Abstract:
A memory includes an array of magnetic memory cells, each magnetic memory cell being adapted to store a bit of information, interconnects in communication with the magnetic memory cells, and conductors in communication with the magnetic memory cells and the interconnects, the conductors filling spaces between adjacent magnetic memory cells of the array.
Abstract:
A data storage device that includes an array of resistive memory cells. The resistive memory cells may include a magnetic tunnel junction (MTJ) and a thin-film diode. The device may include a circuit that is electrically connected to the array and that is also capable of monitoring a signal current flowing through a selected memory cell. Once the signal current has been monitored, the circuit is capable of comparing the signal current to an average reference current in order to determine which of a first resistance state and a second resistance state the selected memory cell is in. Also, a method for operating the data storage device.
Abstract:
A memory apparatus, which may be of resistive cross point memory (RXPtM) cell type (one example of which is a magnetic random access memory (MRAM)) includes multiple serial data paths which are merged and may exchange data as needed by the data input/output (I/O) circuits connected to a serial I/O port. A plurality of scan path registers are connected by an array of static random access memory (SRAM) memory units of plural memory cells. The scan paths and SRAM memory units perform a parallel transfer of data from scan path registers to and from temporary registers of the SRAM memory units in order to effect parallel data exchange between the multiple scan path registers.
Abstract:
A method for performing a read operation from a memory cell in a memory cell is provided. The method includes applying a constant current across the memory cell string, measuring a first voltage across the memory cell string, writing the memory cell to a first state, measuring a second voltage across the memory cell string, and determining whether the first voltage differs from the second voltage.
Abstract:
A control circuit for writing to and reading from MRAMs comprising a row decoder; a first read/write row driver connected to the row decoder; a plurality of global row write conductors connected to the first read/write row driver; a plurality of row taps connected to each of the global row write conductors; and a second read/write row driver connected to the global row write conductors.
Abstract:
An information storage device is disclosed. In one embodiment, the information storage device includes first and second memory cells which store complementary first and second logic states. An error detection system coupled to the first and second memory cells is configured to indicate an error if a difference between a first current flowing through the first memory cell and a second current flowing through the second memory cell is less than a predefined value.
Abstract:
A magnetic memory is disclosed. In one embodiment, the magnetic memory includes first and second memory cells and a read controller coupled to the first and second memory cells. An output controller coupled to the read controller and to the first and second memory cells, wherein the output controller is configured to receive read data in parallel only from the first or second memory cells which have completed the current read operation regardless of whether both the first and second memory cells have completed the current read operation and convert the parallel data to serial data and shift the parallel data to an output in synchronism with the system clock signal.
Abstract:
The invention includes an apparatus and method for generating a write current for a magnetic memory cell. The apparatus includes a write current generator for generating a write current, the write current being magnetically coupled to the magnetic memory cell. The apparatus further includes at least one test magnetic memory cell, the write current being magnetically coupled to the at least one test magnetic memory cell. A switching response of the at least one test magnetic memory cell determines a magnitude of the write current generated by the write current generator. The method for determining a write current for a magnetic memory cell includes supplying a test write current to a test magnetic memory cell, sensing a magnetic state of the test magnetic memory cell to determine a switching response of the test magnetic memory cell, and generating the write current having a magnitude that is dependent upon the switching response.
Abstract:
A data storage device that includes an array of resistive memory cells. The resistive memory cells may include a magnetic tunnel junction (MTJ) and a thin-film diode. The device may include a circuit that is electrically connected to the array and that is also capable of monitoring a signal current flowing through a selected memory cell. Once the signal current has been monitored, the circuit is capable of comparing the signal current to an average reference current in order to determine which of a first resistance state and a second resistance state the selected memory cell is in. Also, a method for operating the data storage device.
Abstract:
A method of adaptively writing magnetic memory cells of a MRAM is disclosed according to an embodiment of the present invention. The method comprises providing a logical data block of a memory array having magnetic memory cells, each magnetic memory cell in a known initial state and each magnetic memory cell configured along an easy-axis magnetic field generating conductor and writing to the magnetic memory cells using a predefined minimum current level. The method may further comprise sensing the magnetic memory cells to determine if data has been successfully written, incrementing the current level if writing was unsuccessful and repeating above.