Abstract:
The present disclosure relates to an image processing apparatus for enabling speed-up of spectroscopic correction processing on a multispectral image and a reduction in the amount of stored data to be achieved, an image processing method, a program, and an electronic apparatus.An image processing apparatus includes an image reduction part configured to reduce a multispectral image in which an object is shot by a light dispersed in many wavelength bands, and to generate reduced images for each of the wavelength bands, and a spectroscopic correction processing part configured to perform spectroscopic correction processing of correcting a spectroscopic distribution of the reduced images for each of the wavelength bands generated by the image reduction part. Then, the processing is performed on the multispectral image shot by an imaging device including a metallic thin film filter which is provided closer to a light incident side than a photoelectric conversion device in at least some pixels and which is different in film thickness of a conductive thin film per pixel. The present technology can be applied to a shooting apparatus mounting an image sensor including a metallic thin film filter such as a plasmon filter in a hole array structure or a dot array structure, for example.
Abstract:
A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.
Abstract:
The present disclosure relates to a method and related system for spectrum optimization of an illumination light source. Spectrum optimization according to the present disclosure can be based on various optimization parameters, including but not limited to luminous efficacy, color rendering effect, luminous efficacy of radiation, mesopic efficacy of radiation, cirtopic efficacy of radiation, etc. The present method and system are capable of optimizing illumination performance of a light source in various aspects in an individual or integrated manner. Further, the present method and system are capable of accommodating different illumination purposes and conditions by combining and prioritizing different optimization parameters.
Abstract:
Methods, apparatuses, systems, and storage mediums for correcting distortion of a spectrally encoded endoscopy (SEE) image are provided. A first reference pattern comprising a plurality of radial lines is scanned with an SEE spectral line to obtain a first image. Signs of a tangential shift and/or of a radial shift of the spectral line may be determined, and magnitudes of the tangential shift and of the radial shift may be computed. A second reference pattern comprising at least a circle with the SEE spectral line may be scanned to obtain a second image in a case where the radial shift is positive. The magnitude of the radial shift may be computed based on the magnitude of the tangential shift and a radius of the circle. The tangential shift and the radial shift may then be applied for correcting distortion.
Abstract:
The present disclosure relates to a method and related system for spectrum optimization of an illumination light source. Spectrum optimization according to the present disclosure can be based on various optimization parameters, including but not limited to luminous efficacy, color rendering effect, luminous efficacy of radiation, mesopic efficacy of radiation, cirtopic efficacy of radiation, etc. The present method and system are capable of optimizing illumination performance of a light source in various aspects in an individual or integrated manner. Further, the present method and system are capable of accommodating different illumination purposes and conditions by combining and prioritizing different optimization parameters.
Abstract:
An imaging apparatus includes an imaging unit configured to convert an incident light flux from an optical system into an electric signal, a band-cutting element disposed between the optical system and the imaging unit, having a band-cut function of performing band-cutting to enable distinguishing between wavelengths corresponding to bright line positions of a light source having bright lines, a control unit configured to control the band-cut function of the band-cutting element, an identification unit configured to identify a light source of an image captured by the imaging unit through comparison between a first image signal captured by the imaging unit when the band-cut function of the band-cutting element is ON and a second image signal captured by the imaging unit when the band-cut function of the band-cutting element is OFF, and an image processing unit configured to perform image processing based on the light source identified by the identification unit.
Abstract:
A color measurement device includes a light source for illuminating an object with light; a dispersing portion for spectrally dispersing light emitted and reflected by the object; a light receptor for receiving the light dispersed by the dispersing portion; and a controller for effecting color measurement based on a result of light reception of the light receptor from the object which is an image formed on a recording material; wherein the emitted light has a first intensity of light in a first wavelength range and a second intensity lower than the first intensity in a second wavelength range, and wherein the controller deduces a value relating to color measurement for the second wavelength range on the basis of a result of light reception of the light receptor for the first wavelength range.
Abstract:
A system and method of characterizing a color variation of a surface includes a device having a light source and a plurality of sensors positioned at respective viewing angles. An algorithm is stored on and executable by a controller to cause the controller to direct a beam of light at the measurement location with the light source and measure the light leaving the measurement location with the sensors at a plurality of azimuth angles to obtain respective measured color values. The controller is configured to define a color vector function F(θ, φ) to represent the color variation of the surface. The controller is configured to determine the color vector function F(θ, φ) based at least partially on the respective measured color values. The system allows for a representation of color space of a surface at any azimuth and viewing angle.
Abstract:
Apparatuses and systems for analyzing light by mode interference are provided. An example of an apparatus for analyzing light by mode interference includes a number of waveguides to support in a multimode region two modes of the light of a particular polarization and a plurality of scattering objects offset from a center of at least one of the number of waveguides.
Abstract:
A technique for forming a two-dimensional electronic spectrum of a sample includes illuminating a line within a portion of the sample with four laser pulses; where along the entire line the difference in the arrival times between two of the laser pulses varies as a function of the position and the difference in the arrival times between the other two pulses is constant along the entire line. A spectroscopic analysis may then be performed on the resulting pulsed output signal from the illuminated line to produce a single-shot two dimensional electronic spectroscopy.