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公开(公告)号：US20240369469A1
公开(公告)日：2024-11-07
申请号：US18652880
申请日：2024-05-02
Applicant: ILLUMINA, INC.
Inventor： Dakota Watson , Joseph Pinto , Peter Newman
IPC: G01N15/1434
Abstract: An apparatus includes a sample stage region, an optical assembly, and a camera assembly. The optical assembly includes an objective element, a tube lens, and a compensating element. The objective element provides a field of view. at least a portion of the sample stage region is within the field of view. The objective element has a variable astigmatism. The tube lens is configured to receive light transmitted through the objective element and further transmit the light through an image space. The compensating element is in the image space. The compensating element is configured to induce a second astigmatism. The second astigmatism is configured to offset the variable astigmatism. The camera assembly is configured to receive light transmitted from the compensating assembly.
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公开(公告)号：US11852586B2
公开(公告)日：2023-12-26
申请号：US17734953
申请日：2022-05-02
Applicant: Illumina, Inc.
Inventor： Tracy H. Fung , Poorya Sabounchi , Bernard Hirschbein , Joseph Pinto , Tarun Khurana , Randall Smith , Wenyi Feng
CPC classification number: G01N21/6428 , G01N21/6454 , G01N33/53 , G01N2021/6471 , G01N2201/08
Abstract: There is set forth herein a device comprising structure defining a detector surface configured for supporting biological or chemical substances, and a sensor array comprising light sensors and circuitry to transmit data signals using photons detected by the light sensors. The device can include one or more features for reducing fluorescence range noise in a detection band of the sensor array.
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公开(公告)号：US11768364B2
公开(公告)日：2023-09-26
申请号：US17110409
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Robert Langlois , Bo Lu , Hongji Ren , Joseph Pinto , Simon Prince , Austin Corbett
CPC classification number: G02B21/367 , G02B21/14 , G06T7/0012 , G06T2207/10056 , G06T2207/30024
Abstract: A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
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Patent Agency Ranking
公开(公告)号：US20220113532A1
公开(公告)日：2022-04-14
申请号：US17558829
申请日：2021-12-22
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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公开(公告)号：US09540690B2
公开(公告)日：2017-01-10
申请号：US14906536
申请日：2014-08-28
Applicant: Illumina, Inc.
Inventor： John Earney , Dakota Watson , Joseph Pinto
CPC classification number: B01L3/502715 , B01L3/502723 , B01L2300/0816 , B01L2300/0819 , B01L2300/0883 , B01L2300/14 , C12Q1/6874 , G01N21/05 , G01N21/6428 , G01N21/645 , G01N2021/058 , G01N2021/6439 , G01N2021/6482 , H04N17/002
Abstract: Provided is an inspection apparatus including: (a) a translucent or transparent plate having a bottom surface, at least a portion of the bottom surface having an opaque material printed thereon in a pattern having at least one transparent or translucent portion; and (b) a chamber disposed below the bottom surface, whereby light emitted from the chamber or through the chamber can pass through the at least one transparent or translucent portion.
Abstract translation: 提供了一种检查装置，包括：（a）具有底表面的半透明或透明板，底表面的至少一部分具有印刷在其上的不透明材料，图案具有至少一个透明或半透明部分; 和（b）设置在所述底表面下方的室，由此从所述室或通过所述室发射的光可穿过所述至少一个透明或半透明部分。
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公开(公告)号：US11885953B2
公开(公告)日：2024-01-30
申请号：US17558829
申请日：2021-12-22
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
CPC classification number: G02B21/365 , G02B26/06 , G06T7/0014 , G06T7/80 , H04N23/56 , G02B21/082 , G06T2207/10056 , G06T2207/30168
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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公开(公告)号：US20210173196A1
公开(公告)日：2021-06-10
申请号：US17110409
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Robert Langlois , Bo Lu , Hongji Ren , Joseph Pinto , Simon Prince , Austin Corbett
Abstract: A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
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公开(公告)号：US20210173194A1
公开(公告)日：2021-06-10
申请号：US17110406
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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