Abstract:
A system for testing a clock monitor includes a fault injection circuit, a control circuit, and a clock monitor circuit to evaluate a clock source signal from a clock source. The fault injection circuit is to modify or replace the clock source signal from the clock source to yield a modified clock signal, and send the modified clock signal to the clock monitor circuit. The clock monitor circuit is to receive an input clock signal, determine whether the input clock signal indicates a faulty clock source, and issue a clock corrective action if the input clock signal indicates a faulty clock source. The control circuit is to monitor for the clock corrective action, and determine, based on whether the clock corrective action is issued, whether the clock monitor circuit is operating correctly.
Abstract:
A method for expanding a data memory for a microprocessor architecture which uses a bank select accessing scheme for accessing data memory which is divided into a plurality of memory banks. A bank select register is configured to select a memory bank and the microprocessor architecture has an instruction set with a dedicated instruction for selecting a memory bank. An opcode of the dedicated bank select instruction provides for a maximum of n bits payload thereby providing for an address value which is configured to select a maximum of 2n memory banks. The method has the steps of: using an opcode of a test instruction that provides for m bits of payload for a new bank select instruction, wherein m>n; and using an opcode of the dedicated bank select instruction for a new test instruction.
Abstract:
A serial peripheral interface (SPI) module includes a transceiver including a clock line, a data line and at least one slave select line. The module also includes an interface circuit configured to monitor the slave select line and assert a fault based upon an incorrect de-assertion of the slave select line.
Abstract:
A digital period divider has a first counter with R least significant bits (LSB) and P most significant bits (MSB) having a count input and a reset input, wherein the count input receives a first clock signal and the reset input receives a second clock signal; a latch having P bits and being coupled with the P bits of the first counter; a second counter having P bits and a count input and a reset input, wherein the count input receives the first clock signal; and a first comparator operable to compare the P bits of the latch with the P bits of the second counter and generating an output signal, wherein the output signal is also fed to the reset input of the second counter.
Abstract:
A microcontroller has a CPU with at least one interrupt input coupled with an interrupt controller, a plurality of peripherals, and a mode register comprising at least one bit controlling an operating mode of the microcontroller. The microcontroller is configured to operate in a first operating mode wherein upon assertion of an interrupt by a peripheral of the microcontroller, the interrupt controller forwards an interrupt signal to the CPU and the peripheral sets an associated interrupt flag, wherein the interrupt causes the CPU to branch to a predefined interrupt address associated with the interrupt input. In a second operating mode, upon assertion of an interrupt by a peripheral of the microcontroller, the interrupt controller forwards an interrupt signal to the CPU and the CPU receives additional interrupt information from the peripheral that generated the interrupt, wherein the additional interrupt information is used to generate a vector address.
Abstract:
A method for expanding a data memory for a microprocessor architecture which uses a bank select accessing scheme for accessing data memory which is divided into a plurality of memory banks. A bank select register is configured to select a memory bank and the microprocessor architecture has an instruction set with a dedicated instruction for selecting a memory bank. An opcode of the dedicated bank select instruction provides for a maximum of n bits payload thereby providing for an address value which is configured to select a maximum of 2n memory banks. The method has the steps of: using an opcode of a test instruction that provides for m bits of payload for a new bank select instruction, wherein m>n; and using an opcode of the dedicated bank select instruction for a new test instruction.
Abstract:
A processor device with debug capabilities has a central processing unit, debug circuitry including a trace module and an external interface, wherein the trace module generates a trace stream including information about executed instructions, wherein the trace stream is output through the external interface, and wherein the trace module is further operable to detect a trigger signal and upon detection to insert a trace packet into the generated trace stream.
Abstract:
A system may have a digital period divider generating an output signal that is proportional to an angle defined by a rotational input signal and an interval measurement unit determining an interval time of an interval defined by succeeding pulses of the input output signal. In an enhancement, the system may also have a missing pulse detector which is operable to compare a current interval with a parameter to determine whether a pulse is missing in the input signal.
Abstract:
A processor device with debug capabilities has a central processing unit, an interrupt controller, a status unit operable to be set into a first mode indicating an interrupt has occurred or in a second mode indicating normal execution of code, and a debug unit coupled with said status unit and comprising a configurable breakpoint, wherein a condition can be set that a breakpoint is only activated if the device is operating in an interrupt service routine.
Abstract:
A system may have a digital period divider generating an output signal that is proportional to an angle defined by a rotational input signal and an interval measurement unit determining an interval time of an interval defined by succeeding pulses of the input output signal. In an enhancement, the system may also have a missing pulse detector which is operable to compare a current interval with a parameter to determine whether a pulse is missing in the input signal.