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    X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics
    121.
    发明授权
    X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics 有权
    具有使用多材料X射线管阳极和单色光学器件产生的多个激发能带的X射线分析仪

    公开(公告)号：US09449780B2

    公开(公告)日：2016-09-20

    申请号：US14381023

    申请日：2013-02-27

    Applicant: X-RAY OPTICAL SYSTEMS, INC.

    Inventor： Zewu Chen

    IPC: G21K1/06 ,  H01J35/08 ,  G01N23/223 ,  H01J35/14

    CPC classification number: H01J35/08 ,  G01N23/223 ,  G21K1/062 ,  G21K1/067 ,  G21K2201/062 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/084 ,  H01J2235/088

    Abstract: An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.

    Abstract translation: X射线管包括靶，电子撞击在靶上以形成发散的X射线束。 目标具有由第一和第二目标材料形成的表面，每个被定制以发射相应的x射线能量分布。 可以提供第一x射线光学器件用于将光束引导到样品点，第一x射线光学器件使发散的X射线束从第一靶材料发射的能量单色为第一能量; 并且可以提供第二x射线光学器件，用于将光束引导到样品点，第二x射线光学器件将发散的X射线束单色为由第二靶材料发射的能量的第二能量。 使用由第一和第二单色能量诱导的样品点的荧光来测量样品中至少一种元素的浓度，或单独测量涂层和下面的底物中的元素。

    X-ray sources using linear accumulation
    123.
    发明授权
    X-ray sources using linear accumulation 有权
    X射线源使用线性积分

    公开(公告)号：US09390881B2

    公开(公告)日：2016-07-12

    申请号：US14490672

    申请日：2014-09-19

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon

    IPC: G21K1/06 ,  H01J35/08

    CPC classification number: H01J35/08 ,  G21K1/06 ,  H01J2235/081 ,  H01J2235/086

    Abstract: A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness.Some embodiments of the invention comprise x-ray optical elements placed between sub-sources of x-rays. These x-ray optical elements may form images of one or more x-ray sub-sources in alignment with other x-ray sub-sources, and may enhance the linear accumulation that can be achieved.

    Abstract translation: 公开了用于高亮度x射线产生的紧凑源。 通过彼此对准的多个区域的电子束轰击实现较高的亮度，以实现x射线的线性积累。 这可以通过对齐离散x射线子源或通过使用包含与具有高导热性的基底紧密热接触制造的x射线产生材料的微结构的x射线靶来实现。 这样可以更有效地将热量从X射线产生材料中拉出，并且进而允许以更高的电子密度和/或更高能量的电子轰击x射线产生材料，导致更大的x射线亮度。 本发明的一些实施例包括放置在x射线的子源之间的x射线光学元件。 这些X射线光学元件可以形成与其他x射线子源对准的一个或多个x射线子源的图像，并且可以增强可以实现的线性累积。

    LOW-DOSE RADIOGRAPHIC IMAGING SYSTEM
    126.
    发明申请
    LOW-DOSE RADIOGRAPHIC IMAGING SYSTEM 有权
    低剂量放射成像系统

    公开(公告)号：US20150325401A1

    公开(公告)日：2015-11-12

    申请号：US14491825

    申请日：2014-09-19

    Applicant: Rapiscan Systems, Inc.

    Inventor： Willem Gerhardus Johannes Langeveld ,  Joseph Bendahan ,  Tsahi Gozani ,  Michael King ,  Dan Strellis ,  Edward Franco ,  Krystal R. Alfonso

    IPC: H01J35/14 ,  G01V5/00

    CPC classification number: H01J35/14 ,  G01V5/0016 ,  G21K1/093 ,  H01J35/08 ,  H01J35/30 ,  H01J35/32 ,  H01J37/14 ,  H01J37/141 ,  H01J37/147 ,  H01J37/1472 ,  H01J37/1475 ,  H01J37/3178 ,  H01J2235/081 ,  H01J2235/086 ,  H05G1/52 ,  H05G2/00

    Abstract: An inspection system for scanning cargo and vehicles is described which employs an X-ray source that includes an electron beam generator, for generating an electron beam; an accelerator for accelerating said electron beam in a first direction; and, a first set of magnetic elements for transporting said electron beam into a magnetic field created by a second set of magnetic elements, wherein the magnetic field created by said second set of magnetic elements causes said electron beam to strike a target such that the target substantially only generates X-rays focused toward a high density section in the scanned object, which is estimated in a second pulse using image data captured by a detector array in a first pulse. The electron beam direction is optimized by said X-ray source during said second pulse to focus X-rays towards said high density section based on said image data in said first pulse.

    Abstract translation: 描述了用于扫描货物和车辆的检查系统，其使用包括电子束发生器的X射线源，用于产生电子束; 用于在第一方向上加速所述电子束的加速器; 以及用于将所述电子束传送到由第二组磁性元件产生的磁场中的第一组磁性元件，其中由所述第二组磁性元件产生的磁场使所述电子束撞击靶，使得所述靶 基本上仅产生朝向扫描对象中的高密度部分聚焦的X射线，其以第一脉冲中由检测器阵列捕获的图像数据在第二脉冲中估计。 在所述第二脉冲期间，由所述X射线源优化电子束方向，以基于所述第一脉冲中的所述图像数据将X射线聚焦到所述高密度部分。

    X-ray irradiation device and analysis device
    128.
    发明授权
    X-ray irradiation device and analysis device 有权
    X射线照射装置及分析装置

    公开(公告)号：US09080947B2

    公开(公告)日：2015-07-14

    申请号：US13638197

    申请日：2011-03-30

    Applicant: Hiromichi Yamazui ,  Keisuke Kobayashi ,  Hideo Iwai ,  Masaaki Kobata

    Inventor： Hiromichi Yamazui ,  Keisuke Kobayashi ,  Hideo Iwai ,  Masaaki Kobata

    IPC: G21K1/06 ,  G01N23/227 ,  G21K7/00 ,  H01J35/28 ,  H01J35/30

    CPC classification number: G01N23/2273 ,  G01N2223/204 ,  G01N2223/206 ,  G21K1/06 ,  G21K7/00 ,  H01J35/28 ,  H01J35/30 ,  H01J2235/081 ,  H01J2235/086 ,  H01J2235/163

    Abstract: [Object] The present invention provides an X-ray irradiation device capable of adjusting the energy of X-rays in a wide range, and an analysis device equipped with the X-ray irradiation device.[Solving Means] An X-ray irradiation device according to an embodiment of the present invention focuses X-rays emitted from an X-ray generation mechanism to a predetermined focal position by a focusing mechanism. The X-ray generation mechanism has a structure which generates a plurality of X-rays having different wavelengths. The focusing mechanism has a structure in which the plurality of X-rays are focused to the same focal position by focusing elements having diffraction characteristics suitable for the wavelengths of the respective X-rays generated by the X-ray generation mechanism.

    Abstract translation: 本发明提供能够在宽范围内调整X射线能量的X射线照射装置以及配备有X射线照射装置的分析装置。 本发明的实施方式的X射线照射装置通过聚焦机构将从X射线产生机构发射的X射线聚焦到预定的焦点位置。 X射线产生机构具有产生具有不同波长的多个X射线的结构。 聚焦机构具有通过具有适合于由X射线产生机构产生的各X射线的波长的衍射特性的聚焦元件将多个X射线聚焦到同一焦点位置的结构。

    X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USING MULTI-MATERIAL X-RAY TUBE ANODES AND MONOCHROMATING OPTICS
    130.
    发明申请
    X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USING MULTI-MATERIAL X-RAY TUBE ANODES AND MONOCHROMATING OPTICS 有权
    具有使用多种X射线管阳极和单色光学元件生产的多种激发能量的X射线分析仪

    公开(公告)号：US20150043713A1

    公开(公告)日：2015-02-12

    申请号：US14381023

    申请日：2013-02-27

    Applicant: X-RAY OPTICAL SYSTEMS, INC.

    Inventor： Zewu Chen

    IPC: H01J35/08 ,  G21K1/06 ,  G01N23/223 ,  H01J35/14

    CPC classification number: H01J35/08 ,  G01N23/223 ,  G21K1/062 ,  G21K1/067 ,  G21K2201/062 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/084 ,  H01J2235/088

    Abstract: An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.

    Abstract translation: X射线管包括靶，电子撞击在靶上以形成发散的X射线束。 目标具有由第一和第二目标材料形成的表面，每个被定制以发射相应的x射线能量分布。 可以提供第一x射线光学器件用于将光束引导到样品点，第一x射线光学器件使发散的X射线束从第一靶材料发射的能量单色为第一能量; 并且可以提供第二x射线光学器件，用于将光束引导到样品点，第二x射线光学器件将发散的X射线束单色为由第二靶材料发射的能量的第二能量。 使用由第一和第二单色能量诱导的样品点的荧光来测量样品中至少一种元素的浓度，或单独测量涂层和下面的底物中的元素。

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