SEMICONDUCTOR LIGHT EMITTING DEVICE AND FABRICATION METHOD THEREOF
    151.
    发明申请
    SEMICONDUCTOR LIGHT EMITTING DEVICE AND FABRICATION METHOD THEREOF 有权
    半导体发光器件及其制造方法

    公开(公告)号:US20130026446A1

    公开(公告)日:2013-01-31

    申请号:US13557915

    申请日:2012-07-25

    CPC classification number: H01L33/06 H01L33/32

    Abstract: A semiconductor light emitting device and a fabrication method thereof are provided. The semiconductor light emitting device includes: first and second conductivity-type semiconductor layers; and an active layer disposed between the first and second conductivity-type semiconductor layers and having a structure in which a quantum barrier layer and a quantum well layer are alternately disposed, and the quantum barrier layer includes first and second regions disposed in order of proximity to the first conductivity-type semiconductor layer.

    Abstract translation: 提供了一种半导体发光器件及其制造方法。 半导体发光器件包括:第一和第二导电型半导体层; 以及设置在第一和第二导电类型半导体层之间并且具有其中交替地设置量子势垒层和量子阱层的结构的有源层,并且量子势垒层包括按照接近于...的顺序设置的第一和第二区域 第一导电型半导体层。

    Test system and failure parsing method thereof
    153.
    发明授权
    Test system and failure parsing method thereof 有权
    测试系统及其故障解析方法

    公开(公告)号:US07865325B2

    公开(公告)日:2011-01-04

    申请号:US12110198

    申请日:2008-04-25

    Abstract: A test system and a failure parsing method. The test system may comprise a cell array including defective cells formed according to various failure causes, a test apparatus configured to measure electric characteristics from the defective cells and make the measured electric characteristics numerical, and a database apparatus configured to store the numerical electric characteristics. The failure parsing method may include forming defective cells to have at least one failure cause, measuring electric characteristics of each of the defective cells, storing the measured electric characteristics of each of the defective cells in a database, and judging failure causes of a failed chip of a semiconductor wafer based on the database.

    Abstract translation: 测试系统和故障解析方法。 该测试系统可以包括一个单元阵列,该单元阵列包括根据各种故障原因而形成的缺陷单元,一个被配置为从有缺陷单元测量电特性并使测量的电特性值数值的测试设备,以及被配置为存储数字电特性的数据库设备。 故障解析方法可以包括形成有缺陷的单元以具有至少一个故障原因,测量每个故障单元的电特性,将每个故障单元的测量电特性存储在数据库中,以及判断故障芯片的故障原因 基于数据库的半导体晶片。

    Method for preparation of highly dispersed supported platinum catalyst
    154.
    发明授权
    Method for preparation of highly dispersed supported platinum catalyst 有权
    高分散负载铂催化剂的制备方法

    公开(公告)号:US07557057B2

    公开(公告)日:2009-07-07

    申请号:US11499083

    申请日:2006-08-04

    Abstract: The present invention relates to a method for synthesizing highly dispersed supported platinum catalyst. More particularly, the present invention relates to a method of synthesizing highly dispersed supported platinum catalyst comprising: dissolving a reducing agent in a solvent to produce a solution, dissolving a platinum chloride to the same solvent; adding a carbon support and platinum in a predetermined ratio to the above mixed solution, agitating the mixture, performing ultrasonic treatment, and performing heat treatment; and adding a HCl solution, agitating the mixture, separating the precipitates via filtration to produce a catalyst, and then washing the catalyst with distilled water, thereby obtaining an active highly dispersed supported platinum catalyst which has excellent electric charge activity, uniformly-sized platinum particles and relatively high specific surface area.

    Abstract translation: 本发明涉及一种合成高分散载体的铂催化剂的方法。 更具体地说,本发明涉及一种合成高度分散的负载铂催化剂的方法,包括:将还原剂溶解在溶剂中以产生溶液,将氯化铂溶解在同一溶剂中; 向上述混合溶液中加入预定比例的碳载体和铂,搅拌混合物,进行超声波处理,进行热处理; 并加入HCl溶液,搅拌混合物,通过过滤分离沉淀物以产生催化剂,然后用蒸馏水洗涤催化剂,从而获得具有优异电荷活性的活性高分散载体的铂催化剂,均匀尺寸的铂颗粒 和比表面积相对较高。

    Apparatus and method for controlling audio/video device
    155.
    发明授权
    Apparatus and method for controlling audio/video device 失效
    用于控制音频/视频设备的装置和方法

    公开(公告)号:US07492416B2

    公开(公告)日:2009-02-17

    申请号:US11044528

    申请日:2005-01-26

    Applicant: Jong Hyun Lee

    Inventor: Jong Hyun Lee

    CPC classification number: H04N5/775 G08C17/02 G11B31/00

    Abstract: An apparatus and method for controlling an audio/video (AV) device. A first AV device is adapted to receive a remote control signal, selectively modulate the received remote control signal, and transfer the modulated remote control signal along with an audio signal over an audio line. A second AV device is adapted to receive the modulated remote control signal transferred along with the audio signal over the audio line, separate the received remote control signal from the received audio signal, demodulate the separated remote control signal, and perform an operation corresponding to the demodulated remote control signal. Therefore, it is possible to normally control an AV device even though a user involuntarily operates a remote controller of the AV device toward the screen of a TV under the condition that the AV device is placed far from the TV or the angle defined by the TV, user and AV device is large.

    Abstract translation: 一种用于控制音频/视频(AV)设备的装置和方法。 第一AV设备适于接收遥控信号,选择性地调制所接收的遥控信号,并且通过音频线路将调制的遥控信号与音频信号一起传送。 第二AV设备适于接收通过音频线路与音频信号一起传送的调制遥控信号,从接收到的音频信号中分离接收到的遥控信号,对分离的遥控信号进行解调,并执行对应于 解调遥控信号。 因此,即使用户在AV设备远离电视机放置的情况下或者电视机定义的角度的情况下,即使用户不经意地将AV设备的遥控器朝向TV的屏幕进行正常的控制也是可能的 ,用户和AV设备很大。

    Apparatus for preventing carbon corrosion at cathod in fuel cell
    156.
    发明申请
    Apparatus for preventing carbon corrosion at cathod in fuel cell 审中-公开
    用于防止燃料电池中的阴极碳腐蚀的装置

    公开(公告)号:US20080318099A1

    公开(公告)日:2008-12-25

    申请号:US11986920

    申请日:2007-11-27

    Abstract: The present invention provides an apparatus for effectively preventing carbon corrosion from occurring at the cathode of a fuel cell. The present apparatuses include an air blower supplying air from an air supply source to a fuel cell; a fuel cell receiving air from the air blower to generate electricity by a chemical reaction; an air discharge pipe through which residual air remaining after oxygen of the air is consumed for chemical reaction in the fuel cell is discharged; a pressure sensor provided in the air discharge pipe for detecting air pressure in the fuel cell; an air discharge solenoid valve provided in the air discharge pipe for controlling air flow of the air discharge pipe; and a controller controlling operation of the air blower and the air discharge solenoid valve by receiving a signal detected by the pressure sensor wherein the controller detects the air pressure through the pressure sensor to allow the air blower to supply air to the fuel cell until the air pressure reaches a predetermined pressure and then closes the air discharge solenoid valve until the oxygen in the fuel cell is completely exhausted, thereby preventing the formation of hydrogen/oxygen interface at the anode of the fuel cell.

    Abstract translation: 本发明提供一种用于有效地防止在燃料电池的阴极处发生碳腐蚀的装置。 本发明的装置包括从空气供应源向燃料电池供应空气的送风机; 燃料电池,其从所述鼓风机接收空气,通过化学反应发电; 排出空气排出管,通过该排气管在燃料电池中用于化学反应的空气的氧气之后残留的空气被排出; 压力传感器,其设置在所述排气管中,用于检测所述燃料电池中的气压; 排气电磁阀,设置在排气管中,用于控制排气管的气流; 以及控制器,其通过接收由所述压力传感器检测到的信号来控制所述鼓风机和所述排气电磁阀的操作,其中所述控制器通过所述压力传感器检测空气压力,以允许所述鼓风机向所述燃料电池供应空气,直到所述空气 压力达到预定压力,然后关闭排气电磁阀,直到燃料电池中的氧气完全排出,从而防止在燃料电池的阳极处形成氢/氧界面。

    Quaternary Pb-free solder composition incorporating Sn-Ag-Cu-In
    157.
    发明申请
    Quaternary Pb-free solder composition incorporating Sn-Ag-Cu-In 审中-公开
    含有Sn-Ag-Cu-In的第四纪无铅焊料组合物

    公开(公告)号:US20080292493A1

    公开(公告)日:2008-11-27

    申请号:US12081195

    申请日:2008-04-11

    CPC classification number: B23K35/262 C22C13/00 C22C13/02

    Abstract: Provided is a quaternary Pb-free solder composition incorporating Sn—Ag—Cu—In, which can prevent a cost increase and sufficiently ensure proccessability and mechanical property as a solder material. To this end, indium (In) with appropriate amount is added into the Pb-free solder composition, and the addition amount of Ag is optimized, thus preventing a decrease in wettability caused by a decrease in the amount of Ag and improving resistance to a thermal cycling and a mechanical impact. The quaternary Pb-free solder composition includes silver (Ag) of about 0.3 wt. % or more, and less than about 2.5 wt. %, copper (Cu) of about 0.2 wt. % or more, and less than about 2.0 wt. %, indium (In) of about 0.2 wt. % or more, and less than about 1.0 wt. % or less, and a balance of tin (Sn).

    Abstract translation: 提供了含有Sn-Ag-Cu-In的四价无铅焊料组合物,其可以防止成本增加并充分确保作为焊料材料的可操作性和机械性能。 为此,将适量的铟(In)添加到无铅焊料组合物中,并且优化Ag的添加量,从而防止由于Ag量的降低而导致的润湿性的降低,并且提高了对 热循环和机械冲击。 四次无铅焊料组合物包含约0.3wt。%的银(Ag) %以上,小于约2.5重量% %,铜(Cu)为约0.2重量% %以上,小于约2.0重量% %,铟(In)为约0.2wt。 %以上,小于约1.0重量% %以下,余量为锡(Sn)。

    Test pattern of semiconductor device and test method using the same
    158.
    发明授权
    Test pattern of semiconductor device and test method using the same 失效
    半导体器件的测试图案及使用其的测试方法

    公开(公告)号:US07436198B2

    公开(公告)日:2008-10-14

    申请号:US11542589

    申请日:2006-10-03

    Applicant: Jong-Hyun Lee

    Inventor: Jong-Hyun Lee

    CPC classification number: G01R31/2884

    Abstract: There are provided a test pattern of a semiconductor device and a test method using the same. The test pattern of the semiconductor device includes a conductive pattern disposed on a semiconductor substrate, and the conductive pattern includes a plurality of line regions, which are aligned in parallel, and spaced at a uniform interval, and a plurality of connecting regions for connecting the plurality of line regions in a zigzag shape. The test pattern includes a plurality of transistors electrically switching first ends of the adjacent line regions corresponding to the connecting region, and each transistor includes a source region, which is electrically connected to one end of one of the adjacent line regions, and a drain region, which is electrically connected to one end of the other one of the adjacent line regions. Further, a transistor selecting part is electrically connected to gates of the plurality of transistors, for selecting one of the plurality of transistors or a combination thereof.

    Abstract translation: 提供半导体器件的测试图案和使用其的测试方法。 半导体器件的测试图案包括布置在半导体衬底上的导电图案,并且导电图案包括平行排列并且间隔均匀的多个线区域,以及多个连接区域 多个线形区域以Z字形形状。 测试图案包括多个晶体管,其电连接与连接区域相对应的相邻线区域的第一端,并且每个晶体管包括电连接到一个相邻线区域的一端的源极区域和漏极区域 ,其电连接到另一个相邻线区域的一端。 此外,晶体管选择部分电连接到多个晶体管的栅极,用于选择多个晶体管中的一个或其组合。

    METHOD OF SETTING PASSWORD AND METHOD OF AUTHENTICATING PASSWORD IN PORTABLE DEVICE HAVING SMALL NUMBER OF OPERATION BUTTONS
    159.
    发明申请
    METHOD OF SETTING PASSWORD AND METHOD OF AUTHENTICATING PASSWORD IN PORTABLE DEVICE HAVING SMALL NUMBER OF OPERATION BUTTONS 审中-公开
    在具有小数量操作按钮的便携式设备中设置密码和认证密码的方法

    公开(公告)号:US20080195976A1

    公开(公告)日:2008-08-14

    申请号:US11942972

    申请日:2007-11-20

    CPC classification number: G06F3/0233 G06F21/31 G06F21/83

    Abstract: A method of setting a password and a method of authenticating a password in a portable device having a small number of operation buttons. The method of setting a password includes: determining whether there is an input through the operating of an operation button within a predetermined time; displaying a symbol of the operated operation button, when there is an input through the operating of an operation button within the predetermined time; and setting displayed symbols as a password required for using the portable device, when there is an input through the operating of an operation button for representing an end of an input of symbols. Accordingly, the password can be set by operating operation buttons in the portable device having no text or number buttons. Authentication of a password can be performed by using the set password.

    Abstract translation: 在具有少量操作按钮的便携式设备中设置口令的方法和认证密码的方法。 设置密码的方法包括:通过在预定时间内操作操作按钮来确定是否存在输入; 当在预定时间内通过操作按钮的操作存在输入时,显示操作操作按钮的符号; 并且当通过操作用于表示符号输入结束的操作按钮的输入时,将所显示的符号设置为使用便携式设备所需的密码。 因此,可以通过在没有文本或数字按钮的便携式设备中操作操作按钮来设置密码。 可以使用设置的密码来验证密码。

    Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems
    160.
    发明申请
    Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems 失效
    半导体集成电路器件和缺陷分析系统的缺陷分析方法

    公开(公告)号:US20080172190A1

    公开(公告)日:2008-07-17

    申请号:US12007706

    申请日:2008-01-15

    Applicant: Jong-hyun Lee

    Inventor: Jong-hyun Lee

    Abstract: A defect analysis method includes storing, in a database, data indicative of defects and analog characteristics of corresponding defective bits in a database. A first defective area in a first wafer is found, and analog characteristics of defective bits in the first defective area are measured. The measured analog characteristics and the analog characteristics stored in the database are compared to locate a defect causing the first defective area.

    Abstract translation: 缺陷分析方法包括在数据库中存储表示数据库中相应缺陷比特的缺陷和模拟特征的数据。 找到第一晶片中的第一缺陷区域,并且测量第一缺陷区域中的有缺陷位的模拟特性。 比较存储在数据库中的测量模拟特性和模拟特性以定位导致第一缺陷区的缺陷。

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