REFERENCE LEVEL ADJUSTMENT SCHEME
    101.
    发明申请
    REFERENCE LEVEL ADJUSTMENT SCHEME 审中-公开
    参考水平调整方案

    公开(公告)号:US20140071739A1

    公开(公告)日:2014-03-13

    申请号:US13613100

    申请日:2012-09-13

    IPC分类号: G11C11/16

    摘要: A tunable reference cell scheme for magnetic random access memory (MRAM) circuitry selectively couples reference cells and data cells to shared write driver circuitry. Magnetic tunnel junctions (MTJs) in the reference cells can be programmed to a selected magnetic orientation using the shared write driver circuitry. The programmed reference cells can be merged with other programmed reference cells and/or with fixed reference cells to produce a tunable reference level for comparison with MTJ data cells during a read operation. Sharing write driver circuitry between data cells and reference cells allows programming of reference cells without consuming increased area on a chip or macro.

    摘要翻译: 用于磁随机存取存储器(MRAM)电路的可调谐参考单元方案选择性地将参考单元和数据单元耦合到共享写入驱动器电路。 可以使用共享写入驱动器电路将参考单元中的磁隧道结(MTJ)编程为选定的磁方向。 编程的参考单元可以与其他编程的参考单元和/或与固定参考单元合并,以产生可读参考水平,以便在读操作期间与MTJ数据单元进行比较。 在数据单元和参考单元之间共享写入驱动器电路可以编程参考单元,而不会消耗芯片或宏上的增加的面积。

    Programmable logic sensing in magnetic random access memory
    103.
    发明授权
    Programmable logic sensing in magnetic random access memory 有权
    磁性随机存取存储器中的可编程逻辑检测

    公开(公告)号:US08593173B2

    公开(公告)日:2013-11-26

    申请号:US13244962

    申请日:2011-09-26

    IPC分类号: H03K19/177

    摘要: A Magnetic Random Access Memory (MRAM) logic circuit includes read sensing circuitry having a first level corresponding to a first category of logic circuitry and a second logic level corresponding to a second category of logic circuitry. The logic circuitry may be switchable between circuitry having the first logic level and circuitry having the second logic level according to the category of the logic circuit being implemented.

    摘要翻译: 磁性随机存取存储器(MRAM)逻辑电路包括具有对应于第一类逻辑电路的第一电平的读取感测电路和对应于第二类逻辑电路的第二逻辑电平。 逻辑电路可以在具有第一逻辑电平的电路和具有第二逻辑电平的电路之间根据所实现的逻辑电路的类别来切换。

    Method and apparatus for testing a resistive memory element
    104.
    发明授权
    Method and apparatus for testing a resistive memory element 失效
    用于测试电阻式存储器元件的方法和装置

    公开(公告)号:US08582354B1

    公开(公告)日:2013-11-12

    申请号:US13464060

    申请日:2012-05-04

    IPC分类号: G11C11/00 G11C7/00 G11C11/14

    摘要: Methods and apparatus for testing a resistive memory element are provided. In an example, an initial test resistor in a resistance network coupled to a first input of a sense amplifier is selected, where the resistive memory element is coupled to a second input of the sense amplifier and an output of the sense amplifier is measured. Another test resistor is selected based on the output of the sense amplifier and both the measuring the output step and the selecting another test resistor step are repeated until the output of the sense amplifier changes. A resistance of the resistive memory element is estimated based on the last test resistor selected, where the selected test resistors and the resistive memory element pass respective currents having substantially similar amplitudes and are coupled to respective access transistors having substantially similar properties.

    摘要翻译: 提供了用于测试电阻式存储元件的方法和装置。 在一个示例中,选择耦合到读出放大器的第一输入的电阻网络中的初始测试电阻器,其中电阻性存储器元件耦合到读出放大器的第二输入端,并测量读出放大器的输出。 基于读出放大器的输出选择另一个测试电阻器,并重复测量输出步骤,并重复选择另一个测试电阻器步骤,直到读出放大器的输出发生变化。 基于所选择的最后一个测试电阻来估计电阻性存储器元件的电阻,其中所选择的测试电阻器和电阻性存储器元件通过具有基本相似幅度的相应电流,并且耦合到具有基本上相似性质的相应的存取晶体管。

    Circuit and method for generating a reference level for a magnetic random access memory element
    105.
    发明授权
    Circuit and method for generating a reference level for a magnetic random access memory element 有权
    用于产生用于磁随机存取存储器元件的参考电平的电路和方法

    公开(公告)号:US08576617B2

    公开(公告)日:2013-11-05

    申请号:US13293565

    申请日:2011-11-10

    IPC分类号: G11C11/00 G11C11/14

    摘要: A method of establishing a reference level includes providing first and second non-overlapping paths from a first node to a second node, providing first and second reference magnetic random access memory (MRAM) elements in the first path, providing third and fourth reference MRAM elements in the second path, measuring a first value indicative of a resistance between the first node and the second node, and setting the reference level based at least in part on the measured value. Also an associated reference circuit.

    摘要翻译: 建立参考水平的方法包括提供从第一节点到第二节点的第一和第二非重叠路径,在第一路径中提供第一和第二参考磁随机存取存储器(MRAM)元件,提供第三和第四参考MRAM元件 在所述第二路径中,测量表示所述第一节点和所述第二节点之间的电阻的第一值,并且至少部分地基于所述测量值来设置所述参考电平。 还有一个相关的参考电路。

    Read sensing circuit and method with equalization timing
    107.
    发明授权
    Read sensing circuit and method with equalization timing 有权
    读取具有均衡定时的感测电路和方法

    公开(公告)号:US08537606B2

    公开(公告)日:2013-09-17

    申请号:US13033109

    申请日:2011-02-23

    IPC分类号: G11C11/14 G11C7/00

    CPC分类号: G11C7/08 G11C11/1673

    摘要: A Magnetic Random Access Memory (MRAM) includes read sensing circuitry having an equalizer device configured between a bit cell output node and a reference node of the bit cell. The equalizer is turned on to couple the output node to the reference node during an initial portion of a read operation and to decouple the output node from the reference node after an equalization delay period. A sense amplifier is enabled to provide a data output from the bit cell only after the delay period and decoupling of the output node from the reference node to provide balanced sensing speed of data represented by parallel and antiparallel state magnetic tunnel junctions (MTJs).

    摘要翻译: 磁性随机存取存储器(MRAM)包括具有配置在比特单元输出节点和比特单元的参考节点之间的均衡器装置的读取感测电路。 在读操作的初始部分期间,均衡器被导通以将输出节点耦合到参考节点,并且在均衡延迟周期之后将输出节点与参考节点去耦。 读出放大器能够仅在延迟周期之后从位单元提供数据输出,并且将输出节点与参考节点解耦,以提供由并行和反并联状态磁隧道结(MTJ)表示的数据的平衡感测速度。

    NON-VOLATILE FLIP-FLOP
    109.
    发明申请
    NON-VOLATILE FLIP-FLOP 有权
    非挥发性飞溅

    公开(公告)号:US20130194862A1

    公开(公告)日:2013-08-01

    申请号:US13361760

    申请日:2012-01-30

    IPC分类号: G11C11/16

    摘要: A flip-flop has an output control node and an isolation switch selectively couples a retention sense node to the output control node. A sense circuit selectively couples an external sense current source to the retention sense node and to magnetic tunneling junction (MTJ) elements. Optionally a write circuit selectively injects a write current through one MTJ element and then another MTJ element. Optionally, a write circuit injects a write current through a first MTJ element concurrently with injecting a write current through a second MTJ element.

    摘要翻译: 触发器具有输出控制节点,并且隔离开关选择性地将保持感测节点耦合到输出控制节点。 感测电路将外部感测电流源选择性地耦合到保持感测节点和磁性隧道结(MTJ)元件。 可选地,写入电路通过一个MTJ元件和另一个MTJ元件选择性地注入写入电流。 可选地,写入电路通过第一MTJ元件同时注入写入电流,并通过第二MTJ元件注入写入电流。

    Magnetic random access memory (MRAM) layout with uniform pattern
    110.
    发明授权
    Magnetic random access memory (MRAM) layout with uniform pattern 有权
    具有均匀图案的磁性随机存取存储器(MRAM)布局

    公开(公告)号:US08441850B2

    公开(公告)日:2013-05-14

    申请号:US12901074

    申请日:2010-10-08

    IPC分类号: G11C11/14

    摘要: A large scale memory array includes a uniform pattern of uniformly sized dummy bit cells and active bit cells. Sub-arrays within the large scale memory array are separated by the dummy bit cells. Signal distribution circuitry is formed with a width or height corresponding to the width or height of the dummy bit cells so that the signal distribution circuitry occupies the same footprint as the dummy bit cells without disrupting the uniform pattern across the large scale array. Edge dummy cells of a similar size or larger than the standard size bit cells may be placed around the edge of the large scale array to further reduce pattern loading affects.

    摘要翻译: 大规模存储器阵列包括统一大小的虚拟位单元和有源位单元的均匀图案。 大规模存储器阵列中的子阵列由虚拟位单元分隔开。 信号分配电路形成为具有对应于虚拟位单元的宽度或高度的宽度或高度,使得信号分配电路占据与虚拟位单元相同的覆盖区,而不会破坏整个大规模阵列上的均匀图案。 类似大小或大于标准尺寸位单元的边缘虚拟单元可以放置在大规模阵列的边缘周围,以进一步减少图案负载影响。