公开(公告)号：US08107720B2

公开(公告)日：2012-01-31

申请号：US12453636

申请日：2009-05-18

申请人： Bily Wang ,  Kuei-Pao Chen ,  Hsin-Cheng Chen ,  Ming-Hao Chou ,  Ren-Chun Ni

发明人： Bily Wang ,  Kuei-Pao Chen ,  Hsin-Cheng Chen ,  Ming-Hao Chou ,  Ren-Chun Ni

IPC分类号： G06K9/00

CPC分类号： G06T7/0006 ,  G06T2207/30164

摘要： A detection system for detecting appearances of many electronic elements includes a rotary module, a feeding module and a detection module. The rotary module has a base structure and a hollow transparent rotary structure disposed on the base structure. The feeding module is disposed beside one side of the hollow transparent rotary structure in order to sequentially guide the electronic elements to the top surface of the hollow transparent rotary structure. The detection module has a plurality of detection units sequentially disposed around the hollow transparent rotary structure. Each detection unit is composed of an image-sensing element for sensing the electronic elements, an image-capturing element for capturing surface images of the electronic elements and a classifying element for classifying the electronic elements.

摘要翻译： 用于检测许多电子元件的外观的检测系统包括旋转模块，馈送模块和检测模块。 旋转模块具有底座结构和设置在基座结构上的中空透明旋转结构。 馈送模块设置在中空透明旋转结构的一侧旁边，以便顺序地将电子元件引导到中空透明旋转结构的顶表面。 检测模块具有多个依次设置在中空透明旋转结构周围的检测单元。 每个检测单元由用于感测电子元件的图像感测元件，用于捕获电子元件的表面图像的图像捕获元件和用于分类电子元件的分类元件组成。

公开(公告)号：US07397396B2

公开(公告)日：2008-07-08

申请号：US11550420

申请日：2006-10-18

申请人： Hsin-Cheng Chen ,  Pi-Hai Liu ,  Ming-Yang Chao

发明人： Hsin-Cheng Chen ,  Pi-Hai Liu ,  Ming-Yang Chao

IPC分类号： H03M5/00

CPC分类号： G11B20/1426 ,  G11B2020/1288 ,  G11B2020/1442 ,  G11B2020/1453 ,  G11B2020/1457 ,  G11B2220/2541 ,  G11B2220/2579

摘要： A modulation system includes an encoder for transferring data words to tentative code words. A DSV control bit generator determines the value of a DSV control bit according to the data words or the tentative code words to optimize the cumulative DSVs corresponding tentative code words, wherein the DSV control bit generator determines the value of a current DSV control bit when at least a subsequent DSV control bit is detected. A final code word generator generates final code words according to the determined DSV control bit and the tentative code words.

摘要翻译： 调制系统包括用于将数据字传送到临时码字的编码器。 DSV控制位发生器根据数据字或暂定码字来确定DSV控制位的值，以优化对应的暂定码字的累积DSV，其中DSV控制位发生器确定当当前DSV控制位的值在 至少检测到随后的DSV控制位。 最终码字发生器根据确定的DSV控制位和暂定码字产生最终码字。

公开(公告)号：US20070094573A1

公开(公告)日：2007-04-26

申请号：US11357323

申请日：2006-02-17

申请人： Hsin-cheng Chen ,  Ching-wen Hsueh

发明人： Hsin-cheng Chen ,  Ching-wen Hsueh

IPC分类号： G11C29/00

CPC分类号： G11B20/1816 ,  G11B20/1833 ,  G11B20/1866 ,  G11B2020/10796 ,  G11B2020/1823 ,  G11B2020/1846

摘要： A method and device for error analysis particularly adoptable for a recording medium such as an optical disc are disclosed. The present invention executes an encoding-like operation such as an interleaving operation to error flags during reproducing data from the optical disc, so as to obtain number and distribution of the errors on the disc.

摘要翻译： 公开了一种特别适用于诸如光盘的记录介质的误差分析方法和装置。 本发明在从光盘再现数据期间对错误标志执行诸如交错操作之类的编码操作，以便获得盘上错误的数量和分布。

公开(公告)号：US06818917B2

公开(公告)日：2004-11-16

申请号：US10385631

申请日：2003-03-12

申请人： Chieh-Hsiung Kuan ,  Hsin-Cheng Chen ,  Chun-Chi Chen ,  Sheng-Di Lin ,  Jen-Hsiang Lu

发明人： Chieh-Hsiung Kuan ,  Hsin-Cheng Chen ,  Chun-Chi Chen ,  Sheng-Di Lin ,  Jen-Hsiang Lu

IPC分类号： H01L29205

CPC分类号： B82Y20/00 ,  H01L31/035236 ,  H01L31/101

摘要： An infrared photodetector structure with voltage-tunable and -switchable photoresponses constructed of superlattices and blocking barriers. The photoresponses of the double-superlattice structure are also insensitive to the operating temperature changes. By using GaAs/AlxGa1-xAs system, the feasibility of this idea is verified. In the embodiment, the photoresponses can be switched between 6˜8.5 and 7.5˜12 m by the bias polarity and are also tunable by the bias magnitude in each detection wavelength range. In addition, the photoresponses are insensitive to operating temperatures ranging from 20 to 80 K. For the SLIP with few periods, the responsivity may be higher than the one with many periods and the operational temperature is higher. These results show the invention can be useful in the design of multicolor imaging systems. This invention is not only applicable for wavelengths comparable with the embodiment, but can also be applied to the detection of radiation in the range from visible to extreme far infrared.

摘要翻译： 具有由超晶格和阻挡屏障构成的具有电压可调和可开关光响应的红外光电探测器结构。 双超晶格结构的光响应也对工作温度变化不敏感。 通过使用GaAs / AlxGa1-xAs系统，验证了这一想法的可行性。 在实施例中，光响应可以通过偏置极性在6〜8.5和7.5〜12μm之间切换，并且也可以通过每个检测波长范围内的偏置量值来调节。 此外，光响应对20至80K的工作温度不敏感。对于SLIP几个周期，响应度可能高于具有多个周期的响应，并且操作温度较高。 这些结果表明本发明可用于多色成像系统的设计。 本发明不仅适用于与实施例相当的波长，而且还可以应用于从可见光到远红外线的范围内的辐射检测。

公开(公告)号：US08710387B2

公开(公告)日：2014-04-29

申请号：US13204616

申请日：2011-08-05

申请人： Bily Wang ,  Kuei-Pao Chen ,  Hsin-Cheng Chen

发明人： Bily Wang ,  Kuei-Pao Chen ,  Hsin-Cheng Chen

IPC分类号： B07C5/00

CPC分类号： G01R31/01 ,  G01R31/2635

摘要： An LED package chip classification system includes a rotation unit for transporting a plurality of LED package chips, a chip test unit, and a chip classification unit. The rotation unit includes a rotary turntable, a plurality of receiving portions formed on the rotary turntable, and a plurality of suction-exhaust dual-purpose openings respectively disposed in the receiving portions. Each LED package chip has a positive electrode pad and a negative electrode pad disposed on the bottom side thereof. The chip test unit includes a chip test module adjacent to the rotation unit for testing each LED package chip. The chip classification unit includes a plurality of chip classification modules adjacent to the rotation unit for classifying the LED package chips. Therefore, the LED package chips can be classified by matching the rotation unit, the chip test unit, and the chip classification unit.

摘要翻译： LED封装芯片分类系统包括用于传输多个LED封装芯片的转动单元，芯片测试单元和芯片分类单元。 旋转单元包括旋转转盘，形成在旋转转台上的多个接收部分和分别设置在接收部分中的多个抽吸排气双重用途开口。 每个LED封装芯片具有设置在其底侧上的正极焊盘和负极焊盘。 芯片测试单元包括与旋转单元相邻的芯片测试模块，用于测试每个LED封装芯片。 芯片分类单元包括与用于分类LED封装芯片的旋转单元相邻的多个芯片分类模块。 因此，可以通过匹配旋转单元，芯片测试单元和芯片分类单元来分类LED封装芯片。

公开(公告)号：US20120285869A1

公开(公告)日：2012-11-15

申请号：US13204616

申请日：2011-08-05

申请人： BILY WANG ,  KUEI-PAO CHEN ,  HSIN-CHENG CHEN

发明人： BILY WANG ,  KUEI-PAO CHEN ,  HSIN-CHENG CHEN

IPC分类号： B07C5/344

CPC分类号： G01R31/01 ,  G01R31/2635

摘要： An LED package chip classification system includes a rotation unit for transporting a plurality of LED package chips, a chip test unit, and a chip classification unit. The rotation unit includes a rotary turntable, a plurality of receiving portions formed on the rotary turntable, and a plurality of suction-exhaust dual-purpose openings respectively disposed in the receiving portions. Each LED package chip has a positive electrode pad and a negative electrode pad disposed on the bottom side thereof The chip test unit includes a chip test module adjacent to the rotation unit for testing each LED package chip. The chip classification unit includes a plurality of chip classification modules adjacent to the rotation unit for classifying the LED package chips. Therefore, the LED package chips can be classified by matching the rotation unit, the chip test unit, and the chip classification unit.

摘要翻译： LED封装芯片分类系统包括用于传输多个LED封装芯片的转动单元，芯片测试单元和芯片分类单元。 旋转单元包括旋转转盘，形成在旋转转台上的多个接收部分和分别设置在接收部分中的多个抽吸排气双用途开口。 每个LED封装芯片具有设置在其底侧的正极焊盘和负极焊盘。芯片测试单元包括与用于测试每个LED封装芯片的旋转单元相邻的芯片测试模块。 芯片分类单元包括与用于分类LED封装芯片的旋转单元相邻的多个芯片分类模块。 因此，可以通过匹配旋转单元，芯片测试单元和芯片分类单元来分类LED封装芯片。

公开(公告)号：US20120205297A1

公开(公告)日：2012-08-16

申请号：US13170705

申请日：2011-06-28

申请人： Bily WANG ,  Kuei-Pao CHEN ,  Hsin-Cheng CHEN

发明人： Bily WANG ,  Kuei-Pao CHEN ,  Hsin-Cheng CHEN

IPC分类号： B07C5/00 ,  B07C5/344

CPC分类号： B07C5/00 ,  B07C5/344 ,  G01R31/01 ,  G01R31/2893

摘要： A packaged chip detection and classification device includes a rotation unit for transporting a plurality of packaged chips, a packaged chip detection unit, and a packaged chip classification unit. The rotation unit includes a rotary turntable, a plurality of receiving portions formed on the rotary turntable, and a plurality of suction-exhaust openings respectively formed in the receiving portions. Each receiving portion is used to selectively receive at least one of the packaged chips. The packaged chip detection unit includes a packaged chip detection module adjacent to the rotation unit for detecting each packaged chip. The packaged chip classification unit includes a packaged chip classification module adjacent to the rotation unit for classifying the packaged chips. Therefore, the packaged chip detection and classification device can be used to detect and classify no-lead packaged chips by matching the rotation unit, the packaged chip detection unit, and the packaged chip classification unit.

摘要翻译： 封装芯片检测和分类装置包括用于传输多个封装芯片的转动单元，封装芯片检测单元和封装芯片分类单元。 旋转单元包括旋转转盘，形成在旋转转盘上的多个接收部分和分别形成在接收部分中的多个抽吸排气口。 每个接收部分用于选择性地接收至少一个封装的芯片。 封装芯片检测单元包括与用于检测每个封装芯片的旋转单元相邻的封装芯片检测模块。 封装芯片分类单元包括与旋转单元相邻的封装芯片分类模块，用于对封装芯片进行分类。 因此，封装芯片检测和分类装置可以通过匹配旋转单元，封装芯片检测单元和封装芯片分类单元来检测和分类无铅封装芯片。

公开(公告)号：US20090096462A1

公开(公告)日：2009-04-16

申请号：US12010119

申请日：2008-01-22

申请人： Bily Wang ,  Hsin-Cheng Chen ,  Ming-Hao Chou

发明人： Bily Wang ,  Hsin-Cheng Chen ,  Ming-Hao Chou

IPC分类号： G01R31/26

CPC分类号： G01R31/2894 ,  G01R31/2831 ,  H01L22/24

摘要： A wafer testing method for wafer testing system comprises the steps: loading a wafer and then positioning the wafer relatively to a map file image stored in a map file. The map file is of a first file type. The next step is inspecting the appearance of the wafer. When the user detects defects on the wafer, the positions of the defects are directly recorded in the map file and then the modified map file is saved. The map file can be directly modified when the wafer is in the testing procedure so that the testing time is reduced. Furthermore, the precision of the testing is improved.

摘要翻译： 用于晶片测试系统的晶片测试方法包括以下步骤：将晶片加载，然后将晶片相对于存储在映射文件中的映射文件图像相对定位。 地图文件是第一种文件类型。 下一步是检查晶片的外观。 当用户检测到晶片上的缺陷时，将缺陷的位置直接记录在地图文件中，然后保存修改的地图文件。 当晶片处于测试过程中时，可以直接修改地图文件，以减少测试时间。 此外，测试的精度提高。

公开(公告)号：US07395462B2

公开(公告)日：2008-07-01

申请号：US11306360

申请日：2005-12-25

申请人： Wei-Hsiang Tseng ,  Hsin-Cheng Chen ,  Ping-Sheng Chen

发明人： Wei-Hsiang Tseng ,  Hsin-Cheng Chen ,  Ping-Sheng Chen

IPC分类号： G06F11/00

CPC分类号： G11B20/1816 ,  G11B2220/2541

摘要： A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.

摘要翻译： 公开了一种用于确定缺陷估计值的加权缺陷估计装置和相关方法。 加权缺陷检测装置包括：缺陷检测单元，用于当检测到光盘的预定区域中的缺陷时产生缺陷值; 电连接到所述缺陷检测单元的加权电路，以根据所述缺陷值产生加权缺陷值，以及与所述光盘上的所述缺陷的位置相对应的加权因子; 以及计算模块，电连接到所述加权电路，用于根据与所述预定区域对应的多个加权缺陷值计算所述缺陷估计值。

公开(公告)号：US20070104053A1

公开(公告)日：2007-05-10

申请号：US11163940

申请日：2005-11-04

申请人： Hsin-Cheng Chen ,  Ching-Wen Hsueh

发明人： Hsin-Cheng Chen ,  Ching-Wen Hsueh

IPC分类号： G11B20/10

CPC分类号： G11B20/10 ,  G11B20/1217 ,  G11B2020/10972 ,  G11B2020/1221 ,  G11B2020/1267 ,  G11B2020/1277 ,  G11B2220/2537

摘要： A method for controlling an optical disc drive to resume interrupted recording on an optical disc includes: when the recording of a first recording unit block (RUB) is interrupted, storing an address thereof and storing a first value corresponding to the number of recorded sets of data of the first RUB; according to the address, searching a pseudo-recording start position corresponding to a recorded set of data of a specific RUB which is the first RUB or a second RUB recorded on the optical disc prior to the first RUB; re-encoding at least a portion of raw data corresponding to recorded sets of data on the optical disc and performing pseudo-recording from the pseudo-recording start position without physically writing on the optical disc until a second value matches a target value; and physically writing on the optical disc when the second value matches the target value to resume recording.

摘要翻译： 一种用于控制光盘驱动器在光盘上恢复中断记录的方法包括：当第一记录单元块（RUB）的记录被中断时，存储其地址并存储对应于记录集的记录集的数量的第一值 第一个RUB的数据; 根据该地址，搜索与在第一RUB之前记录在光盘上的第一RUB或第二RUB的特定RUB的记录的数据集相对应的伪记录开始位置; 对与光盘上记录的数据组对应的原始数据的至少一部分进行重新编码，并且从伪记录开始位置执行伪记录，而不物理地写入光盘，直到第二值与目标值相匹配; 并且当第二值与目标值匹配以恢复记录时，在光盘上物理写入。