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    SPECTRAL IMAGING APPARATUS
    11.
    发明申请
    SPECTRAL IMAGING APPARATUS 有权

    公开(公告)号：US20210048342A1

    公开(公告)日：2021-02-18

    申请号：US16713131

    申请日：2019-12-13

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Hyochul KIM ,  Younggeun ROH ,  Yeonsang PARK ,  Suyeon LEE

    IPC: G01J3/28 ,  G02B5/20

    Abstract: Provided is a spectral imaging apparatus. The spectral imaging apparatus includes: an optical filter including a plurality of band filter units having different center wavelengths; a sensing device configured to receive light passing through the optical filter; an imaging lens array including a plurality of lens units which respectively correspond to the plurality of band filter units and each implement imaging on the sensing device; and a transparent substrate which is apart from the sensing device. At least one of the optical filter and the imaging lens array is provided on the transparent substrate.

    SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC DEVICE INCLUDING THE SAME
    15.
    发明申请
    SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC DEVICE INCLUDING THE SAME 有权
    半导体器件及其制造方法以及包括其的电子器件

    公开(公告)号：US20150364472A1

    公开(公告)日：2015-12-17

    申请号：US14712041

    申请日：2015-05-14

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Unjeong KIM ,  Youngseon SHIM ,  Yeonsang PARK ,  Changwon LEE ,  Sungwoo HWANG

    IPC: H01L27/092 ,  H01L29/51 ,  H01L29/423 ,  H01L29/16

    CPC classification number: H01L29/42356 ,  H01L27/1207 ,  H01L27/1237 ,  H01L29/1606 ,  H01L29/4908 ,  H01L29/51 ,  H01L29/78684

    Abstract: A semiconductor device, a method for manufacturing the same, and an electronic device including the same are provided. The semiconductor device includes a first transistor and a second transistor. The first transistor includes a first channel layer and a first ion gel. The second transistor includes a second channel layer and a second ion gel. The first channel layer and the second channel layer may include, for example, graphene. The first ion gel and the second ion gel include different ionic liquids. The first ion gel and the second ion gel include different cations and/or different anions. One of the first transistor and the second transistor is a p-type transistor, and the other one is an n-type transistor. The combination of the first transistor and the second transistor constitutes an inverter.

    Abstract translation: 提供半导体器件，其制造方法和包括该半导体器件的电子器件。 半导体器件包括第一晶体管和第二晶体管。 第一晶体管包括第一沟道层和第一离子凝胶。 第二晶体管包括第二沟道层和第二离子凝胶。 第一沟道层和第二沟道层可以包括例如石墨烯。 第一离子凝胶和第二离子凝胶包括不同的离子液体。 第一离子凝胶和第二离子凝胶包括不同的阳离子和/或不同的阴离子。 第一晶体管和第二晶体管中的一个是p型晶体管，另一个是n型晶体管。 第一晶体管和第二晶体管的组合构成逆变器。

    SPECTRAL IMAGING APPARATUS
    18.
    发明申请
    SPECTRAL IMAGING APPARATUS 有权

    公开(公告)号：US20220065696A1

    公开(公告)日：2022-03-03

    申请号：US17501496

    申请日：2021-10-14

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Hyochul KIM ,  Younggeun ROH ,  Yeonsang PARK ,  Suyeon LEE

    IPC: G01J3/28 ,  G02B5/20

    Abstract: Provided is a spectral imaging apparatus. The spectral imaging apparatus includes: an optical filter including a plurality of band filter units having different center wavelengths; a sensing device configured to receive light passing through the optical filter; an imaging lens array including a plurality of lens units which respectively correspond to the plurality of band filter units and each implement imaging on the sensing device; and a transparent substrate which is apart from the sensing device. At least one of the optical filter and the imaging lens array is provided on the transparent substrate.

    LIGHT FILTER AND SPECTROMETER INCLUDING THE SAME
    19.
    发明申请
    LIGHT FILTER AND SPECTROMETER INCLUDING THE SAME 有权

    公开(公告)号：US20210148757A1

    公开(公告)日：2021-05-20

    申请号：US17159900

    申请日：2021-01-27

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jineun KIM ,  Younggeun ROH ,  Yeonsang PARK ,  Hyochul KIM ,  Moonil JUNG

    IPC: G01J3/18 ,  G01J3/45 ,  G02B5/28 ,  G01J3/26 ,  G02B5/20 ,  G01J3/28 ,  G01J3/02

    Abstract: A light filter and a spectrometer including the light filter are disclosed. The light filter includes a plurality of filter units having different resonance wavelengths, wherein each of the plurality of filter units includes a cavity layer configured to output light of constructive interference, a Bragg reflection layer provided on a first surface of the cavity layer, and a pattern reflection layer provided on a second surface of the cavity layer opposite to the first surface and configured to cause guided mode resonance of light incident on the pattern reflection layer, the pattern reflection layer including a plurality of reflection structures that are periodically arranged.

    LIGHT FILTER AND SPECTROMETER INCLUDING THE SAME
    20.
    发明申请
    LIGHT FILTER AND SPECTROMETER INCLUDING THE SAME 审中-公开

    公开(公告)号：US20190277693A1

    公开(公告)日：2019-09-12

    申请号：US16288752

    申请日：2019-02-28

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jineun KIM ,  Younggeun ROH ,  Yeonsang PARK ,  Hyochul KIM ,  Moonil Jung

    IPC: G01J3/18 ,  G02B5/28 ,  G01J3/45

    Abstract: A light filter and a spectrometer including the light filter are disclosed. The light filter includes a plurality of filter units having different resonance wavelengths, wherein each of the plurality of filter units includes a cavity layer configured to output light of constructive interference, a Bragg reflection layer provided on a first surface of the cavity layer, and a pattern reflection layer provided on a second surface of the cavity layer opposite to the first surface and configured to cause guided mode resonance of light incident on the pattern reflection layer, the pattern reflection layer including a plurality of reflection structures that are periodically arranged.

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