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公开(公告)号:US10801128B2
公开(公告)日:2020-10-13
申请号:US16196246
申请日:2018-11-20
Applicant: SHOWA DENKO K.K.
Inventor: Yasunori Motoyama , Yoshishige Okuno , Yoshikazu Umeta , Keisuke Fukada
Abstract: A SiC epitaxial growth apparatus includes: a susceptor having a mounting surface on which a wafer is placable; a heater which is provided apart from the susceptor on a side opposite to the mounting surface of the susceptor; and an annular radiation member which is in contact with a back surface of the susceptor opposite to the mounting surface and is located at a position which is overlapped with an outer peripheral portion of the wafer placed on the susceptor in a plan view, in which the radiation member has a higher emissivity than that of the susceptor and has an exposed portion as viewed from the heater.
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公开(公告)号:US10262863B2
公开(公告)日:2019-04-16
申请号:US15534317
申请日:2015-12-08
Inventor: Keisuke Fukada , Masahiko Ito , Isaho Kamata , Hidekazu Tsuchida , Hideyuki Uehigashi , Hiroaki Fujibayashi , Masami Naito , Kazukuni Hara , Takahiro Kozawa , Hirofumi Aoki
IPC: H01L21/205 , C23C16/32 , C30B25/14 , C23C16/42 , C23C16/455 , C30B29/36 , C30B25/18 , C30B25/20 , H01L21/02
Abstract: A method for manufacturing a SiC epitaxial wafer according to one aspect of the present invention includes separately introducing, into a reaction space for SiC epitaxial growth, a basic N-based gas composed of molecules containing an N atom within the molecular structure but having neither a double bond nor a triple bond between nitrogen atoms, and a Cl-based gas composed of molecules containing a Cl atom within the molecular structure, and mixing the N-based gas and the Cl-based gas at a temperature equal to or higher than the boiling point or sublimation temperature of a solid product generated by mixing the N-based gas and the Cl-based gas.
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