Abstract:
Various embodiments provide for using a timing-based yield calculation to modify a circuit design, which can be part of an electronic design automation (EDA) system. For instance, some embodiments use a timing-based yield calculation to modify one or more portions of the circuit design to improve timing of the circuit design (e.g., slack, slew, delay, etc.), the timing-based yield calculation of the circuit design, or both.
Abstract:
An approach is described for a method, system, and product for deferred merge based method for graph based analysis to reduce pessimism. According to some embodiments, the approach includes receiving design data, static and/or statistical timing analysis data, identifying cells and interconnects for performing graph based worst case timing analysis where merger of signals is deferred based on one or more conditions to reduce pessimism, and generating results thereof. Other additional objects, features, and advantages of the invention are described in the detailed description, figures, and claims.
Abstract:
Electronic design automation systems, methods, and media are presented for characterizing on-chip variation of circuit elements in a circuit design using statistical values including skew, and for performing statistical static timing analysis using these statistical values. One embodiment models delay characteristics under certain operating conditions for circuit elements with asymmetric (e.g., non-Gaussian) probability density functions using normalized skewness. The modeled delay can then be used to perform various timing analysis operations.
Abstract:
A method and system are provided for timing analysis of an electronic circuit design. A timing graph defines a plurality of timing paths through different subsections of the electronic circuit design. A timing window is defined for each of the nodes included in a timing path. At least one preliminary round of a predetermined signal integrity analysis is executed on the circuit design based on the timing windows to identify at least one pair of crosstalk-coupled victim and aggressor nodes. Each victim node's timing window is adaptively adjusted according to a predetermined timing property thereof. At least one primary round of the predetermined signal integrity analysis is executed on the electronic circuit design based in part on this adaptively adjusted timing window for each victim node to generate a delay, which is annotated to the timing graph. A predetermined static timing analysis is executed based on the delay-annotated timing graph.
Abstract:
A system and method for performing multi-mode multi-corner (MMMC) analysis such that multiple views or conditions can be analyzed together to improve runtime by taking advantage of common steps of analysis in different corners. Views are clustered based on their similarity to one another to take advantage of calculations and other tasks that may be shared between views during timing analysis. Then, during timing analysis, each net in the design is analyzed for each view.
Abstract:
Systems, apparatus, and methods of static timing analysis for an integrated circuit design in the presence of noise are disclosed. The integrated circuit design may be partitioned into a plurality of circuit stages. A timing graph including timing arcs is constructed to represent the timing delays in circuit stages of the integrated circuit design. A model of each circuit stage may be formed including a model of a victim driver, an aggressor driver, a victim receiver, and a victim net and an aggressor net coupled together. For each timing arc in the timing graph, full timing delays may be computed for the timing arcs in each circuit stage.
Abstract:
In one embodiment of the invention, a multi-CCC current source model is disclosed to perform statistical timing analysis of an integrated circuit design. The multi-CCC current source model includes a voltage waveform transfer function, a voltage dependent current source, and an output capacitor. The voltage waveform transfer function receives an input voltage waveform and transforms it into an intermediate voltage waveform. The voltage dependent current source generates an output current in response to the intermediate voltage waveform. The output capacitor is coupled in parallel to the voltage dependent current source to generate an output voltage waveform for computation of a timing delay.
Abstract:
Disclosed is an improved approach to implement sharing of delay calculations for replicated portions of a design, where input slews may be different between those replicated design portions. This allows the system to experience runtime improvements for timing analysis of electronic designs.
Abstract:
Disclosed are methods, systems, and articles of manufacture for characterizing timing behavior of an electronic design with a derived current waveform. A set of inputs is determined from a set of electrical characteristics of an electronic design or a portion thereof. Moreover, A derived current waveform is determined at one or more modules stored in memory and executing in conjunction with a microprocessor of a computing node based at least in part upon the set of inputs. The electronic design or the portion thereof is characterized based at least in part upon the derived current waveform.
Abstract:
The present embodiments are generally directed to analyzing clock jitter. Jitter affects the clock delay of the circuit and the time the clock is available at sync points, so it is important to calculate its impact correctly to take appropriate margin during timing analysis. Jitter could be due to various reasons—one of them is due to IR Impact on the Clock Tree. IR drop variations between the two consecutive cycles can effectively reduce the available clock period for data to be correctly captured.