ENTRY SUPPORT APPARATUS AND METHOD
    142.
    发明申请
    ENTRY SUPPORT APPARATUS AND METHOD 审中-公开
    进入支持设备和方法

    公开(公告)号:US20130031095A1

    公开(公告)日:2013-01-31

    申请号:US13556415

    申请日:2012-07-24

    Inventor: Kiyoshi Takeuchi

    CPC classification number: G06F16/35

    Abstract: A computer-readable recording medium has an entry support program embodied therein for causing a computer to perform detecting text being entered, extracting text examples corresponding to the detected text from a storage unit, the storage unit storing text examples and frequencies of use of the text examples such that the frequencies of use are associated with the respective text examples, classifying the extracted text examples into text-example groups each containing one or more text examples based on comparison of letters included in the extracted text examples, determining display order of the text-example groups, based on the frequencies of use that are associated in the storage unit with text examples belonging to the text-example groups, and displaying the extracted text examples in the determined display order.

    Abstract translation: 一种计算机可读记录介质,其中具有入口支持程序,用于使计算机执行正在输入的检测文本,从存储单元提取与检测到的文本相对应的文本示例,存储单元存储文本的示例和使用频率 示例使得使用频率与各个文本示例相关联,根据提取的文本示例中包含的字母的比较将所提取的文本示例分类为每个包含一个或多个文本示例的文本示例组,确定文本的显示顺序 - 基于在存储单元中与使用属于文本示例组的文本示例相关联的使用频率的示例组,并且以确定的显示顺序显示所提取的文本示例。

    Variation simulation system
    144.
    发明授权
    Variation simulation system 失效
    变化仿真系统

    公开(公告)号:US08050895B2

    公开(公告)日:2011-11-01

    申请号:US11659972

    申请日:2005-08-10

    Inventor: Kiyoshi Takeuchi

    CPC classification number: G06F17/504 G06F17/5036

    Abstract: A variation simulation system providing for facilitated circuit design with suppressed deterioration in performance otherwise caused by variations. A variation analysis unit 100 extracts statistical features of variations from a large number of samples beforehand. A model analysis unit 200 checks response of a circuit simulation output to parameter variations. A fitting execution unit 300 collates the information, obtained in this manner, to each other to determine the manner of variations of the parameters which will reproduce statistical features of the device samples.

    Abstract translation: 一种变化模拟系统,其提供便利的电路设计,抑制性能劣化,否则由变化引起。 变化分析单元100预先从大量样本中提取变化的统计特征。 模型分析单元200检查电路仿真输出对参数变化的响应。 装配执行单元300将以这种方式获得的信息彼此对准,以确定将再现装置样本的统计特征的参数的变化方式。

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    145.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
    半导体器件及其制造方法

    公开(公告)号:US20100289091A1

    公开(公告)日:2010-11-18

    申请号:US12095663

    申请日:2006-12-01

    Abstract: A semiconductor device is provided with an SRAM cell unit. The SRAM cell unit is provided with a data storing section composed of a pair of drive transistors and a pair of load transistors; a data write section composed of a pair of access transistors; and a data read section composed of an access transistor and a drive transistor. Each of the transistors is provided with a semiconductor layer protruding from a base plane; a gate electrode extending on the both facing side planes over the semiconductor layer from above; a gate insulating film between a gate electrode and a semiconductor layer; and a source/drain region. Each semiconductor layer is arranged to have its longitudinal direction along a first direction. In the adjacent SRAM cell units in the first direction, all the corresponding transistors have the semiconductor layer of one transistor on a center line which is along the first direction of the semiconductor layer of the other transistor.

    Abstract translation: 半导体器件设置有SRAM单元单元。 SRAM单元单元设置有由一对驱动晶体管和一对负载晶体管组成的数据存储部; 由一对存取晶体管组成的数据写入部分; 以及由存取晶体管和驱动晶体管构成的数据读取部。 每个晶体管设置有从基底面突出的半导体层; 从上方在半导体层上方的两面相对的侧面上延伸的栅电极; 在栅电极和半导体层之间的栅极绝缘膜; 和源极/漏极区域。 每个半导体层被布置成沿着第一方向具有其纵向方向。 在第一方向的相邻SRAM单元单元中,所有对应的晶体管都具有沿着另一个晶体管的半导体层的第一方向的中心线上的一个晶体管的半导体层。

    Sheet Plasma Film Forming Apparatus
    147.
    发明申请
    Sheet Plasma Film Forming Apparatus 审中-公开
    薄片等离子体成膜装置

    公开(公告)号:US20100012033A1

    公开(公告)日:2010-01-21

    申请号:US12096585

    申请日:2006-11-30

    CPC classification number: H01J37/3266 C23C14/35 H01J37/32009

    Abstract: A sheet plasma film forming apparatus includes: a pressure reducing container; a plasma gun; an anode; plasma flowing means; a sheet plasma converting chamber as part of the pressure reducing container; a pair of permanent magnets which forms a sheet-shaped plasma; and a film forming chamber as a part of the pressure reducing container. The pressure reducing container includes first and second bottle neck portions that are openings of the film forming chamber formed such that the plasma flows from the sheet plasma converting chamber through the first bottle neck portion to the film forming chamber, and the flown sheet-shaped plasma flows through the second bottle neck portion to the anode. In the thickness direction of the sheet-shaped plasma, a size of the first and second bottle neck portions is smaller than an internal size of the film forming chamber.

    Abstract translation: 片状等离子体膜形成装置包括:减压容器; 等离子枪 阳极; 等离子体流动装置; 作为减压容器的一部分的片状等离子体转换室; 形成片状等离子体的一对永久磁铁; 以及作为减压容器的一部分的成膜室。 减压容器包括第一和第二瓶颈部分,其是成膜室的开口,其形成为使得等离子体从片状等离子体转换室通过第一瓶颈部分流到成膜室,并且流动的片状等离子体 流过第二瓶颈部分到阳极。 在片状等离子体的厚度方向上,第一和第二瓶颈部的尺寸小于成膜室的内部尺寸。

    Variation Simulation System
    149.
    发明申请
    Variation Simulation System 失效
    变异模拟系统

    公开(公告)号:US20070198235A1

    公开(公告)日:2007-08-23

    申请号:US11659972

    申请日:2005-08-10

    Inventor: Kiyoshi Takeuchi

    CPC classification number: G06F17/504 G06F17/5036

    Abstract: A variation simulation system providing for facilitated circuit design with suppressed deterioration in performance otherwise caused by variations. A variation analysis unit 100 extracts statistical features of variations from a large number of samples beforehand. A model analysis unit 200 checks response of a circuit simulation output to parameter variations. A fitting execution unit 300 collates the information, obtained in this manner, to each other to determine the manner of variations of the parameters which will reproduce statistical features of the device samples.

    Abstract translation: 一种变化模拟系统,其提供便利的电路设计,抑制性能劣化,否则由变化引起。 变化分析单元100预先从大量样本中提取变化的统计特征。 模型分析单元200检查电路仿真输出对参数变化的响应。 装配执行单元300将以这种方式获得的信息彼此对准,以确定将再现装置样本的统计特征的参数的变化方式。

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