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公开(公告)号:US10014056B1
公开(公告)日:2018-07-03
申请号:US15598936
申请日:2017-05-18
Applicant: SanDisk Technologies LLC
Inventor: Aaron Lee , Yi-Chieh Chen , Anne Koh , Gulzar Kathawala , Mrinal Kochar
CPC classification number: G11C7/22 , G11C7/222 , G11C13/004 , G11C13/0069 , G11C16/0483 , G11C16/10 , G11C16/26 , G11C29/023 , G11C29/028 , G11C29/18 , G11C29/36 , G11C2029/0409 , G11C2029/1804
Abstract: Apparatuses, systems, methods, and computer program products are disclosed for changing storage parameters. An integrated circuit (IC) memory element receives a command to change a value of a parameter associated with the IC memory element. A parameter includes a setting for one or more storage operations of an IC memory element. An IC memory element receives one or more data sets with a command. A data set includes an identifier associated with a parameter to be changed and a new value for the parameter. Each of one or more data sets is received at a same data rate as a command. An IC memory element writes, for each of one or more data sets, a new value for a parameter to a storage location associated with the parameter.
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公开(公告)号:US09858009B2
公开(公告)日:2018-01-02
申请号:US14923137
申请日:2015-10-26
Applicant: SanDisk Technologies LLC
Inventor: Abhijeet Bhalerao , Mrinal Kochar , Dennis S. Ea , Mikhail Palityka , Aaron Lee , Yew Yin Ng , Ivan Baran
IPC: G06F3/06
CPC classification number: G06F3/064 , G06F3/0604 , G06F3/065 , G06F3/0679 , G06F12/0246 , G06F2212/7208
Abstract: Data that is initially stored in Single Level Cell (SLC) blocks is subsequently copied (folded) to a Multi Level Cell (MLC) block where the data is stored in MLC format, the data copied in a minimum unit of a fold-set, the MLC block including a plurality of separately-selectable sets of NAND strings, data of an individual fold-set copied exclusively to two or more word lines of an individual separately-selectable set of NAND strings in the MLC block.
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公开(公告)号:US09792175B2
公开(公告)日:2017-10-17
申请号:US14919363
申请日:2015-10-21
Applicant: SanDisk Technologies LLC
Inventor: Sahil Sharma , Abhijeet Manohar , Mrinal Kochar , Yong Huang , Derek McAuley , Mikhail Palityka , Ivan Baran , Aaron Lee
CPC classification number: G06F11/1068 , G11C16/3418 , G11C29/02 , G11C29/028 , G11C29/42 , G11C29/44 , G11C29/52
Abstract: When the number of bad columns in a memory or plane is less than a threshold number then a first Error Correction Code (ECC) scheme encodes user data in first pages of a first size. If the number of bad columns is greater than the threshold number then a second ECC scheme encodes the user data in second pages of a second size that is smaller than the first size.
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