Resistive switching memory elements having improved switching characteristics
    102.
    发明申请
    Resistive switching memory elements having improved switching characteristics 有权
    具有改进的开关特性的电阻式开关存储元件

    公开(公告)号:US20130099191A1

    公开(公告)日:2013-04-25

    申请号:US13656908

    申请日:2012-10-22

    Abstract: Resistive-switching memory elements having improved switching characteristics are described, including a memory element having a first electrode and a second electrode, a switching layer between the first electrode and the second electrode comprising hafnium oxide and having a first thickness, and a coupling layer between the switching layer and the second electrode, the coupling layer comprising a material including metal titanium and having a second thickness that is less than 25 percent of the first thickness.

    Abstract translation: 描述了具有改进的开关特性的电阻式开关存储元件,包括具有第一电极和第二电极的存储元件,第一电极和第二电极之间的开关层,包括氧化铪并具有第一厚度,以及耦合层, 所述开关层和所述第二电极,所述耦合层包括包含金属钛并且具有小于所述第一厚度的25%的第二厚度的材料。

    Methods For Depositing High-K Dielectrics
    103.
    发明申请
    Methods For Depositing High-K Dielectrics 有权
    沉积高K电介质的方法

    公开(公告)号:US20130056852A1

    公开(公告)日:2013-03-07

    申请号:US13668488

    申请日:2012-11-05

    Abstract: Methods for depositing high-K dielectrics are described, including depositing a first electrode on a substrate, wherein the first electrode is chosen from the group consisting of platinum and ruthenium, applying an oxygen plasma treatment to the exposed metal to reduce the contact angle of a surface of the metal, and depositing a titanium oxide layer on the exposed metal using at least one of a chemical vapor deposition process and an atomic layer deposition process, wherein the titanium oxide layer comprises at least a portion rutile titanium oxide.

    Abstract translation: 描述了用于沉积高K电介质的方法,包括在衬底上沉积第一电极,其中第一电极选自铂和钌,对暴露的金属施加氧等离子体处理以减小接触角 并且使用化学气相沉积工艺和原子层沉积工艺中的至少一种在暴露的金属上沉积氧化钛层,其中所述氧化钛层包含至少一部分金红石型氧化钛。

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