Abstract:
A method is provided for use during static timing analysis of an integrated circuit design to produce an equivalent waveform model, the method comprising: using an analog model of the inner component, to simulate an inner component to produce multiple analog simulation output characterization waveforms as a function of multiple input waveforms used to characterize the design cell; using the analog model of the inner component to simulate the inner component to produce an analog simulation output waveform as a function of the complex waveform; and producing the equivalent waveform model as a function of the multiple analog simulation output characterization waveforms and the analog simulation output waveform.
Abstract:
Disclosed are methods, systems, and articles of manufacture for characterizing an electronic design with a susceptibility window. These techniques identify a set of multiple aggressors in an electronic design and determine, at a susceptibility window module stored in memory and executing in conjunction with a microprocessor of a computing node, a susceptibility window for an internal node of a victim and a timing window for the set of multiple aggressors in the electronic design. These techniques further determine a subset having at least one aggressor using at least the susceptibility window of the victim and the timing window for the set of multiple aggressors, and determine whether a glitch in the electronic design causes a violation at the internal node of the electronic design based at least in part upon the timing window and the susceptibility.
Abstract:
A method for determining a signal electromigration effect in a circuit includes obtaining a partition netlist from a partition of an integrated circuit netlist and identifying a complementary netlist that couples a second input with the output is provided. The complementary netlist is logically independent from the reference netlist. The method includes modifying the partition netlist to couple the reference netlist and the complementary netlist in an inverting configuration, and providing an electromagnetic pulse to at least one of the first input or the second input to induce a current through one of the plurality of circuit components. The method also includes determining an electromigration effect from the current on the one of the plurality of circuit components.
Abstract:
Disclosed are techniques for enhancing timing analyses with reduced timing libraries for electronic designs. These techniques determine dominance relations for multiple timing models for timing analyses and generate a dominance adjacency data structure based at least in part upon the dominance relations. The dominance adjacency data structure may be stored at a first location of a non-transitory computer accessible storage medium. The plurality of timing models may be reduced into a reduced set of timing models at least by providing the dominance adjacency data structure as an input to a transformation and further by transforming the dominance adjacency data structure with the transformation into the reduced set of timing models that are used in timing analyses for an electronic design or a portion thereof.
Abstract:
In one embodiment, a method of constructing an equivalent waveform model for static timing analysis of integrated circuit designs is disclosed. The method includes fitting time point coefficients (qk) and known time delay values from a delay and slew model of a receiving gate from a timing library; determining waveform values (Ikj) for input waveforms from the timing library; determining timing values (dj) from a timing table in the timing library in response to the input waveforms of the timing library; and determining coefficients (qk) by minimizing a residual of a delay equation.
Abstract:
Various embodiments provide a charge model for a cell instance for delay calculation of a circuit design that includes the cell instance, where the charge model can be part of electronic design automation (EDA) and used in timing analysis of a circuit design that includes the cell instance. The charge model generated by an embodiment can predict a charge at an input of a cell instance for an arbitrary input voltage waveform and can address (e.g., reduce or negate) a time delay impact the Miller effect has on the cell instance.
Abstract:
The present embodiments are generally directed to electronic circuit design and verification and more particularly to techniques for characterizing electronic components within an electronic circuit design for use in verification. In one or more embodiments, an adaptive sensitivity based analysis is used to build an adaptive equation to represent the timing response surface for an electronic component. With the adaptive surface response built, a sample-based evaluation yields highly accurate extraction of electronic component timing parameters including on-chip variation information such as sigma and moments.
Abstract:
An approach is described for yield calculation using statistical timing data that accounts for path and stage delay correlation. Embodiments of the present invention provide an improved approach for yield calculation using statistical timing data that accounts for path and stage delay correlation. According to some embodiments, the approach includes receiving statistical timing analysis data, identifying paths for performing timing analysis, performing timing analysis where common segments of different paths are analyzed using shared data and where subsequent stages are transformed to provide an expected correlation between stages, and generating yield probability results based on at least the results of calculating timing analysis.
Abstract:
A method as provided includes retrieving a correlation value from a correlation table and a coskewness value from a coskewness table. The correlation value includes a correlation between a delay distribution and a slew rate distribution, and is associated with both: an input slew rate and an output load, in a logic stage in an integrated circuit design, and the coskewness value is a coskewness between the delay distribution and the slew rate distribution. The method includes determining a partial derivative of a delay function relative to the input slew rate, determining a delay distribution for a signal through a plurality of logic stages using the correlation value, the coskewness value, and the partial derivative of the delay function relative to the input slew rate. The method also includes verifying that a statistical value of the delay distribution satisfies a desired performance value for an integrated circuit.
Abstract:
A lumped aggressor model is used to simulate multiple aggressor nets acting on a victim net. By lumping the aggressor nets together into a single input port, a single voltage excitation may be applied to the input port to simulate the model during static timing analysis. However, a record of each individual aggressor net and several associated attributes for each aggressor net is maintained such that the individual lumped aggressor nets may still be modeled as separate contributions to the attack on the victim net.