摘要:
In a flash memory, after an initial write operation ends, each bit line associated with a memory cell subjected to a write is precharged and each bit line associated with a memory cell that is not subjected to the write is discharged and verified to detect a memory cell low in threshold voltage and a memory cell thus detected is subjected to an additional write. The verification can be verified without being affected by a current flowing through the memory cell that is not subjected to the write. All memory cells can have their respective threshold voltages set accurately.
摘要:
Using charges accumulated in a capacitance element connected to a drain side node of a memory cell, data is written in accordance with source side injection method. The capacitance value of the capacitance element is changed in accordance with the value of write data. A non-volatile semiconductor memory device allowing writing of multi-valued data at high speed with high precision is achieved.
摘要:
A monitor circuit for monitoring external potential EXTVDD and variable delay circuit determine the time interval in which signal ZODACT is being at the L level according to the potential level of external potential EXTVDD, and thus the supplying time of external potential EXTVDD can be dynamically changed. When external potential EXTVDD is at the upper limit of specification of product, the supplying time is short, thereby preventing overcharge of memory cells or bit lines. When external potential EXTVDD is at the lower limit of specification of product, the supplying time becomes longer, thereby ensuring a sufficient over-driving time interval. It is possible to ensure the reliability of the memory cells and perform the reading operation throughout the entire range of the specification of product of external potential EXTVDD. Therefore, it is possible to provide a semiconductor memory device capable of performing a reading operation at high speeds while ensuring the reliability.
摘要:
A sense amplifier driving line is connected to the source of an N-channel MOS transistor. Accordingly, even if a control signal attains H level, a sub-amplifier will not operate. This is because the sense amplifier driving line and an LIO line pair both attain a precharge potential, and a gate-source voltage of an N-channel MOS transistor attains 0V. Thus, it is not necessary to add a circuit configuration for supplying a signal notifying of activation of a row block, and a semiconductor memory device with a smaller area is obtained.
摘要:
In order to stably generate a high voltage of a prescribed level, a Vpp detection circuit which is activated in response to an activation signal for comparing the high voltage with a reference voltage is forcibly brought into an active state for a prescribed period under control of an initial control circuit.
摘要:
Data of 2-bits prefetched from a memory array and transmitted to an amplifying circuit via a data bus is ordered in accordance with the least significant bit of a column address which is a start address supplied from the outside. The first data is output to read data buses and is directly transmitted to an output data latch. The second data is held once by a second data latch and, after that, transmitted to the output data latch. Since the first data is transmitted from the amplifying circuit directly to the output data latch, the time from a read command is received until data is started to be output can be shortened.
摘要:
A preamplifier includes an amplifier circuit amplifying a signal level of read data, a latency shifter outputting the read data onto a data line pair in response to an internal signal determining a timing of outputting the read data onto the data bus pair, and a driver outputting the read data onto the data bus pair. The amplifier circuit receives the internal signal and outputs the read data onto the data line pair while bypassing the latency shifter when the internal signal is already at high level at the timing when the signal level of the read data is amplified. As a result, a semiconductor memory device can speed up propagation of the read data from the preamplifier onto the data bus pair in a high frequency operation.
摘要:
A DLL circuit generates first and second internal clocks delayed by appropriate quantities from an external clock, and generates third and fourth internal clocks capable of driving a data output circuit after a CAS latency from the first and second internal clocks on the basis of an internal signal. A repeater recovers signal levels of the third and fourth internal clocks and outputs the third and fourth internal clocks as DLL clocks. The data output circuit takes in read data using the DLL clocks outputted from the repeater, and outputs the read data to an outside in a half cycle synchronously with the DLL clocks. In this way, a circuit area of a semiconductor memory device can be reduced by generating the DLL clocks in a prior stage to the data output circuit.
摘要:
A semiconductor memory device includes two power feed lines. An overdriving scheme is applied to one of the power feed lines in the sensing amplifying operation, and no overdriving scheme is applied to the other power feed line in the sensing operation. According to the overdriving scheme, the power feed line is overdriven to a potential level higher than a potential corresponding high level data stored in a memory cell. Thus, the overdriving of the power feed line is applied as an auxiliary function to prevent application of an excess potential to a memory cell capacitor. Such a semiconductor memory device can be achieved that improves both the speed of sensing amplifying operation and the reliability of memory cell capacitors, while conforming to low voltage operation requirement.
摘要:
An internal power supply circuit produces an internal power supply voltage from an external power supply voltage. A voltage level control circuit controls a voltage level and a temperature characteristic of the internal power supply voltage generated by the internal power supply circuit. The internal power supply circuit produces the internal power supply voltage having a negative or zero temperature characteristic in a low temperature region and a positive temperature characteristic in a high temperature region. The voltage level control circuit includes a structure optimizing a capacitance value of a sense power supply line stabilizing capacitance for driving a sense amplifier circuit, a level converting circuit determining the lowest operable region of the external power supply voltage of the internal power supply circuit, or a structure forcedly operating the internal voltage down converter upon power-on. The internal power supply voltage at a desired level is stably produced with a small occupied area and a low current consumption.