公开(公告)号：US20070131875A1

公开(公告)日：2007-06-14

申请号：US11590851

申请日：2006-11-01

Applicant: Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

Inventor： Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

IPC: G01N21/64

CPC classification number: G02B21/0076 ,  G02B21/0048

Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scamming means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

Abstract translation: 用于通过第一扫描装置沿着基本上垂直于照明轴线的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样品区域的方法，其中与至少一个样品区域的平面成角度 相对运动，优选地与其垂直，第二扫描装置被移动，并且通过所耦合的第一和第二扫描装置的移动进行图像采集，并且通过样品的照射进行三维采样运动，其中第二打扫装置 耦合到第一扫描装置的运动，使得沿着第一扫描装置的至少一个扫描方向延伸的直线和/或曲线和/或平面和/或曲面被扫描，以及沿着 第二扫描装置的扫描方向。

公开(公告)号：US07649683B2

公开(公告)日：2010-01-19

申请号：US10967341

申请日：2004-10-19

Applicant: Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

Inventor： Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

IPC: G02B21/06

CPC classification number: G02B21/008 ,  G02B21/0036 ,  Y10S359/90

Abstract: Process for observing at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector. At an angle to the plane of the relative movement, a second scanner is moved and an image acquisition takes place by coupling the movement of the first and second scanners and a three-dimensional sampling movement being done by the illumination of the sample. The second scanner is coupled to the movement of the first scanner such that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Abstract translation: 使用光栅显微镜通过第一扫描仪沿着基本上垂直于照明轴的至少一个扫描轴的照射光和样本之间的相对运动来观察至少一个样本区域的过程，其中几个照亮的采样点位于一条线上，并且是 与空间分辨检测器同时检测。 与相对运动的平面成一角度，第二扫描器被移动，并且通过耦合第一和第二扫描器的运动以及通过样本的照明来完成三维采样运动来进行图像采集。 第二扫描器耦合到第一扫描仪的运动，使得扫描直线和/或曲线和/或平面和/或曲面，其沿着第一扫描器的至少一个扫描方向以及沿着扫描 第二扫描仪的方向。

公开(公告)号：US07561326B2

公开(公告)日：2009-07-14

申请号：US10967638

申请日：2004-10-19

Applicant: Joerg-Michael Funk ,  Ralf Wolleschensky ,  Joerg Steinert

Inventor： Joerg-Michael Funk ,  Ralf Wolleschensky ,  Joerg Steinert

IPC: G02B21/00 ,  G02B21/06

CPC classification number: G02B21/0044 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0227 ,  G01J3/0237 ,  G01J3/06 ,  G01J3/10 ,  G01J3/44 ,  G01J2003/1217 ,  G02B21/0064 ,  G02B21/008

Abstract: In a confocal laser scanning microscope with an illuminating configuration (2), which provides an illuminating beam for illuminating a specimen region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated specimen region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture (26) or as a slit-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.

Abstract translation: 在具有照射配置（2）的共焦激光扫描显微镜中，其提供用于照射样本区域（23）的照明光束，其具有扫描配置（3,4），其在扫描时将照射光束引导到样本上;以及 具有检测器配置（5），其通过扫描配置（3,4）通过共焦孔（26）将照射的样品区域（23）图像到至少一个检测器单元（28）上， 扫描配置（3,4）的照明配置（2）提供线状照明光束，扫描配置（3,4）在扫描时将线状照射光束引导到样本f上，并且共焦孔 被设计为狭缝孔（26）或作为用作共焦孔的检测器单元（28）的狭缝形区域（28,48）。

公开(公告)号：US20080285123A1

公开(公告)日：2008-11-20

申请号：US11987219

申请日：2007-11-28

Applicant: Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

Inventor： Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

IPC: G02B21/06

CPC classification number: G02B21/002 ,  G02B21/0032

Abstract: Raster scanning light microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.

Abstract translation: 具有至少一个照明模块的线阵扫描的光栅扫描光学显微镜，其中实现将激光可变分割成至少两个照明通道的装置，并且在相同或不同的区域发生样品的联合照明 的样品。

公开(公告)号：US07271382B2

公开(公告)日：2007-09-18

申请号：US10967636

申请日：2004-10-19

Applicant: Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

Inventor： Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

IPC: H01J3/14 ,  H01J5/16 ,  H01J40/14 ,  G06K9/00

CPC classification number: G02B21/002 ,  G02B21/0044 ,  G02B21/0064 ,  G02B21/008 ,  G02B21/248

Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

Abstract translation: 用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样本区域的过程，其中照明光平行照射样本 在多个点或区域处，同时检测多个点或区域，其中相对于相对运动的平面成一角度，优选垂直于其，第二扫描装置被移动，并且通过第一和第二扫描装置 被耦合，并且通过样品的照射来完成三维采样运动，其中第二扫描装置以这样的方式耦合到第一扫描装置的运动，使得直线和/或曲线和/或平面和/或 扫描沿着第一扫描线的至少一个扫描方向延伸的曲面 g装置以及沿着第二扫描装置的扫描方向。

公开(公告)号：US20060012874A1

公开(公告)日：2006-01-19

申请号：US10967324

申请日：2004-10-19

Applicant: Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

Inventor： Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

IPC: G02B21/06

CPC classification number: G02B21/0032 ,  G02B21/0048 ,  G02B21/32

Abstract: Raster Scanning Light Microscope with punctiform light source distribution with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.

Abstract translation: 具有点状光源分布的光栅扫描光显微镜具有至少一个照明模块，其中实现将激光可变分割成至少两个照明通道的手段，并且样品的联合照明在相同或不同的位置发生 样品区域。

公开(公告)号：US20090296207A1

公开(公告)日：2009-12-03

申请号：US11783255

申请日：2007-04-06

Applicant: Michael Goelles ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk

Inventor： Michael Goelles ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk

IPC: G02B21/06

CPC classification number: G01B11/14 ,  G02B21/0036 ,  G02B21/008

Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined.

Abstract translation: 激光扫描显微镜及其操作方法，其中至少两个第一和第二光分布彼此独立地激活并且可以在至少一个方向上移动，借助于光束组合元件照射样品，并且光被 样品进入，其特征在于使由样品上的光分布产生的扫描场相互重叠，使得在具有一个光分布的样品上产生参考图案，然后被捕获， 用于通过第二光分布（校正值被确定）和/或布置在采样平面中或中间图像平面中的参考图案在两个扫描场捕获并用于创建重叠（校正 值被确定）和/或样本的结构特征被两个扫描场作为参考图案捕获并用于创建重叠 其中确定校正值。

公开(公告)号：US07459698B2

公开(公告)日：2008-12-02

申请号：US11590851

申请日：2006-11-01

Applicant: Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

Inventor： Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

IPC: G01N21/64

CPC classification number: G02B21/0076 ,  G02B21/0048

Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Abstract translation: 用于利用光栅显微镜通过第一扫描器沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样本之间的相对运动来观察至少一个样本区域的过程，其中， 相对运动，优选地垂直于其，第二扫描器被移动，并且通过被耦合的第一和第二扫描器的运动而进行图像采集，并且三维采样运动是通过样本的照射进行的，其中第二扫描器耦合到 第一扫描器的运动以这样的方式扫描直线和/或曲线和/或平面和/或曲面，其沿着第一扫描仪的至少一个扫描方向以及沿着第一扫描仪的扫描方向延伸 第二台扫描仪

公开(公告)号：US20080130125A1

公开(公告)日：2008-06-05

申请号：US11783289

申请日：2007-04-06

Applicant: Michael Goelles ,  Ralf Netz ,  Marcus Heidkamp ,  Joerg-Michael Funk

Inventor： Michael Goelles ,  Ralf Netz ,  Marcus Heidkamp ,  Joerg-Michael Funk

IPC: G02B27/10

CPC classification number: G02B27/144 ,  G02B21/0064

Abstract: A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.

Abstract translation: 一种用于组合两个辐射束，优选在至少一个方向上彼此独立的可移动光束以扫描和/或影响样品，优选地操纵系统和成像系统的光束校正器，其中提供了部分反射层用于辐照 ，其中所述层的厚度在所述光束辐射体的光学有效横截面上被提供优选地一致的倾斜或下降。

公开(公告)号：US20080068709A1

公开(公告)日：2008-03-20

申请号：US11783290

申请日：2007-04-06

Applicant: Bernhard Zimmermann ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk ,  Ralf Engelmann

Inventor： Bernhard Zimmermann ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk ,  Ralf Engelmann

IPC: G02B21/06

CPC classification number: G02B21/06 ,  G02B21/00 ,  G02B21/0032 ,  G02B21/0076 ,  G02B27/0972

Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combination, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the first illumination light.

Abstract translation: 显微镜，特别是激光扫描显微镜的致动控制方法，其中至少一个至少在一个方向上移动的第一照明光以及至少沿一个方向移动的至少一个第二照明光， 通过光束组合照射样品，发生来自样品的光的检测，由此通过从公共照明单元分离光而产生照明光的至少一部分，其特征在于，通过装置 发生公共控制单元的受控分割，进入第一和第二照明光，其中由用户指定或自动指定的第一照明光的强度被分配为比较高的优先级（优先化） 对于第二照明光的指定值，并且进行第二照明光的调整，直到获得由th确定的最大值 为第一个照明灯指定的e值。