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    X-RAY SYSTEMS AND METHODS INCLUDING X-RAY ANODES
    172.
    发明申请
    X-RAY SYSTEMS AND METHODS INCLUDING X-RAY ANODES 审中-公开

    公开(公告)号：US20180033584A1

    公开(公告)日：2018-02-01

    申请号：US15441938

    申请日：2017-02-24

    Applicant: Neil Dee Olsen

    Inventor： Neil Dee Olsen

    IPC: H01J35/10

    CPC classification number: H01J35/10 ,  H01J2235/081

    Abstract: An anode for an X-ray tube can include a body comprising one or more of a yttrium-oxide derivative, titanium diboride, boron carbide, titanium suboxide, reaction bonded silicon carbide, and reaction boded silicon nitride. Upon collision with an anode, the kinetic energy of an electron beam in an X-ray tube is converted to high frequency electromagnetic waves, i.e., X-rays. An anode with a body from one or more of the above materials can reduce costs and/or weight, extend the life of the anode or associated components (e.g., bearings) and simultaneously provide a high heat storage capacity than traditional molybdenum and tungsten anodes.

    X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITY
    174.
    发明申请
    X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITY 审中-公开

    公开(公告)号：US20170162288A1

    公开(公告)日：2017-06-08

    申请号：US15431786

    申请日：2017-02-14

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    IPC: G21K1/06 ,  H01J35/08 ,  H01J35/18 ,  H01J35/14

    CPC classification number: G01N23/223 ,  G21K1/06 ,  G21K2201/064 ,  H01J35/08 ,  H01J2235/081 ,  H01J2235/086

    Abstract: Systems for x-ray illumination that have an x-ray brightness several orders of magnitude greater than existing x-ray technologies. These may therefore useful for applications such as trace element detection or for micro-focus fluorescence analysis. The higher brightness is achieved in part by using designs for x-ray targets that comprise a number of microstructures of one or more selected x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment of the targets with higher electron density or higher energy electrons, which leads to greater x-ray flux. The high brightness/high flux x-ray source may have a take-off angle from 0 to 105 mrad. and be coupled to an x-ray optical system that collects and focuses the high flux x-rays to spots that can be as small as one micron, leading to high flux density.

    X-ray fluorescence system with high flux and high flux density
    176.
    发明授权
    X-ray fluorescence system with high flux and high flux density 有权
    具有高通量和高通量密度的X射线荧光系统

    公开(公告)号：US09570265B1

    公开(公告)日：2017-02-14

    申请号：US15269855

    申请日：2016-09-19

    Applicant: Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    IPC: G01N23/223 ,  H01J35/14 ,  H01J35/18 ,  H01J35/08

    CPC classification number: H01J35/14 ,  G01N23/223 ,  G21K1/06 ,  H01J35/08 ,  H01J35/18 ,  H01J2235/081 ,  H01J2235/086

    Abstract: We present a micro-x-ray fluorescence (XRF) system having a high-brightness x-ray illumination system with high x-ray flux and high flux density. The higher brightness is achieved in part by using x-ray target designs that comprise a number of microstructures of x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment of the targets with higher electron density or higher energy electrons, which leads to greater x-ray flux. The high brightness/high flux x-ray source may then be coupled to an x-ray optical system, which can collect and focus the high flux x-rays to spots that can be as small as one micron, leading to high flux density at the fluorescent sample. Such systems may be useful for a variety of applications, including mineralogy, trace element detection, structure and composition analysis, metrology, as well as forensic science and diagnostic systems.

    Abstract translation: 我们提出了具有高X射线通量和高通量密度的高亮度x射线照明系统的微X射线荧光（XRF）系统。 更高的亮度部分地通过使用包括与具有高导热性的基板紧密热接触制造的x射线产生材料的多个微结构的x射线靶设计来实现。 这允许用更高电子密度或更高能量的电子轰击靶，这导致更大的x射线通量。 然后可以将高亮度/高通量x射线源耦合到x射线光学系统，其可以将高通量x射线收集并聚焦到可以小到1微米的点，导致高通量密度 荧光样品。 这些系统可用于各种应用，包括矿物学，微量元素检测，结构和成分分析，计量学以及法医科学和诊断系统。

    X-ray sources using linear accumulation
    177.
    发明授权
    X-ray sources using linear accumulation 有权
    X射线源使用线性积分

    公开(公告)号：US09543109B2

    公开(公告)日：2017-01-10

    申请号：US14999147

    申请日：2016-04-01

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon

    IPC: H01J35/08 ,  H01J35/10 ,  H01J35/18 ,  H01J35/14 ,  G21K1/06

    CPC classification number: H01J35/106 ,  G21K1/06 ,  H01J35/08 ,  H01J35/12 ,  H01J35/14 ,  H01J35/18 ,  H01J2235/081 ,  H01J2235/086 ,  H01J2235/1204 ,  H01J2235/1291

    Abstract: A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness. The orientation of the microstructures allows the use of an on-axis collection angle, allowing the accumulation of x-rays from several microstructures to be aligned to appear to have a single origin, also known as “zero-angle” x-ray radiation.

    Abstract translation: 公开了用于高亮度x射线产生的紧凑源。 通过彼此对准的多个区域的电子束轰击实现较高的亮度，以实现x射线的线性积累。 这可以通过对齐离散x射线子源或通过使用包含与具有高导热性的基底紧密热接触制造的x射线产生材料的微结构的x射线靶来实现。 这样可以更有效地将热量从X射线产生材料中拉出，并且进而允许以较高电子密度和/或更高能量的电子轰击x射线产生材料，导致更大的x射线亮度。 微结构的方向允许使用轴上收集角，允许来自若干微结构的X射线的聚集被对准以看起来具有单个原点，也称为“零角”x射线辐射。

    High brightness X-ray absorption spectroscopy system
    179.
    发明授权
    High brightness X-ray absorption spectroscopy system 有权
    高亮度X射线吸收光谱系统

    公开(公告)号：US09448190B2

    公开(公告)日：2016-09-20

    申请号：US14636994

    申请日：2015-03-03

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    IPC: H01J35/08 ,  G01N23/207 ,  H01J35/14 ,  G01N23/06

    CPC classification number: G01N23/2076 ,  G01N23/085 ,  G21K2201/061 ,  G21K2201/062 ,  G21K2201/064 ,  H01J35/08 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/086

    Abstract: This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems. These are useful for laboratory or field applications of x-ray absorption near-edge spectroscopy (XANES) or extended x-ray fine absorption structure (EXFAS) spectroscopy. The higher brightness is achieved by using designs for x-ray targets that comprise a number of aligned microstructures of x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment with higher electron density and/or higher energy electrons, leading to greater x-ray brightness and high flux. The high brightness x-ray source is then coupled to an x-ray reflecting optical system to collimate the x-rays, and a monochromator, which selects the exposure energy. Absorption spectra of samples using the high flux monochromatic x-rays can be made using standard detection techniques.

    Abstract translation: 本公开提供了x射线吸收精细结构（XAFS）测量的系统，其具有比现有紧凑系统大几个数量级的x射线通量和通量密度。 这些对于x射线吸收近边缘光谱（XANES）或扩展X射线精细吸收结构（EXFAS）光谱的实验室或现场应用是有用的。 通过使用X射线靶的设计来实现更高的亮度，所述X射线靶包括与具有高导热性的基底紧密热接触制造的x射线产生材料的多个对准微结构。 这允许用更高电子密度和/或更高能量的电子进行轰击，导致更大的x射线亮度和高通量。 然后将高亮度x射线源耦合到X射线反射光学系统以准直x射线，以及选择曝光能量的单色仪。 使用高通量单色x射线的样品的吸收光谱可以使用标准检测技术进行。

    X-ray sources using linear accumulation
    180.
    发明申请
    X-ray sources using linear accumulation 有权
    X射线源使用线性积分

    公开(公告)号：US20160268094A1

    公开(公告)日：2016-09-15

    申请号：US14999147

    申请日：2016-04-01

    Applicant: Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon

    IPC: H01J35/10 ,  H01J35/14 ,  H01J35/18

    CPC classification number: H01J35/106 ,  G21K1/06 ,  H01J35/08 ,  H01J35/12 ,  H01J35/14 ,  H01J35/18 ,  H01J2235/081 ,  H01J2235/086 ,  H01J2235/1204 ,  H01J2235/1291

    Abstract: A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness.The orientation of the microstructures allows the use of an on-axis collection angle, allowing the accumulation of x-rays from several microstructures to be aligned to appear to have a single origin, also known as “zero-angle” x-ray radiation.

    Abstract translation: 微结构的方向允许使用轴上收集角，允许来自若干微结构的X射线的聚集被对准以看起来具有单个原点，也称为“零角”x射线辐射。

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