Illuminator-especially for cylindrical curved surfaces
    181.
    发明申请
    Illuminator-especially for cylindrical curved surfaces 有权
    照明器 - 特别适用于圆柱形曲面

    公开(公告)号:US20070097686A1

    公开(公告)日:2007-05-03

    申请号:US11591343

    申请日:2006-11-01

    Abstract: A plurality of LED's, or electro luminescent strips, are disposed to project illumination to and thru, or towards, a diffuser; resulting in at least a portion of generated diffuse illumination being directed towards and upon the cylindrical surface of an article or part when disposed at an article illumination location. The article illumination location is established so that a centerline through the article is co-linear with a center line of the diffuse illumination projecting from, or reflected from, the diffusers. A housing may be provided for the LED's, electro luminescent strips and diffusers; or they may be otherwise arranged to coact to provide diffuse illumination directed towards the cylindrical surface of the part or other article. illumination reflected off of the article's cylindrical surface, and/or any markings, such as symbology, carried thereby is directed to a lens/camera arrangement to provide an image of same for transmission to a computer, controller, smart camera or other image utilization system.

    Abstract translation: 多个LED或电致发光条被设置成将照明照射到扩散器上并通过或朝向扩散器; 导致当设置在物品照明位置时,产生的漫射照明的至少一部分被引向物品或部件的圆柱形表面并朝向物体或部件的圆柱形表面。 物品照明位置被建立为使得穿过物品的中心线与从扩散器突出或从扩散器反射的漫射照明的中心线是共线的。 可以为LED,电致发光条和扩散器提供壳体; 或者它们可以以其它方式布置成共同作用以提供朝向部件或其它物品的圆柱形表面的漫射照明。 由物品的圆柱形表面反射的照明和/或由其携带的诸如符号系统的任何标记被引导到透镜/照相机装置,以提供相同的图像以传送到计算机,控制器,智能相机或其他图像利用系统 。

    Combination reader
    183.
    发明申请
    Combination reader 审中-公开
    组合阅读器

    公开(公告)号:US20070030677A1

    公开(公告)日:2007-02-08

    申请号:US11580100

    申请日:2006-10-12

    Abstract: An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus includes a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light illuminates the illumination region. Additionally, the apparatus includes an image collecting device adapted to selectively collect images of either a first signal when the illumination source is illuminating the illumination region, or a second signal absent illumination of the illumination region. The first signal has wavelengths effectively different from the wavelengths of the portion of the light emitted by the LEDs that illuminates the illumination region.

    Abstract translation: 一种用于对与样本瓦片相关联的多个特征的阵列进行成像的装置。 该装置包括在照明区域中支撑样品瓦的台,以及具有适于发光的多个LED的照明源。 至少一部分光照射照明区域。 另外,该装置包括图像采集装置,适于在照明源照射照明区域时选择性地收集第一信号的图像,或者不存在照明区域的照明的第二信号。 第一信号具有与照亮照明区域的由LED发射的光的部分的波长有效不同的波长。

    Ultraviolet lighting platform
    184.
    发明授权
    Ultraviolet lighting platform 有权
    紫外线照明平台

    公开(公告)号:US07030392B2

    公开(公告)日:2006-04-18

    申请号:US10733561

    申请日:2003-12-10

    Applicant: Alex Waluszko

    Inventor: Alex Waluszko

    Abstract: A method and apparatus for genomic or proteomic research to visualize fluorescent labeled DNA, RNA or protein samples that have been separated for documentation and analysis. The apparatus includes a novel radiation source for uniformly irradiating the samples which comprises a grid constructed from a continuous, serpentine shaped ultraviolet light producing tube that is strategically formed to provide a multiplicity of side-by-side, immediately adjacent irradiating segments. In one form of the invention the apparatus also includes a first conversion plate that is carried by the housing at a location intermediate the radiation source and the sample supporting platform for converting the radiation emitted from the source to radiation at a second wavelength.

    Abstract translation: 用于基因组或蛋白质组学研究的方法和装置,用于可视化分离的用于文献和分析的荧光标记的DNA,RNA或蛋白质样品。 该装置包括用于均匀照射样品的新型辐射源,其包括由连续的蛇形形状的紫外线产生管构成的栅格,其被策略地形成以提供多个并排的紧邻照射段。 在本发明的一种形式中,该装置还包括第一转换板,其由外壳承载在放射源和样品支撑平台之间的位置,用于将从源发射的辐射转换成第二波长的辐射。

    Ultraviolet lighting platform
    185.
    发明申请
    Ultraviolet lighting platform 有权
    紫外线照明平台

    公开(公告)号:US20050127308A1

    公开(公告)日:2005-06-16

    申请号:US10733561

    申请日:2003-12-10

    Applicant: Alex Waluszko

    Inventor: Alex Waluszko

    Abstract: A method and apparatus for genomic or proteomic research to visualize fluorescent labeled DNA, RNA or protein samples that have been separated for documentation and analysis. The apparatus includes a novel radiation source for uniformly irradiating the samples which comprises a grid constructed from a continuous, serpentine shaped ultraviolet light producing tube that is strategically formed to provide a multiplicity of side-by-side, immediately adjacent irradiating segments. In one form of the invention the apparatus also includes a first conversion plate that is carried by the housing at a location intermediate the radiation source and the sample supporting platform for converting the radiation emitted from the source to radiation at a second wavelength.

    Abstract translation: 用于基因组或蛋白质组学研究的方法和装置,用于可视化分离的用于文献和分析的荧光标记的DNA,RNA或蛋白质样品。 该装置包括用于均匀照射样品的新型辐射源,其包括由连续的蛇形形状的紫外线产生管构成的栅格,其被策略地形成以提供多个并排的紧邻照射段。 在本发明的一种形式中,该装置还包括第一转换板,其由外壳承载在放射源和样品支撑平台之间的位置,用于将从源发射的辐射转换成第二波长的辐射。

    System for identifying defects in a composite structure
    186.
    发明授权
    System for identifying defects in a composite structure 有权
    用于识别复合结构中的缺陷的系统

    公开(公告)号:US06871684B2

    公开(公告)日:2005-03-29

    申请号:US10217805

    申请日:2002-08-13

    Abstract: The present invention provides an improved system for identifying defects in a composite structure by providing a light source such that defects, and in particular dark defects on a dark background and/or light defects on a light background, can be identified by capturing images of the illuminated composite structure. In particular, the improved system for identifying defects in a composite structure may provide a reflective surface, dispersion elements, and multiple and/or moveable light source(s) and/or camera(s) in order to ensure that the most accurate images of any area of the composite structure, even curved or contoured areas, are captured and processed. As a result, the system of the present invention permits the operator to quickly identify and correct defects which would otherwise create structural flaws or inconsistencies that may affect the integrity of the composite structure.

    Abstract translation: 本发明提供了一种用于通过提供光源来识别复合结构中的缺陷的改进的系统,使得可以通过捕获图像的图像来识别缺陷,特别是暗背景上的暗缺陷和/或光背景上的光缺陷 照明复合结构。 特别地,用于识别复合结构中的缺陷的改进的系统可以提供反射表面,色散元件以及多个和/或可移动的光源和/或照相机,以便确保最准确的图像 复合结构的任何区域,甚至弯曲或轮廓区域被捕获和处理。 结果,本发明的系统允许操作者快速地识别和纠正否则将产生可能影响复合结构的完整性的结构缺陷或不一致的缺陷。

    Combination reader
    187.
    发明申请
    Combination reader 有权
    组合阅读器

    公开(公告)号:US20040178370A1

    公开(公告)日:2004-09-16

    申请号:US10384995

    申请日:2003-03-10

    Abstract: An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus includes a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light illuminates the illumination region. Additionally, the apparatus includes an image collecting device adapted to selectively collect images of either a first signal when the illumination source is illuminating the illumination region, or a second signal absent illumination of the illumination region. The first signal has wavelengths effectively different from the wavelengths of the portion of the light emitted by the LEDs that illuminates the illumination region.

    Abstract translation: 一种用于对与样本瓦片相关联的多个特征的阵列进行成像的装置。 该装置包括在照明区域中支撑样品瓦的台,以及具有适于发光的多个LED的照明源。 至少一部分光照射照明区域。 另外,该装置包括图像采集装置,适于在照明源照射照明区域时选择性地收集第一信号的图像,或者不存在照明区域的照明的第二信号。 第一信号具有与照亮照明区域的由LED发射的光的部分的波长有效不同的波长。

    Apparatus and method for direct measurement of absorption and scattering coefficients in situ
    188.
    发明申请
    Apparatus and method for direct measurement of absorption and scattering coefficients in situ 有权
    用于直接测量原位吸收和散射系数的装置和方法

    公开(公告)号:US20040141179A1

    公开(公告)日:2004-07-22

    申请号:US10715336

    申请日:2003-11-17

    Abstract: An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.

    Abstract translation: 用于测量吸收系数的装置包括第一漫射材料,第一漫射材料内部的第一漫射材料,其通过空腔与第一漫射材料分离,以及靠近第二漫射材料的内表面的透明材料,其保持吸收 材料。 第一和第二光检测器分别测量第一和第二漫射材料中的光强度。 吸收材料的吸收系数可以基于当腔被光源照射时测量的第一和第二光强度来确定。

    Photometric readhead with light-shaping plate
    189.
    发明授权
    Photometric readhead with light-shaping plate 失效
    光度读数头与光成型板

    公开(公告)号:US06181417B2

    公开(公告)日:2001-01-30

    申请号:US09062987

    申请日:1998-04-20

    Abstract: A readhead for a spectrometer for illuminating a target area and receiving light from said target area is provided with a housing adapted to be incorporated in a spectrometer, a light source mounted in a fixed position relative to the housing, a support mechanism adapted to support a biological sample to be illuminated by the light source, a light-shaping mechanism disposed between the light source and the support for increasing the diameter, intensity, and uniformity of the light beam, and a photodetector mounted in fixed position relative to the housing, the photodetector being adapted to detect light from a biological sample disposed in the target area illuminated light sources. The light sources may be in the form of a light-emitting diode that emits substantially monochromatic light having a first wavelength, and the readhead may also include a second light-emitting diode that is adapted to emit substantially monochromatic light of a second wavelength towards the target area.

    Abstract translation: 用于照射目标区域并接收来自所述目标区域的光的光谱仪的读取头设置有适于结合在光谱仪中的壳体,安装在相对于壳体的固定位置的光源,适于支撑 由光源照射的生物样品,设置在光源和支撑体之间的光成形机构,用于增加光束的直径,强度和均匀性;以及光电检测器,其安装在相对于壳体的固定位置, 光电检测器适于检测设置在目标区域照明光源中的生物样品的光。 光源可以是发射基本上具有第一波长的单色光的发光二极管的形式,并且读取头还可以包括第二发光二极管,其适于将基本上第二波长的单色光朝向 目标区域。

    Manufacturing method of semiconductor substrative and method and
apparatus for inspecting defects of patterns on an object to be
inspected
    190.
    发明授权
    Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected 失效
    半导体衬底的制造方法以及用于检查待检查物体上的图案缺陷的方法和装置

    公开(公告)号:US5774222A

    公开(公告)日:1998-06-30

    申请号:US539886

    申请日:1995-10-06

    Abstract: A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.

    Abstract translation: 一种用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法及其装置以及以高产率制造半导体晶片等半导体基板的半导体基板的制造方法和系统。 通过将通过物镜的环形照明照射到安装在台架上的晶片上,检查被检查物体上的微细图案,晶片上具有微细精细图案。 照明光可以根据在物镜的光瞳上检测到的图像而被圆形或椭圆偏振并且被控制,并且通过检测来自晶片的反射光来获得图像信号。 将图像信号与参考图像信号进行比较,并且检测出显示不一致的图案的一部分作为缺陷,从而同时以高分辨率检测微细微图案或微细图案上的缺陷。 此外,通过分析缺陷的原因和在图案上发生的缺陷因素来控制生产线的工艺条件。

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