Abstract:
A transformer includes a base, a magnetic core unit and a winding assembly. The base includes a base body and a pin disposed on the base body. The magnetic core unit is disposed in the base body, and the winding assembly is disposed in the magnetic core unit. A winding of the winding assembly is connected to the pin.
Abstract:
An information display method for an electronic device is provided, wherein the electronic device includes a display apparatus, a processor and a sensor unit. The display apparatus displays at least a stacked icon composed of a plurality pieces of information. The information display method includes processing the sensing signal received from the sensor unit by the electronic device. According the sensing signal, a launching signal is provided by the processor. According the launching signal, the stacked icon is spread out by the processor to display each piece of the information.
Abstract:
A holder is disclosed, wherein the holder is situated on a circuit board and is used for connecting with an electronic component. The holder comprises an upper surface, a lower surface, and an opening. The upper surface comprises a recess used for laying a flat component, wherein the recess comprises at least one rough area; the lower surface comprises a protruding edge, wherein the protruding edge is connected with the circuit board with glue, and the protruding side and the circuit board delimit a space; and the opening penetrates the upper surface and the lower surface, whereby the gas generated from heating the glue will accumulate in the enclosed space, and the gas will then escape through the opening and out through at least one of the rough areas.
Abstract:
A wafer supporting device of a sputter apparatus includes a pedestal positioned in a sputtering chamber and used to load a wafer for sputtering, a deposition ring having a recess positioned on a peripheral portion of the pedestal, and a cover ring positioned on the pedestal and the deposition ring. The cover ring has a gate corresponding to the recess.
Abstract:
Read the description file of a PCBA without determining and selecting connectors which might be relevant to boundary scan. The description file of the PCBA determines which pins of the connectors on the PCBA should correspond to the pins of a test I/O module. And use the wiring report generated by an auto test program generator to correspond the pins of the test I/O module to the pins of the connectors which are accessed by boundary scan. Thus the IC of the test I/O module would not have any unused pin between any two consecutive pins wired to the connectors of the PCBA.
Abstract:
A package substrate having a chip on a substrate has a die pad on the substrate. The chip is attached on the die pad via ah adhesive. A plurality of gold contacts is distributed on the die pad for electrically connecting to the chip. A plurality of traces is distributed around the die pad to connect to the chip via wires. An adhesive dike is formed between the die pad and the traces to prevent the adhesive from flowing out of the die pad when the chip is attached on the die pad.
Abstract:
A method and a system for simulating a three-dimensional (3D) operating interface are provided. The method includes defining a partition line to partition a display frame of a screen into a first area and a second area, and defining a size of a unit grid to establish a first grid plane and a second grid plane in the first area and the second area respectively, the first grid plane and the second grid plane forming a simulated 3D grid space. The method also includes taking the unit grid as a unit to define an object size and an initial grid coordinate of an object. The initial grid coordinate is on one of the first and the second grid planes. The method further includes mapping out a simulated 3D space in the simulated 3D grid space for displaying the object according to the initial grid coordinate and the object size.
Abstract:
A wafer supporting device of a sputter apparatus includes a pedestal positioned in a sputtering chamber and used to load a wafer for sputtering, a deposition ring having a recess positioned on a peripheral portion of the pedestal, and a cover ring positioned on the pedestal and the deposition ring. The cover ring has a gate corresponding to the recess.
Abstract:
Read the description file of a PCBA without determining and selecting connectors which might be relevant to boundary scan. The description file of the PCBA determines which pins of the connectors on the PCBA should correspond to the pins of a test I/O module. And use the wiring report generated by an auto test program generator to correspond the pins of the test I/O module to the pins of the connectors which are accessed by boundary scan. Thus the IC of the test I/O module would not have any unused pin between any two consecutive pins wired to the connectors of the PCBA.