公开(公告)号：US11646078B2

公开(公告)日：2023-05-09

申请号：US17199243

申请日：2021-03-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu ,  Stanley Hong ,  Feng Zhou ,  Xian Liu ,  Nhan Do

IPC: G11C7/22 ,  G11C13/00

CPC classification number: G11C13/004 ,  G11C13/003 ,  G11C13/0007 ,  G11C13/0023 ,  G11C13/0026 ,  G11C13/0028 ,  G11C13/0061 ,  G11C13/0064 ,  G11C13/0069 ,  G11C2013/009 ,  G11C2013/0042 ,  G11C2013/0054 ,  G11C2013/0066 ,  G11C2013/0078 ,  G11C2013/0083 ,  G11C2213/32 ,  G11C2213/52 ,  G11C2213/56 ,  G11C2213/79 ,  G11C2213/82 ,  H10B63/30 ,  H10N70/821 ,  H10N70/8418 ,  H10N70/8833

Abstract: Numerous embodiments of circuitry for a set-while-verify operation and a reset-while verify operation for resistive random access memory cells are disclosed. In one embodiment, a set-while-verify circuit for performing a set operation on a selected RRAM cell in the array applies a combination of voltages or current to a bit line, word line, and source line associated with the selected RRAM cell and stops said applying when the set operation is complete. In another embodiment, a reset-while-verify circuit for performing a reset operation on a selected RRAM cell in the array applies a combination of voltages or current to a bit line, word line, and source line associated with the selected RRAM cell and stops said applying when the reset operation is complete.

公开(公告)号：US11532354B2

公开(公告)日：2022-12-20

申请号：US17024410

申请日：2020-09-17

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do

IPC: G11C11/54 ,  G11C16/04 ,  G11C16/08 ,  G11C16/16 ,  G11C16/34 ,  G06N3/063 ,  G11C16/10

Abstract: Numerous embodiments for performing tuning of a page or a word of non-volatile memory cells in an analog neural memory are disclosed. High voltage circuits used to generate high voltages applied to terminals of the non-volatile memory cells during the precision tuning process are also disclosed. Programming sequences for the application of the voltages to the terminals to minimize the occurrence of disturbances during tuning are also disclosed.

公开(公告)号：US11373707B2

公开(公告)日：2022-06-28

申请号：US16417518

申请日：2019-05-20

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/10 ,  G11C16/08 ,  G11C16/14 ,  G11C16/24 ,  G11C16/34 ,  G11C16/26 ,  G11C16/04 ,  G11C16/28 ,  G11C16/32

Abstract: A non-volatile memory device is disclosed. The non-volatile memory device comprises an array of flash memory cells comprising a plurality of flash memory cells organized into rows and columns, wherein the array is further organized into a plurality of sectors, each sector comprising a plurality of rows of flash memory cells, and a row driver selectively coupled to a first row and a second row.

公开(公告)号：US11257553B2

公开(公告)日：2022-02-22

申请号：US17239397

申请日：2021-04-23

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu

IPC: G11C16/00 ,  G11C16/34 ,  G11C16/04 ,  G11C16/10 ,  G11C16/08 ,  G11C16/16 ,  G11C16/28

Abstract: The present invention relates to a flash memory cell with only four terminals and a high voltage row decoder for operating an array of such flash memory cells. The invention allows for fewer terminals for each flash memory cell compared to the prior art, which results in a simplification of the decoder circuitry and overall die space required per flash memory cells. The invention also provides for the use of high voltages on one or more of the four terminals to allow for read, erase, and programming operations despite the lower number of terminals compared to prior art flash memory cells.

公开(公告)号：US20220004860A1

公开(公告)日：2022-01-06

申请号：US17140924

申请日：2021-01-04

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Stephen Trinh ,  Anh Ly ,  Nhan Do ,  Mark Reiten

IPC: G06N3/063 ,  G11C11/408 ,  G11C11/4074 ,  G11C11/406

Abstract: Numerous embodiments of analog neural memory arrays are disclosed. Certain embodiments comprise an adaptive bias decoder for providing additional bias to array input lines to compensate for instances where ground floats above 0V. This is useful, for example, to minimize the voltage drop for a read, program, or erase operation while maintaining accuracy in the operation.

公开(公告)号：US20210383869A1

公开(公告)日：2021-12-09

申请号：US17104385

申请日：2020-11-25

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Stephen Trinh ,  Anh Ly

IPC: G11C16/08 ,  G11C11/54 ,  G06N3/063

Abstract: Various embodiments of tandem row decoders are disclosed. Each embodiment of a tandem row decoder comprises a word line decoder and a control gate decoder. The tandem row decoder exhibits reduced leakage current on the word line and the control gate line when the tandem row decoder is not enabled.

公开(公告)号：US20210257026A1

公开(公告)日：2021-08-19

申请号：US17191392

申请日：2021-03-03

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Anh Ly ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/04 ,  G06N3/08 ,  H01L27/11521 ,  H01L29/788

Abstract: Numerous embodiments are disclosed for a high voltage generation algorithm and system for generating high voltages necessary for a particular programming operation in analog neural memory used in a deep learning artificial neural network. Compensation measures can be utilized that compensate for changes in voltage or current as the number of cells being programmed changes.

公开(公告)号：US11011240B2

公开(公告)日：2021-05-18

申请号：US16879663

申请日：2020-05-20

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu

IPC: G11C16/34 ,  G11C16/04 ,  G11C16/10 ,  G11C16/08 ,  G11C16/16 ,  G11C16/28

Abstract: The present invention relates to a flash memory cell with only four terminals and a high voltage row decoder for operating an array of such flash memory cells. The invention allows for fewer terminals for each flash memory cell compared to the prior art, which results in a simplification of the decoder circuitry and overall die space required per flash memory cells. The invention also provides for the use of high voltages on one or more of the four terminals to allow for read, erase, and programming operations despite the lower number of terminals compared to prior art flash memory cells.

公开(公告)号：US10860918B2

公开(公告)日：2020-12-08

申请号：US16182492

申请日：2018-11-06

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Anh Ly

IPC: G06F17/16 ,  G06N3/04 ,  G06N3/063 ,  G11C16/04 ,  G11C16/10 ,  G11C16/34 ,  G11C16/14 ,  G11C16/30 ,  G11C16/08 ,  G06N3/08

Abstract: Numerous embodiments are disclosed for an analog neuromorphic memory system for use in a deep learning neural network. The analog neuromorphic memory system comprises a plurality of vector-by-matrix multiplication arrays and various components shared by those arrays. The shared components include high voltage generation blocks, verify blocks, and testing blocks. The analog neuromorphic memory system optionally is used within a long short term memory system or a gated recurrent unit system.

公开(公告)号：US10790022B2

公开(公告)日：2020-09-29

申请号：US16550254

申请日：2019-08-25

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Anh Ly ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/04 ,  G06N3/08 ,  H01L27/11521 ,  H01L29/788

Abstract: Numerous embodiments are disclosed for a high voltage generation algorithm and system for generating high voltages necessary for a particular programming operation in analog neural memory used in a deep learning artificial neural network. Different calibration algorithms and systems are also disclosed. The system can modify a high voltage signal applied to an array of cells during a programming operation as the number of cells being programmed changes.