摘要:
Small-scale measuring circuits (111-1qum) are arranged in m columns×q rows. The small-scale measuring circuits of each row (111-11m, 121-12m, 1q1-1qm) are connected in series. The respective rows are connected in parallel. Supplying reference signals B having different parameter values to the small-scale measuring circuits (111-11m, . . . ) connected in series makes it possible to improve the measurement range or measurement resolution. Supplying reference signals B having the same parameter to the respective rows can reduce a noise component depending on the transistor size. According to this invention, using a plurality of small-scale measuring circuits in accordance with required measurement performance concerning a measurement range, resolution, noise reduction, or the like can implement the desired performance while minimizing the area of each measuring circuit.
摘要:
In a wireless receiver that receives an electric signal that has undergone digital modulation, a sample-hold circuit converts a wireless modulated signal, which is a continuous time signal, to a discrete time signal, and the frequency band is converted and selected by means of a band-pass filter. A demodulation circuit carries out demodulation based on the instantaneous value of the voltage amplitude of the modulated signal. A shut-down circuit further effects adaptive control of the circuit shut-down time to minimize the circuit activation time while ensuring that the demodulation error rate of the demodulated baseband signal satisfies a value stipulated by the communication standard.
摘要:
In a three-dimensional semiconductor device in which a plurality of semiconductor circuit chips are stacked and that is provided with a plurality of interchip interconnections for signal transmission between these semiconductor circuit chips, when transmitting signals, only one interchip interconnection that serves for signal transmission is selected and other interchip interconnections are electrically isolated by means of switches that are provided between the interchip interconnections and signal lines. Interchip interconnection capacitance relating to the charge and discharge of interconnections is thus minimized.
摘要:
A clock converting circuit (1) receives and then converts m-phase clocks of a frequency f having a phase difference of 1/(f×m) to n-phase clocks of the frequency f having a phase difference of 1/(f×n). A single-phase clock generating circuit (2) receives the n-phase clocks of the frequency f having a phase difference equivalent time of 1/(f×n) to generate single-phase clocks in synchronism with the rising or falling edges of the n-phase clocks. Since the frequency of the m-phase clocks inputted to the clock converting circuit (1) is ‘f’, if a desired frequency of the single-phase clocks is decided, then ‘n’ can be obtained from the equation: the frequency of the single-phase clocks is equal to (f×n). This value of ‘n’ is set to the clock converting circuit (1), thereby obtaining the n-phase clocks of the frequency f from the m-phase clocks of the frequency f to provide single-phase clocks of a desired frequency.
摘要:
A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要:
An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要:
In manufacturing a segment-type wet friction material, each segment piece in a guide is pushed out and mounted on a rotating plate. Cut portions at opposite outer peripheral corners of the segment piece are fitted and engaged with two positioning pins so as to position the segment piece on the rotating plate. The segment piece is sucked by a pair of positioning suction holes located thereunder so as to be fastened. The rotating plate is turned 18 degrees and such operation is repeated until twenty segment piece are charged in a ring shape. Then, each two suction heads of a sucking/moving mechanism sucks surfaces of each segment piece. At the same time, a sucking operation of the positioning suction holes is stopped. Then, the twenty segment pieces arranged in the ring shape is lifted by the sucking/moving mechanism and moved in parallel to a core metal with an adhesive coated on an entire surface thereof. The twenty segment pieces are pressed to the core metal so as to adhere thereto.
摘要:
An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要:
A voltage controlled oscillator operates over a wide operating frequency range and reduces the fluctuation of the gain due to the fluctuation of the frequency characteristic. The variable frequency oscillator includes a first voltage/current converter for controlling the variable frequency oscillator such that the output oscillating frequency is varied by &Dgr;F hertz by changing the input voltage by &Dgr;V volt when the input voltage is less than a prescribed threshold voltage, and includes a second voltage/current converter for controlling the variable frequency oscillator such that the output oscillating frequency is varied by more than &Dgr;F hertz by changing the input voltage by &Dgr;V volt, when the input voltage exceeds a prescribed threshold voltage.
摘要:
This invention relates to an image forming apparatus constructed such that an upper frame is openably mounted on a main base frame and a pivotal movement transmitter (gear) is rotatably mounted on the upper frame about an axis of a rotation of the upper frame, i.e., in association with the rotation of the upper frame. The gear has a cam portion. One end of a lever comes into contact with part of the cam portion of the gear, while the opposite end of the lever comes into contact with a coil spring. Further, a distance from the pivotal axis of the gear to the contact position of the lever with the cam portion decreases in accordance with a proceeding of the closing operation. Accordingly, as the lever (cam follower) follows the cam portion in accordance with the closing operation of the upper frame, a compression force to compress the coil spring increases. Thereby, a brake force applied to the upper frame on the way of closing also increases.