IMAGE SENSOR POWER SUPPLY NOISE DETECTION

    公开(公告)号:US20170168104A1

    公开(公告)日:2017-06-15

    申请号:US14964159

    申请日:2015-12-09

    CPC classification number: G01R29/26 G01R31/40

    Abstract: A power supply noise measurement circuit includes a multiphase filter coupled to receive a power supply signal. The multiphase filter is coupled to output a first filtered power supply signal for a first phase, and a second filtered power supply signal for a second phase. A multiphase amplifier is coupled to the multiphase filter to sample offset voltages in response to the first filter power supply signal during the first phase to set up DC operation points in the multiphase amplifier, and generate an amplified power supply noise signal during the second phase. An overshoot detector is coupled to the multiphase amplifier to detect overshoot events in the amplified power supply noise signal, and an undershoot detector is coupled to the multiphase amplifier to detect undershoot events in the amplified power supply noise signal.

    GLOBAL SHUTTER CONTROL SIGNAL GENERATOR WITH REDUCED DRIVING REQUIREMENTS

    公开(公告)号:US20170142355A1

    公开(公告)日:2017-05-18

    申请号:US14939862

    申请日:2015-11-12

    CPC classification number: H04N5/3532 H04N5/353 H04N5/37452 H04N5/378

    Abstract: A pixel cell includes a photodiode disposed in a semiconductor material to accumulate image charge in response to light. A global shutter transistor is disposed in the semiconductor material and is selectively resets the image charge in the photodiode in response to a global shutter control signal. A global shutter control signal generator circuit is coupled to generate the global shutter control signal to have a first value, a second value, and a third value. The first value of the global shutter control signal is coupled to turn on the global shutter transistor to reset the photodiode. The third value of the global shutter control signal is coupled to control the global shutter transistor to be in a low leakage off mode. The second value of the global shutter control signal is between the first and third values and is turns off the global shutter transistor.

    Image sensor power supply rejection ratio improvement through ramp generator in continuous time readout circuitry
    16.
    发明授权
    Image sensor power supply rejection ratio improvement through ramp generator in continuous time readout circuitry 有权
    通过连续时间读出电路中的斜坡发生器改善图像传感器电源抑制比

    公开(公告)号:US09571775B1

    公开(公告)日:2017-02-14

    申请号:US14942622

    申请日:2015-11-16

    CPC classification number: H04N5/378 H04N5/3698

    Abstract: A ramp generator for use in readout circuitry includes an integrator coupled to receive a ramp generator input reference signal to generate a reference ramp signal coupled to be received by an analog to digital converter. A power supply compensation circuit that is coupled to generate the ramp generator input reference signal includes a delay circuit including a variable resistor and a filter capacitor coupled to receive a power supply signal. The variable resistor is tuned to match a delay ripple from the power supply to a bitline output. A capacitive voltage divider is coupled to the delay circuit to generate the ramp generator input reference signal. The capacitive voltage divider includes a first variable capacitor coupled to a second variable capacitor that are tuned to provide a capacitance ratio that matches a coupling ratio from the power supply to the bitline output.

    Abstract translation: 用于读出电路的斜坡发生器包括一个积分器,该积分器被耦合以接收斜坡发生器输入参考信号,以产生耦合以由模数转换器接收的参考斜坡信号。 耦合以产生斜坡发生器输入参考信号的电源补偿电路包括延迟电路,该延迟电路包括耦合以接收电源信号的可变电阻器和滤波电容器。 调整可变电阻以匹配从电源到位线输出的延迟纹波。 电容分压器耦合到延迟电路以产生斜坡发生器输入参考信号。 电容分压器包括耦合到第二可变电容器的第一可变电容器,其被调谐以提供与从电源到位线输出的耦合比匹配的电容比。

    Feed-forward technique for power supply rejection ratio improvement of bit line
    17.
    发明授权
    Feed-forward technique for power supply rejection ratio improvement of bit line 有权
    前馈技术的电源抑制比提高了位线

    公开(公告)号:US09148596B1

    公开(公告)日:2015-09-29

    申请号:US14247855

    申请日:2014-04-08

    CPC classification number: H04N5/3698 H04N5/357 H04N5/378

    Abstract: An image sensor read out circuit includes a first current mirror circuit in which a second current conducted through a second current path is controlled in response to a first current conducted through the first current path. The second current is conducted through an amplifier transistor of a pixel circuit. A first current source is coupled to the first current path to provide a substantially constant current component of the first current. A second current source is coupled to a power supply rail of the pixel circuit and coupled to the first current path to provide a ripple current component of the first current. The ripple current component provided by the second current source is responsive to a ripple in the power supply rail. The first current is responsive to a sum of the currents from the first and second current sources.

    Abstract translation: 图像传感器读出电路包括第一电流镜电路,其中响应于通过第一电流路径传导的第一电流来控制通过第二电流路径传导的第二电流。 第二电流通过像素电路的放大器晶体管导通。 第一电流源耦合到第一电流路径以提供第一电流的基本上恒定的电流分量。 第二电流源耦合到像素电路的电源轨,并耦合到第一电流路径以提供第一电流的纹波电流分量。 由第二电流源提供的纹波电流分量响应于电源轨道中的纹波。 第一电流响应于来自第一和第二电流源的电流的总和。

    Image sensor power supply noise detection

    公开(公告)号:US09817048B2

    公开(公告)日:2017-11-14

    申请号:US14964159

    申请日:2015-12-09

    CPC classification number: G01R29/26 G01R31/40

    Abstract: A power supply noise measurement circuit includes a multiphase filter coupled to receive a power supply signal. The multiphase filter is coupled to output a first filtered power supply signal for a first phase, and a second filtered power supply signal for a second phase. A multiphase amplifier is coupled to the multiphase filter to sample offset voltages in response to the first filter power supply signal during the first phase to set up DC operation points in the multiphase amplifier, and generate an amplified power supply noise signal during the second phase. An overshoot detector is coupled to the multiphase amplifier to detect overshoot events in the amplified power supply noise signal, and an undershoot detector is coupled to the multiphase amplifier to detect undershoot events in the amplified power supply noise signal.

    Ramp generator for low noise image sensor
    19.
    发明授权
    Ramp generator for low noise image sensor 有权
    用于低噪声图像传感器的斜坡发生器

    公开(公告)号:US09554074B2

    公开(公告)日:2017-01-24

    申请号:US14688260

    申请日:2015-04-16

    CPC classification number: H04N5/378 H04N5/357 H04N5/3745

    Abstract: A readout circuit for use in an image sensor includes a sense amplifier circuit coupled to a bitline to sense analog image data from a pixel cell of the image sensor. An analog to digital converter is coupled to the sense amplifier circuit to convert the analog image data to digital image data. A ramp generator circuit is coupled to generate a first ramp signal. The analog to digital converter is coupled to generate the digital image data in response to the analog image data and the first ramp signal. A first capacitive voltage divider is coupled to the ramp generator. The first capacitive voltage divider is coupled to reduce an output voltage swing of the first ramp signal coupled to be received by the analog to digital converter to reduce noise in the first ramp signal.

    Abstract translation: 用于图像传感器的读出电路包括耦合到位线的读出放大器电路,以检测来自图像传感器的像素单元的模拟图像数据。 模数转换器耦合到读出放大器电路,以将模拟图像数据转换为数字图像数据。 斜坡发生器电路被耦合以产生第一斜坡信号。 模拟数字转换器被耦合以响应于模拟图像数据和第一斜坡信号而生成数字图像数据。 第一电容分压器耦合到斜坡发生器。 第一电容性分压器被耦合以减少耦合以由模数转换器接收的第一斜坡信号的输出电压摆幅,以减少第一斜坡信号中的噪声。

    IMAGE SENSOR PIXEL NOISE MEASUREMENT

    公开(公告)号:US20170359532A1

    公开(公告)日:2017-12-14

    申请号:US15179648

    申请日:2016-06-10

    CPC classification number: H04N5/357 H04N5/378

    Abstract: An image sensor pixel noise measurement circuit includes a pixel array on an integrated circuit chip. The pixel array includes a plurality of pixels including a first pixel to output a first image data signal, and a second pixel to output a second image data signal. A noise amplification circuit on the integrated circuit chip is coupled to receive the first and second image data signals from the pixel array. The noise amplification circuit is coupled to output an amplified differential noise signal in response to the first and second image data signals received from the pixel array. A fast Fourier transform (FFT) analysis circuit on the integrated circuit chip is coupled to transform the amplified differential noise signal output by the noise amplification circuit from a time domain to a frequency domain to analyze a pixel noise characteristic of the pixel array.

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