SYSTEMS AND METHODS FOR X-RAY DIFFRACTION
    9.
    发明申请
    SYSTEMS AND METHODS FOR X-RAY DIFFRACTION 有权
    X射线衍射的系统和方法

    公开(公告)号:US20150253262A1

    公开(公告)日:2015-09-10

    申请号:US14639460

    申请日:2015-03-05

    IPC分类号: G01N23/20 G01N23/207

    摘要: An x-ray diffraction system includes an x-ray source having a first interchangeable x-ray generating component, a second interchangeable x-ray generating component, an actuator and a controller operatively connected to the actuator. The first and second interchangeable x-ray generating components are interchangeable with one another. The actuator is operatively connected to the first and second interchangeable x-ray generating components. A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component with a second x-ray generating component to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.

    摘要翻译: x射线衍射系统包括具有第一可互换x射线产生部件的X射线源,第二可互换x射线产生部件,致动器和可操作地连接到致动器的控制器。 第一和第二可互换的X射线产生部件彼此可互换。 致动器可操作地连接到第一和第二可互换的X射线产生部件。 用于非破坏性X射线衍射的方法包括基于第一期望深度从具有第一x射线产生部件的X射线源发射第一X射线束,以测量第一期望的样品的晶体学特征 将第一X射线产生部件与第二X射线产生部件交换以形成修改的X射线源,并且基于第二期望深度从修改的X射线源发射第二x射线束, 在第二个期望的深度上非破坏性地测量样品的结晶学特征。