公开(公告)号：US11340165B2

公开(公告)日：2022-05-24

申请号：US16629326

申请日：2018-04-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Norikazu Sugiyama ,  Masanori Matsubara ,  Satoshi Yamamoto

IPC: G01N21/64 ,  C12Q1/06 ,  G01N1/30 ,  G01N1/06 ,  G01N21/51 ,  G06T7/00 ,  G01N15/14 ,  G01N21/00 ,  G01N1/31 ,  G02B21/00 ,  G02B21/18 ,  G02B21/26 ,  G02B21/36 ,  G01N21/17 ,  G01N15/10

Abstract: A sample observation device includes an imaging unit that images observation light generated due to irradiation with the planar light that is transmitted through a membrane filter and outputs fluorescent light image data, a partial image generation unit that specifies a first area corresponding to a first sample holding space and a second area corresponding to a second sample holding space in the fluorescent light image data, and generates first partial image data corresponding to the first area and second partial image data corresponding to the second area, an observation image generation unit that generates first observation image data and second observation image data on the basis of the partial image data, and an analysis unit that analyzes a sample on the basis of the first observation image data and the second observation image data.

公开(公告)号：US10809509B2

公开(公告)日：2020-10-20

申请号：US16340797

申请日：2017-08-15

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto ,  Masanori Matsubara ,  Norikazu Sugiyama

IPC: G02B21/00 ,  G02B21/36 ,  G02B21/16

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

公开(公告)号：US12189108B2

公开(公告)日：2025-01-07

申请号：US18206518

申请日：2023-06-06

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto

IPC: G02B21/00 ,  G01N21/49 ,  G01N21/64 ,  G06T5/50 ,  G06T5/70

Abstract: A sample observation device includes: an emission optical system that emits planar light to a sample on an XZ plane; a scanning unit that scans the sample in a Y-axis direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample; an image acquisition unit that acquires a plurality of pieces of XZ image data corresponding to an optical image of the observation light; and an image generation unit that generates XY image data based on the plurality of pieces of XZ image data. The image generation unit extracts an analysis region of the plurality of pieces of XZ image data acquired in the Y-axis direction, integrates brightness values of at least the analysis region in a Z-axis direction to generate X image data, and combines the X image data in the Y-axis direction to generate the XY image data.

公开(公告)号：US11822066B2

公开(公告)日：2023-11-21

申请号：US17751818

申请日：2022-05-24

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto ,  Masanori Matsubara ,  Norikazu Sugiyama

IPC: G02B21/00 ,  G02B21/36 ,  G02B21/16

CPC classification number: G02B21/0032 ,  G02B21/008 ,  G02B21/0036 ,  G02B21/367 ,  G02B21/16

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

公开(公告)号：US11131839B2

公开(公告)日：2021-09-28

申请号：US17006995

申请日：2020-08-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto ,  Masanori Matsubara ,  Norikazu Sugiyama

IPC: G02B21/00 ,  G02B21/36 ,  G02B21/16

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

公开(公告)号：US09841414B2

公开(公告)日：2017-12-12

申请号：US14766238

申请日：2014-02-05

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Hidenao Iwai ,  Takuji Kataoka ,  Satoshi Yamamoto ,  Norikazu Sugiyama ,  Toyohiko Yamauchi ,  Kentaro Goto

IPC: G06K9/00 ,  G01N33/483 ,  G01B11/00 ,  G01N21/47 ,  G01N21/49

CPC classification number: G01N33/4833 ,  G01B11/00 ,  G01N21/47 ,  G01N21/49 ,  G01N2021/4707 ,  G01N2021/479

Abstract: An aggregated cell evaluation apparatus includes a laser light source, a speckle image acquisition unit, an SC calculation unit, an evaluation unit, and a memory unit. The speckle image acquisition unit acquires a two-dimensional speckle image by forward scattered light generated in aggregated cells by irradiation of the aggregated cells with laser light output from the laser light source. The SC calculation unit calculates a speckle contrast value Kn of a speckle image In at each time tn, determines a maximum value Kmax among the speckle contrast values K1 to KN, and normalizes the speckle contrast value Kn at each time tn by the maximum value Kmax to obtain a normalized speckle contrast value Kn′. The evaluation unit evaluates motion of the aggregated cells, based on the normalized speckle contrast value Kn′ at each time tn.

公开(公告)号：USD1015567S1

公开(公告)日：2024-02-20

申请号：US29759219

申请日：2020-11-20

Applicant: HAMAMATSU PHOTONICS K.K.

Designer： Satoshi Yamamoto

Abstract: FIG. 1 is a front view of an adjustment plate for observation device for samples such as cells of the first embodiment of the present invention;
FIG. 2 is a rear view thereof;
FIG. 3 is an enlarged view showing a portion 3 of FIG. 2;
FIG. 4 is an enlarged view showing a portion 4 of FIG. 2;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a right side view thereof;
FIG. 8 is a left side view thereof;
FIG. 9 is a front, top plan and left side perspective view thereof;
FIG. 10 is a rear, top plan and right side perspective view thereof;
FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 1;
FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1;
FIG. 13 is an enlarged view showing a portion 13 of FIG. 3;
FIG. 14 is an enlarged view showing a portion 14 of FIG. 3;
FIG. 15 is an enlarged view showing a portion 15 of FIG. 4;
FIG. 16 is an enlarged view showing a portion 16 of FIG. 4;
FIG. 17 is a front view of an adjustment plate for observation device for samples such as cells of the second embodiment of the present invention;
FIG. 18 is a rear view thereof;
FIG. 19 is an enlarged view showing a portion 19 of FIG. 18;
FIG. 20 is an enlarged view showing a portion 20 of FIG. 18;
FIG. 21 is a top plan view thereof;
FIG. 22 is a bottom plan view thereof;
FIG. 23 is a right side view thereof;
FIG. 24 is a left side view thereof;
FIG. 25 is a front, top plan and left side perspective view thereof;
FIG. 26 is a rear, top plan and right side perspective view thereof;
FIG. 27 is an enlarged cross-sectional view along the line 27-27 in FIG. 17;
FIG. 28 is an enlarged cross-sectional view along the line 28-28 in FIG. 17;
FIG. 29 is an enlarged view showing a portion 29 of FIG. 19;
FIG. 30 is an enlarged view showing a portion 30 of FIG. 19;
FIG. 31 is an enlarged view showing a portion 31 of FIG. 20; and,
FIG. 32 is an enlarged view showing a portion 32 of FIG. 20.
The features shown in broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dot-dash lines in the drawings depict the boundaries of the enlarged views that form no part of the claimed design.

公开(公告)号：USD1010154S1

公开(公告)日：2024-01-02

申请号：US29758944

申请日：2020-11-19

Applicant: HAMAMATSU PHOTONICS K.K.

Designer： Satoshi Yamamoto

Abstract: FIG. 1 is a front view of an adjustment plate for observation device for samples such as cells of the first embodiment of the present invention;
FIG. 2 is a rear view thereof;
FIG. 3 is an enlarged view showing a portion 3 of FIG. 2;
FIG. 4 is an enlarged view showing a portion 4 of FIG. 2;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a right side view thereof;
FIG. 8 is a left side view thereof;
FIG. 9 is a front, top plan and left side perspective view thereof;
FIG. 10 is a rear, top plan and right side perspective view thereof;
FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 1;
FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1;
FIG. 13 is an enlarged view showing a portion 13 of FIG. 3;
FIG. 14 is an enlarged view showing a portion 14 of FIG. 3;
FIG. 15 is an enlarged view showing a portion 15 of FIG. 3;
FIG. 16 is an enlarged view showing a portion 16 of FIG. 3;
FIG. 17 is an enlarged view showing a portion 17 of FIG. 3;
FIG. 18 is an enlarged view showing a portion 18 of FIG. 3;
FIG. 19 is an enlarged view showing a portion 19 of FIG. 4;
FIG. 20 is an enlarged view showing a portion 20 of FIG. 4;
FIG. 21 is an enlarged view showing a portion 21 of FIG. 4;
FIG. 22 is an enlarged view showing a portion 22 of FIG. 3;
FIG. 23 is an enlarged view showing a portion 23 of FIG. 3;
FIG. 24 is a front view of an adjustment plate for observation device for samples such as cells of the second embodiment of the present invention;
FIG. 25 is a rear view thereof;
FIG. 26 is an enlarged view showing a portion 26 of FIG. 25;
FIG. 27 is an enlarged view showing a portion 27 of FIG. 25;
FIG. 28 is a top plan view thereof;
FIG. 29 is a bottom plan view thereof;
FIG. 30 is a right side view thereof;
FIG. 31 is a left side view thereof;
FIG. 32 is a front, top plan and left side perspective view thereof;
FIG. 33 is a rear, top plan and right side perspective view thereof;
FIG. 34 is an enlarged cross-sectional view along the line 34-34 in FIG. 24;
FIG. 35 is an enlarged cross-sectional view along the line 35-35 in FIG. 24;
FIG. 36 is an enlarged view showing a portion 36 of FIG. 26;
FIG. 37 is an enlarged view showing a portion 37 of FIG. 26;
FIG. 38 is an enlarged view showing a portion 38 of FIG. 26;
FIG. 39 is an enlarged view showing a portion 39 of FIG. 26;
FIG. 40 is an enlarged view showing a portion 40 of FIG. 26;
FIG. 41 is an enlarged view showing a portion 41 of FIG. 26;
FIG. 42 is an enlarged view showing a portion 42 of FIG. 27;
FIG. 43 is an enlarged view showing a portion 43 of FIG. 27;
FIG. 44 is an enlarged view showing a portion 44 of FIG. 27;
FIG. 45 is an enlarged view showing a portion 45 of FIG. 26; and,
FIG. 46 is an enlarged view showing a portion 36 of FIG. 26.
The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings depict the bounds of the claimed design and form no part thereof.