公开(公告)号：US20170336334A1

公开(公告)日：2017-11-23

申请号：US15663831

申请日：2017-07-31

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Janos Kirz ,  Sylvia Jia Yun Lewis

IPC: G01N23/207 ,  G01N23/087

CPC classification number: G01N23/2076 ,  G01N23/087 ,  G01N23/223 ,  G01N2223/04 ,  G01N2223/045 ,  G01N2223/0568 ,  G21K1/06 ,  G21K1/067 ,  G21K2201/064 ,  H01J35/08 ,  H01J35/14 ,  H01J35/18 ,  H01J2235/081 ,  H01J2235/086

Abstract: An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.

公开(公告)号：US09719947B2

公开(公告)日：2017-08-01

申请号：US14700137

申请日：2015-04-29

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G01N23/02 ,  A61B6/00 ,  G21K1/02 ,  G01N23/20 ,  H01J35/08

CPC classification number: G01N23/20075 ,  A61B6/4007 ,  A61B6/4291 ,  A61B6/484 ,  A61B6/508 ,  G21K1/02 ,  G21K2207/005 ,  H01J35/08 ,  H01J2235/086 ,  H01J2235/087

Abstract: An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.

公开(公告)号：US20250146960A1

公开(公告)日：2025-05-08

申请号：US18937615

申请日：2024-11-05

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Janos Kirz ,  Sylvia Jia Yun Lewis

IPC: G01N23/085

Abstract: An apparatus includes an x-ray source configured to generate x-rays, at least some of which impinge a sample and at least one diffractor configured to concurrently diffract at least some of the x-rays from the sample in a first direction and in a second direction substantially orthogonal to the first direction. The apparatus further includes at least one two-dimensional (2D) position-sensitive x-ray detector configured to receive at least some of the diffracted x-rays and to concurrently generate first spectral information of the x-rays diffracted in the first direction and second spectral information of the x-rays diffracted in the second direction. The apparatus further includes circuitry configured to receive the first and second spectral information and to generate a single x-ray absorption spectroscopy (XAS) spectrum using the first and second spectral information.

公开(公告)号：US20230218247A1

公开(公告)日：2023-07-13

申请号：US18152973

申请日：2023-01-11

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Janos Kirz

IPC: A61B6/00

CPC classification number: A61B6/40 ,  A61B6/42

Abstract: An x-ray source includes at least one housing configured to contain a first region at a pressure less than one atmosphere and configured to separate the first region from an ambient environment outside the at least one housing. The at least one housing includes an x-ray transmissive window having an x-ray transmittance greater than or equal to 20% for at least some x-rays having an x-ray energy less than 1 keV. The x-ray source further includes an electron source within the at least one housing. The electron source is configured to generate at least one electron beam. The x-ray source further includes an anode assembly within the at least one housing and configured to generate x-rays in response to electron bombardment by at least some of the electrons of the at least one electron beam from the electron source. The x-ray source further includes at least one x-ray optic within the at least one housing. The at least one x-ray optic is configured to receive at least some of the x-rays from the anode assembly and to direct at least some of the received x-rays to the window to form an x-ray beam.

公开(公告)号：US20220178851A1

公开(公告)日：2022-06-09

申请号：US17540608

申请日：2021-12-02

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  David Vine

IPC: G01N23/046 ,  G01N23/083

Abstract: A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays.

公开(公告)号：US11143605B2

公开(公告)日：2021-10-12

申请号：US17009500

申请日：2020-09-01

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Benjamin Donald Stripe

IPC: G01N23/22 ,  G01N23/2204 ,  G01N23/2209 ,  G01N23/223 ,  G01N23/207 ,  G01N23/20016 ,  G01N23/20025 ,  G01N23/2055

Abstract: A system and a method use x-ray fluorescence to analyze a specimen by illuminating a specimen with an incident x-ray beam having a near-grazing incident angle relative to a surface of the specimen and while the specimen has different rotational orientations relative to the incident x-ray beam. Fluorescence x-rays generated by the specimen in response to the incident x-ray beam are collected while the specimen has the different rotational orientations.

公开(公告)号：US20190302042A1

公开(公告)日：2019-10-03

申请号：US16371606

申请日：2019-04-01

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G01N23/2209 ,  G01N23/223

Abstract: Systems and methods for x-ray emission spectroscopy are provided in which at least one x-ray analyzer is curved and receives and diffracts fluorescence x-rays emitted from a sample, and at least one spatially-resolving x-ray detector receives the diffracted x-rays. The at least one x-ray analyzer and the at least one spatially-resolving x-ray detector are positioned on the Rowland circle. In some configurations, the fluorescence x-rays are emitted from the same surface of the sample that is irradiated by the x-rays from an x-ray source and the system has an off-Rowland circle geometry. In some other configurations, an x-ray optical train receives the fluorescence x-rays emitted from a sample impinged by electrons within an electron microscope and focuses at least some of the received fluorescence x-rays to a focal spot.

公开(公告)号：US20190250113A1

公开(公告)日：2019-08-15

申请号：US16276036

申请日：2019-02-14

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G01N23/223 ,  G01N23/2055 ,  G01N23/2204 ,  G01N23/20025

CPC classification number: G01N23/223 ,  G01N23/20025 ,  G01N23/2055 ,  G01N23/2204

Abstract: An x-ray interrogation system having one or more x-ray beams interrogates an object (i.e., object). A structured source producing an array of x-ray micro-sources can be imaged onto the object. Each of the one or more beams may have a high resolution, such as for example a diameter of about 15 microns or less, at the surface of the object. The illuminating one or more micro-beams can be high resolution in one dimension and/or two dimensions, and can be directed at the object to illuminate the object. The incident beam that illuminates the object has an energy that is greater than the x-ray fluorescence energy.

公开(公告)号：US10297359B2

公开(公告)日：2019-05-21

申请号：US15783855

申请日：2017-10-13

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  David Charles Reynolds ,  Alan Francis Lyon

IPC: G21K1/06 ,  H01J35/10 ,  H01J35/14 ,  H01J35/26 ,  H01J35/30

Abstract: An x-ray illumination beam system includes an electron emitter and a target having one or more target microstructures. The one or more microstructures may be the same or different material, and may be embedded or placed atop a substrate formed of a heat-conducting material. The x-ray source may emit x-rays towards an optic system, which can include one or more optics that are matched to one or more target microstructures. The matching can be achieved by selecting optics with the geometric shape, size, and surface coating that collects as many x-rays as possible from the source and at an angle that satisfies the critical reflection angle of the x-ray energies of interest from the target. The x-ray illumination beam system allows for an x-ray source that generates x-rays having different spectra and can be used in a variety of applications.

公开(公告)号：US20190145917A1

公开(公告)日：2019-05-16

申请号：US16226467

申请日：2018-12-19

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Janos Kirz ,  Sylvia Jia Yun Lewis

IPC: G01N23/207 ,  G21K1/06 ,  H01J35/08 ,  H01J35/14 ,  H01J35/18 ,  G01N23/087 ,  G01N23/223

Abstract: An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.