孔,以提供对第一裸片的功率参考。 贯通硅通孔可横向重新定位,而不会妨碍第二管芯中的电路部分。
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公开(公告)号:US20080082899A1
公开(公告)日:2008-04-03
申请号:US11542007
申请日:2006-09-29
申请人: Khellah Muhammad , Dinesh Somasekhar , Yibin Ye , Nam Sung Kim , Vivek De
发明人: Khellah Muhammad , Dinesh Somasekhar , Yibin Ye , Nam Sung Kim , Vivek De
IPC分类号: G11C29/00
CPC分类号: G11C29/42 , G11C11/4125 , G11C11/417 , G11C29/02 , G11C29/021 , G11C29/028 , G11C29/12005 , G11C29/50 , G11C2029/0409 , G11C2029/0411 , G11C2029/5004
摘要: For one disclosed embodiment, an apparatus comprises memory circuitry including memory cells, error detection circuitry to detect error in data stored by memory cells of the memory circuitry, and supply voltage control circuitry to increase supply voltage for one or more memory cells of the memory circuitry based at least in part on detected error. Other embodiments are also disclosed.
摘要翻译: 对于一个所公开的实施例,一种装置包括存储器电路,其包括存储器单元,用于检测由存储器电路的存储器单元存储的数据中的错误的错误检测电路,以及用于增加存储器电路的一个或多个存储器单元的电源电压 至少部分地基于检测到的错误。 还公开了其他实施例。
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公开(公告)号:US20060114711A1
公开(公告)日:2006-06-01
申请号:US11001870
申请日:2004-12-01
申请人: Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Gunjan Pandya , Vivek De
发明人: Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Gunjan Pandya , Vivek De
IPC分类号: G11C11/00
CPC分类号: G11C11/419
摘要: In one embodiment, a memory array is provided comprising one or more columns each comprising a plurality of bit cells divided into groups of bit cells with each group of bit cells controllably coupled to a separate bit line.
摘要翻译: 在一个实施例中,提供了包括一个或多个列的存储器阵列,每个列包括被分成位单元组的多个位单元,每组比特单元可控制地耦合到单独的位线。
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公开(公告)号:US20050226032A1
公开(公告)日:2005-10-13
申请号:US10812894
申请日:2004-03-31
申请人: Stephen Tang , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Vivek De , James Tschanz
发明人: Stephen Tang , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Vivek De , James Tschanz
IPC分类号: G11C11/00
CPC分类号: G11C11/412
摘要: A SRAM device is provided having a plurality of memory cells. Each memory cell may include a plurality of transistors coupled in a cross-coupled inverter configuration. An NMOS transistor may be coupled to a body of the two PMOS transistors in the cross-coupled inverter configuration so as to apply a forward body bias to the PMOS transistors of the cross-coupled inverter configuration. A power control unit may control a supply voltage to each of the PMOS transistors as well as apply the switching signal to the NMOS transistor based on a STANDBY mode of the memory cell.
摘要翻译: 提供具有多个存储单元的SRAM器件。 每个存储单元可以包括以交叉耦合的反相器配置耦合的多个晶体管。 NMOS晶体管可以以交叉耦合的反相器配置耦合到两个PMOS晶体管的主体,以便向交叉耦合的反相器配置的PMOS晶体管施加正向偏置。 功率控制单元可以控制每个PMOS晶体管的电源电压,并且基于存储器单元的STANDBY模式将开关信号施加到NMOS晶体管。
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公开(公告)号:US08769376B2
公开(公告)日:2014-07-01
申请号:US13626435
申请日:2012-09-25
申请人: Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Nam Sung Kim , Vivek De
发明人: Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Nam Sung Kim , Vivek De
IPC分类号: G11C29/00
CPC分类号: G11C29/42 , G11C11/4125 , G11C11/417 , G11C29/02 , G11C29/021 , G11C29/028 , G11C29/12005 , G11C29/50 , G11C2029/0409 , G11C2029/0411 , G11C2029/5004
摘要: Described herein is an apparatus for adjusting a power supply level for a memory cell to improve stability of a memory unit. The apparatus comprises memory circuitry including memory cells, error detection circuitry to detect error in data stored by memory cells of the memory circuitry, and supply voltage control circuitry to increase supply voltage for one or more memory cells of the memory circuitry based at least in part on detected error.
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公开(公告)号:US20060268626A1
公开(公告)日:2006-11-30
申请号:US11137905
申请日:2005-05-25
申请人: Fatih Hamzaoglu , Kevin Zhang , Nam Kim , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Vivek De , Bo Zheng
发明人: Fatih Hamzaoglu , Kevin Zhang , Nam Kim , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Vivek De , Bo Zheng
IPC分类号: G11C7/10
CPC分类号: G11C5/14 , G11C11/413
摘要: In some embodiments, a memory array is provided with cells that when written to or read from, can have modified supplies to enhance their read stability and/or write margin performance. Other embodiments may be disclosed and/or claimed.
摘要翻译: 在一些实施例中,存储器阵列具有当写入或读取时可以具有修改的电源以增强其读取稳定性和/或写入裕度性能的单元。 可以公开和/或要求保护其他实施例。
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公开(公告)号:US20060104128A1
公开(公告)日:2006-05-18
申请号:US11320789
申请日:2005-12-30
申请人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
发明人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
IPC分类号: G11C7/10
CPC分类号: G11C5/143 , G11C5/147 , G11C11/413
摘要: An apparatus and method are provided for limiting a drop of a supply voltage in an SRAM device to retain the state of the memory during an IDLE state. The apparatus may include a memory array, a sleep device, and a clamping circuit. The clamping circuit may be configured to activate the sleep device when a voltage drop across the memory array falls below a preset voltage and the memory array is in an IDLE state.
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公开(公告)号:US20050135162A1
公开(公告)日:2005-06-23
申请号:US10738216
申请日:2003-12-18
申请人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
发明人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
IPC分类号: G11C5/00 , G11C5/14 , G11C11/413
CPC分类号: G11C5/143 , G11C5/147 , G11C11/413
摘要: An apparatus and method are provided for limiting a drop of a supply voltage in an SRAM device to retain the state of the memory during an IDLE state. The apparatus may include a memory array, a sleep device, and a clamping circuit. The clamping circuit may be configured to activate the sleep device when a voltage drop across the memory array falls below a preset voltage and the memory array is in an IDLE state.
摘要翻译: 提供了一种用于限制SRAM装置中的电源电压下降以保持IDLE状态期间存储器的状态的装置和方法。 该装置可以包括存储器阵列,睡眠装置和钳位电路。 钳位电路可以被配置为当存储器阵列上的电压降低于预设电压并且存储器阵列处于空闲状态时激活睡眠装置。
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99.
公开(公告)号:US06724648B2
公开(公告)日:2004-04-20
申请号:US10117163
申请日:2002-04-05
申请人: Muhammad Khellah , Vivek De , Dinesh Somasekhar , Yibin Ye
发明人: Muhammad Khellah , Vivek De , Dinesh Somasekhar , Yibin Ye
IPC分类号: G11C1140
CPC分类号: G11C11/417
摘要: A power management device and static random access memory (SRAM) architecture with dynamic supply voltages reduce active power leakage in SRAM cells. When a cell is inactive, a low level supply voltage is applied to the source line connected to the cell to maintain the data stored in the cell. However, before a cell is accessed (e.g., during a read or write operation), the source line is raised to a high level supply voltage.
摘要翻译: 具有动态电源电压的电源管理器件和静态随机存取存储器(SRAM)架构降低了SRAM单元中的有功功率泄漏。 当单元不活动时,低电平电源电压被施加到连接到单元的源极线以维持存储在单元中的数据。 然而,在单元被访问之前(例如,在读取或写入操作期间),源极线被升高到高电平电源电压。
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公开(公告)号:US20130024752A1
公开(公告)日:2013-01-24
申请号:US13626435
申请日:2012-09-25
申请人: Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Nam Sung Kim , Vivek De
发明人: Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Nam Sung Kim , Vivek De
IPC分类号: G06F11/07
CPC分类号: G11C29/42 , G11C11/4125 , G11C11/417 , G11C29/02 , G11C29/021 , G11C29/028 , G11C29/12005 , G11C29/50 , G11C2029/0409 , G11C2029/0411 , G11C2029/5004
摘要: Described herein is an apparatus for adjusting a power supply level for a memory cell to improve stability of a memory unit. The apparatus comprises memory circuitry including memory cells, error detection circuitry to detect error in data stored by memory cells of the memory circuitry, and supply voltage control circuitry to increase supply voltage for one or more memory cells of the memory circuitry based at least in part on detected error.
摘要翻译: 这里描述了一种用于调整存储器单元的电源电平以提高存储器单元的稳定性的装置。 该装置包括存储器电路,其包括存储器单元,用于检测由存储器电路的存储器单元存储的数据中的错误的误差检测电路,以及供应电压控制电路,用于至少部分地增加存储器电路的一个或多个存储器单元的电源电压 检测到错误。
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