Abstract:
A plurality of LED's, or electro luminescent strips, are disposed to project illumination to and thru, or towards, a diffuser; resulting in at least a portion of generated diffuse illumination being directed towards and upon the cylindrical surface of an article or part when disposed at an article illumination location. The article illumination location is established so that a centerline through the article is co-linear with a center line of the diffuse illumination projecting from, or reflected from, the diffusers. A housing may be provided for the LED's, electro luminescent strips and diffusers; or they may be otherwise arranged to coact to provide diffuse illumination directed towards the cylindrical surface of the part or other article. illumination reflected off of the article's cylindrical surface, and/or any markings, such as symbology, carried thereby is directed to a lens/camera arrangement to provide an image of same for transmission to a computer, controller, smart camera or other image utilization system.
Abstract:
A system for lighting a stent, i.e., providing an illumination source, to facilitate the capturing of an image of the stent. The lighting is provided so that an image capturing device, e.g., a digital camera or system, will capture an image that distinctly shows the difference between the stent and any surface upon which the stent is mounted, in addition to sharply defining the edges of the stent struts.
Abstract:
An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus includes a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light illuminates the illumination region. Additionally, the apparatus includes an image collecting device adapted to selectively collect images of either a first signal when the illumination source is illuminating the illumination region, or a second signal absent illumination of the illumination region. The first signal has wavelengths effectively different from the wavelengths of the portion of the light emitted by the LEDs that illuminates the illumination region.
Abstract:
A method and apparatus for genomic or proteomic research to visualize fluorescent labeled DNA, RNA or protein samples that have been separated for documentation and analysis. The apparatus includes a novel radiation source for uniformly irradiating the samples which comprises a grid constructed from a continuous, serpentine shaped ultraviolet light producing tube that is strategically formed to provide a multiplicity of side-by-side, immediately adjacent irradiating segments. In one form of the invention the apparatus also includes a first conversion plate that is carried by the housing at a location intermediate the radiation source and the sample supporting platform for converting the radiation emitted from the source to radiation at a second wavelength.
Abstract:
A method and apparatus for genomic or proteomic research to visualize fluorescent labeled DNA, RNA or protein samples that have been separated for documentation and analysis. The apparatus includes a novel radiation source for uniformly irradiating the samples which comprises a grid constructed from a continuous, serpentine shaped ultraviolet light producing tube that is strategically formed to provide a multiplicity of side-by-side, immediately adjacent irradiating segments. In one form of the invention the apparatus also includes a first conversion plate that is carried by the housing at a location intermediate the radiation source and the sample supporting platform for converting the radiation emitted from the source to radiation at a second wavelength.
Abstract:
The present invention provides an improved system for identifying defects in a composite structure by providing a light source such that defects, and in particular dark defects on a dark background and/or light defects on a light background, can be identified by capturing images of the illuminated composite structure. In particular, the improved system for identifying defects in a composite structure may provide a reflective surface, dispersion elements, and multiple and/or moveable light source(s) and/or camera(s) in order to ensure that the most accurate images of any area of the composite structure, even curved or contoured areas, are captured and processed. As a result, the system of the present invention permits the operator to quickly identify and correct defects which would otherwise create structural flaws or inconsistencies that may affect the integrity of the composite structure.
Abstract:
An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus includes a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light illuminates the illumination region. Additionally, the apparatus includes an image collecting device adapted to selectively collect images of either a first signal when the illumination source is illuminating the illumination region, or a second signal absent illumination of the illumination region. The first signal has wavelengths effectively different from the wavelengths of the portion of the light emitted by the LEDs that illuminates the illumination region.
Abstract:
An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.
Abstract:
A readhead for a spectrometer for illuminating a target area and receiving light from said target area is provided with a housing adapted to be incorporated in a spectrometer, a light source mounted in a fixed position relative to the housing, a support mechanism adapted to support a biological sample to be illuminated by the light source, a light-shaping mechanism disposed between the light source and the support for increasing the diameter, intensity, and uniformity of the light beam, and a photodetector mounted in fixed position relative to the housing, the photodetector being adapted to detect light from a biological sample disposed in the target area illuminated light sources. The light sources may be in the form of a light-emitting diode that emits substantially monochromatic light having a first wavelength, and the readhead may also include a second light-emitting diode that is adapted to emit substantially monochromatic light of a second wavelength towards the target area.
Abstract:
A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.