Abstract:
An imaging device includes a plurality of pixels, a reference current generation circuit, a differential current generation circuit, a reference voltage generation circuit, a conversion circuit, and an output circuit. The differential current generation circuit generates a differential current according to a difference between a pixel current and a reference current. The conversion circuit converts the differential current into an output voltage on the basis of a first reference voltage. A second reference voltage is higher than the tint reference voltage when the output voltage at the time of resetting of the pixels is higher than the output voltage at the time of exposure of the pixels. The second reference voltage is lower than the first reference voltage when the output voltage at the time of resetting of the pixels is lower than the output voltage at the time of exposure of the pixels.
Abstract:
An endoscope system includes an imaging element, a voltage-current conversion circuit, a first coaxial cable, and an impedance conversion circuit. The imaging element generates a first voltage. The voltage-current conversion circuit is disposed inside or outside the imaging element and converts the first voltage into a first current. The first coaxial cable has a first conductor and a second conductor. The second conductor is disposed outside the first conductor. The first current is transmitted through the first conductor. The first current transmitted through the first conductor is input to the impedance conversion circuit. The impedance conversion circuit outputs a second current according to the first current. A second voltage according to the first current is input to the second conductor.
Abstract:
An imaging device includes an imaging unit, a reference signal generation unit, m (m is an integer of 3 or more) number of column delay units, and a plurality of column AD conversion units. The plurality of column delay units is arranged so as to correspond to two or more and less than m of the column AD conversion units. Each of the plurality of column delay units includes a first delay circuit. The first delay circuit generates a plurality of first delay clocks. The column AD conversion unit includes a comparison unit, a latch unit, and a counter unit. The comparison unit compares a pixel signal with a reference signal, and outputs a control signal corresponding to a comparison result. The latch unit includes a plurality of latch circuits that latches the plurality of first delay clocks on the basis of a state change of the control signal.
Abstract:
An encoding circuit includes a clock generating unit having a delay circuit in which n (n is a power of 2) delay units are connected together a latch unit configured to latch the plurality of delayed signals; and an encoding unit configured to encode state of each of the plurality of delayed signals, wherein the encoding unit encodes the state of each of the plurality of delayed signals by performing: a first operation of determining a position at which logic states of two or more delayed signals in a signal group change from High to Low, a second operation of determining a position at which logic states of two or more delayed signals in the signal group change from Low to High, and a third operation of determining that logic states of two or more signals including at least one delayed signal in the signal group are predetermined states.
Abstract:
A reference signal generating circuit, an AD conversion circuit, and an imaging device are provided. A clock generating unit includes a delay section including delay units, each of which delays an input signal and outputs a delayed signal, and outputs a low-order phase signal based on a signal output from the delay section. A high-order current source cell unit includes high-order current source cells, each of which generates the same constant current. A low-order current source cell unit includes low-order current source cells weighted to generate constant currents having current values that differ by a predetermined proportion of a current value of the constant current generated by the high-order current source cell. Selection of the high-order current source cell is performed based on a clock obtained by dividing a clock based on the low-order phase signal.
Abstract:
An imaging device includes: an imaging section in which a plurality of unit pixels having a photoelectric conversion element are arranged in the form of a matrix; a reference signal generating section configured to generate a reference signal that increases or decreases with a passage of time; a comparison section that includes a differential amplifier including a first input terminal electrically connected to the reference signal generating section and a second input terminal electrically connected to the unit pixels and configured to compare voltages of the first input terminal and the second input terminal and is arranged for each column or for a plurality of columns of a pixel array of the imaging section; and a measurement section configured to measure a comparison time from when the comparison section starts comparison until the comparison ends and generate data corresponding to the comparison time.
Abstract:
An AD conversion circuit may include: a reference signal generation unit generating a reference signal increasing or decreasing with passage of time; a comparison unit including a first comparison circuit and a second comparison circuit comparing an analog signal to be subjected to an AD conversion with the reference signal; a clock generation unit including a delay circuit in which a plurality of delay units are connected to one another, and outputting a first lower phase signal and a second lower phase signal based on clock signals output from each of the plurality of delay units; a latch unit including a first latch circuit latching a logical state of the first lower phase signal and a second latch circuit latching a logical state of the second lower phase signal; and a counting unit performing counting based on the second lower phase signal output from the clock generation unit.
Abstract:
An image pickup device may include: an image capturing unit; a reference signal generation unit; a row selection unit that selects and controls each unit pixel for every row of the array of the unit pixels; a comparison unit including a differential amplifier unit and a reset unit; a measurement unit that measures a comparison time from a comparison start to a comparison end; and a change unit that includes a switch element and a second capacitive element in which one end of the second capacitive element is connected to the first input terminal and the other end of the second capacitive element is connected to a first voltage source via the switch element at a time of a reset operation by the reset unit and connected to a second voltage source different from the first voltage source via the switch element after the reset operation.
Abstract:
An image pickup device may include: an image capturing unit; a reference signal generation unit; a comparison unit that compares analog signals to the reference signal and ends the comparison process at a timing at which the reference signal satisfies a predetermined condition with respect to the analog signals; a clock generation unit; a latch unit that retains the low-order phase signal as a latch signal at a timing related to the end of the comparison process; a count unit that counts a signal related to one of the low-order phase signals and generates a high-order digital signal; a detection unit that generates a low-order digital signal by sequentially comparing logic states of a plurality of bits of the latch signal retained by the corresponding latch unit and encoding the latch signal; and an arithmetic unit that performs an arithmetic process.
Abstract:
A time detection circuit may include: a delay unit configured to have a plurality of delay units, each of which delays and outputs an input signal, and start an operation at a first timing relating to an input of a first pulse; a latch unit configured to latch logic states of the plurality of delay units; a count unit configured to perform a count operation based on a clock output from one of the plurality of delay units; a count latch unit configured to latch a state of the count unit; and a latch control unit configured to enable the latch unit at a second timing relating to an input of a second pulse and cause the latch unit and the count latch unit to execute a latch at a third timing at which a predetermined time has elapsed from the second timing.