Abstract:
To acquire defect images even when a defect exists below an optically transparent film, an electron optical system of an electron microscope is set to a first imaging condition. A defect position of a specimen is set so as to fall within the visual field of the electron microscope, using position data of a defect of the specimen. The position of the defect is imaged by the electron microscope set to the first imaging condition to obtain a first image corresponding to the defect position. The first image is processed to determine whether a defect exists. The electron optical system is then set to a second imaging condition on the basis of the result of determination. A point imaged under the first imaging condition is imaged by the electron microscope set to the second imaging condition to acquire a second image corresponding to a defect position.
Abstract:
In an ion bean acceleration system, transient electrical arc suppression and ion beam accelerator biasing circuitry. Two-terminal circuitry, connectable in series, for suppressing arcs by automatically sensing arc conditions and switch from at least a first operating state providing a relatively low resistance electrical pathway for current between source and load terminals to at least a second, relatively high resistance electrical pathway. Selection of circuit component characteristics permits controlling the delay in returning from the second state to the first state after the arc has been suppressed.
Abstract:
A high power, solid state power supply is described for producing a controllable, constant high voltage output under varying and arcing loads suitable for powering an electron beam gun or other ion source. The present power supply is most useful for outputs in a range of about 100-400 kW or more. The power supply is comprised of a plurality of discrete switching type dc-dc converter modules, each comprising a voltage regulator, an inductor, an inverter for producing a high frequency square wave current of alternating polarity, an improved inverter voltage clamping circuit, a step up transformer, and an output rectifier for producing a dc voltage at the output of each module. The inputs to the converter modules are fed from a common dc rectifier/filter and are linked together in parallel through decoupling networks to suppress high frequency input interactions. The outputs of the converter modules are linked together in series and connected to the input of the transmission line to the load through a decoupling and line matching network. The dc-dc converter modules are phase activated such that for n modules, each module is activated equally 360.degree./n out of phase with respect to a successive module. The phased activation of the converter modules, combined with the square current waveforms out of the step up transformers, allows the power supply to operate with greatly reduced output capacitance values which minimizes the stored energy available for discharge into an electron beam gun or the like during arcing. The present power supply also provides dynamic response to varying loads by controlling the voltage regulator duty cycle using simulated voltage feedback signals and voltage feedback loops. Circuitry is also provided for sensing incipient arc currents reflected at the output of the power supply and for simultaneously decoupling the power supply circuitry from the arcing load.
Abstract:
A high-power power supply produces a controllable, constant high voltage put under varying and arcing loads. The power supply includes a voltage regulator, an inductor, an inverter for producing a high frequency square wave current of alternating polarity, an improved inverter voltage clamping circuit, a step up transformer, an output rectifier for producing a dc voltage at the output of each module, and a current sensor for sensing output current. The power supply also provides dynamic response to varying loads by controlling the voltage regulator duty cycle and circuitry is provided for sensing incipient arc currents at the output of the power supply to simultaneously decouple the power supply circuitry from the arcing load. The power supply includes a plurality of discrete switching type dc--dc converter modules.
Abstract:
An electron-beam apparatus for thermal treatment by electron bombardment, comprising a power supply, a vacuum chamber accomodating an object being treated, an electron gun including a cathode which is the source of an electron flow and an accelerating electrode which, together with the cathode, forms the electron flow into an electron beam directed to the object being treated, and a supplementary source of accelerating voltage, one leadout which is connected to the cathode and the other leadout is coupled to the accelerating electrode, the cathode and the accelerating electrode being electrically insulated from each other and from the object being treated, and the power supply has one of its leadouts connected to the cathode and the other leadout connected to the object being treated.
Abstract:
An electron beam vapor source for use in laser enrichment of uranium and providing fast response intermittent vaporization to permit interruption of the enrichment process without wasting vapor or requiring long term reheating.
Abstract:
This invention relates to a field emission type electron gun capable of protecting the emitter tip from damage when electrical breakdown occurs in the gun chamber. The preferred embodiments incorporate circuitry for decreasing the impedance between the emitter and its associated electrode when electrical breakdown occurs.
Abstract:
This invention relates to a field emission type electron gun capable of protecting the emitter tip from damage when electrical breakdown occurs in the gun chamber. The preferred embodiments incorporate circuitry for decreasing the impedance between the emitter and its associated electrode when electrical breakdown occurs.
Abstract:
A high-voltage electron microscope is provided with a double focussing bending magnet for stabilizing the beam velocity. The beam path between an entrance diaphragm in front of the magnet and an image produced by the bending magnet of this diaphragm on the exit side of the magnet are used as a reference for the signal to be detected on the output side of the bending magnet. Near this image, a detector device is provided which intercepts a fraction of from 1 to 10 percent of the beam from which it derives a control signal for the high voltage.
Abstract:
A power supply is described for use with an electron gun employed in an electron beam furnace system. The power supply includes a transformer and a rectifier connecting the secondary of the transformer to the electron beam gun for supplying current thereto. The power supply also includes a semiconductor-switching circuit connected to the primary of the transformer for supplying current to the primary. The switching circuit is controlled by a pulsing circuit, and a trigger circuit is controlled by a pulsing circuit, and a trigger circuit is connected to the pulsing circuit and to means for sensing a rise in current to the electron gun in the presence of an arc. Upon the sensing of such rise in current, the trigger circuit disables the pulsing circuit to thereby render the switching circuit inoperative and cut off current to the electron beam gun.