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公开(公告)号:US20250036521A1
公开(公告)日:2025-01-30
申请号:US18770435
申请日:2024-07-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Myungkyu Lee , Seongmuk Kang , Jae-Gon Lee , Kyomin Sohn , Yeonggeol Song , Kijun Lee
IPC: G06F11/10
Abstract: An example CXL (Compute eXpress Link)-based memory module includes a memory device and a controller. The memory device includes a plurality of volatile memory cells and stores data or reads the stored data. The controller communicates with a host device through a CXL interface and controls the memory device. The controller includes an error correction code (ECC) circuit that generates a first codeword by adding a parity vector generated based on Reed-Solomon encoding to data received from the host device, an error injecting circuit that generates an error symbol and generates a second codeword by injecting the error symbol into at least a portion of the first codeword, and a memory device interface that controls the memory device such that the second codeword where the error symbol is injected is stored in the memory device. The controller determines a number of error symbols to be injected into the second codeword.
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公开(公告)号:US12176919B2
公开(公告)日:2024-12-24
申请号:US17988140
申请日:2022-11-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sung-Rae Kim , Kijun Lee , Myungkyu Lee , Sunghye Cho , Jin-Hoon Jang , Isak Hwang
Abstract: Disclosed is a memory device which includes a memory cell array that stores first data and first parity data, an error correction code (ECC) circuit that performs ECC decoding based on the first data and the first parity data and outputs error-corrected data and a decoding status flag, and an input/output circuit that provides the error-corrected data and the decoding status flag to a memory controller. The ECC circuit includes a syndrome generator that generates a syndrome based on the first data and the first parity data, a syndrome decoding circuit that decodes the syndrome to generate an error vector, a correction logic circuit that generates the error-corrected data based on the error vector and the first data, and a fast decoding status flag (DSF) generator that generates the decoding status flag based on the syndrome, without the error vector.
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公开(公告)号:US20240339168A1
公开(公告)日:2024-10-10
申请号:US18746565
申请日:2024-06-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunghye Cho , Kiheung Kim , Sungrae Kim , Junhyung Kim , Kijun Lee , Myungkyu Lee , Changyong Lee , Sanguhn Cha
IPC: G11C29/42 , G11C11/408 , G11C11/4091 , G11C29/12 , G11C29/44
CPC classification number: G11C29/42 , G11C11/4087 , G11C11/4091 , G11C29/4401 , G11C2029/1202 , G11C2029/1204
Abstract: A memory system includes a memory module having a plurality of memory devices therein. A memory controller is configured to transmit commands and addresses to the memory module in synchronization with a clock, input/output data to and from the memory module in synchronization with a data transfer clock, and perform system error correction operations on data read from the memory module. The plurality of memory devices perform on-die error correction operations, which are different from each other according to a physical location of the stored read data.
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公开(公告)号:US11947810B2
公开(公告)日:2024-04-02
申请号:US17743137
申请日:2022-05-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sungrae Kim , Hyeran Kim , Myungkyu Lee , Chisung Oh , Kijun Lee , Sunghye Cho , Sanguhn Cha
IPC: G06F3/06
CPC classification number: G06F3/0619 , G06F3/0655 , G06F3/0656 , G06F3/0679
Abstract: A semiconductor memory device includes a memory cell array and a cyclic redundancy check (CRC) engine. The memory cell array includes a plurality of volatile memory cells coupled to respective ones of a plurality of word-lines and respective ones of a plurality of bit-lines. The CRC engine, during a memory operation on the memory cell array, detects an error in a main data and a system parity data provided from a memory controller external to the semiconductor memory device through a link, generates an error flag indicating whether the detected error corresponds to either a first type of error associated with the link or a second type of error associated with the volatile memory cells based on the system parity data and transmit the error flag to the memory controller.
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公开(公告)号:US11860734B2
公开(公告)日:2024-01-02
申请号:US17736154
申请日:2022-05-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Sunghye Cho , Yeonggeol Song , Kijun Lee , Myungkyu Lee
CPC classification number: G06F11/1068 , G06F11/0772 , G06F11/1048 , H03M13/1108
Abstract: A semiconductor memory device includes a memory cell array, an on-die error correction code (ECC) engine, and a control logic circuit. The on-die ECC engine, based on an ECC, in a write operation, performs an ECC encoding on main data to generate first parity data, selectively replaces a portion of the first parity data with a poison flag to generate second parity data based on a poison mode signal, provides the main data to a normal cell region in a target page of the memory cell array, and provides the first parity data to a parity cell region in the target page or provides the poison flag and the second parity data to the parity cell region. The control logic circuit controls the on-die ECC engine and generates the poison mode signal, based on a command and an address from a memory controller.
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公开(公告)号:US11829614B2
公开(公告)日:2023-11-28
申请号:US17842981
申请日:2022-06-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yeonggeol Song , Sungrae Kim , Kijun Lee , Myungkyu Lee , Eunae Lee , Sunghye Cho
CPC classification number: G06F3/0626 , G06F3/064 , G06F3/0679 , G06F11/1068
Abstract: A semiconductor memory device includes a buffer die and a plurality of memory dies. An error correction code (ECC) engine in one of the memory dies performs an RS encoding on a main data to generate a parity data and performs a RS decoding, using a parity check matrix, on the main data and the parity data. The parity check matrix includes sub matrixes and each of the sub matrixes corresponds to two different symbols. Each of the sub matrixes includes two identity sub matrixes and two same alpha matrixes, the two identity sub matrixes are disposed in a first diagonal direction of the sub matrix and the two same alpha matrixes are disposed in a second diagonal direction. A number of high-level value elements in a y-th row of the parity check matrix is the same as a number of high-level value elements in a (y+p)-th row.
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公开(公告)号:US11689224B2
公开(公告)日:2023-06-27
申请号:US17199803
申请日:2021-03-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunae Lee , Kijun Lee , Yeonggeol Song , Myungkyu Lee , Seokha Hwang
CPC classification number: H03M13/1575 , G06F11/1076 , H03M13/1525
Abstract: An error correction device according to the technical idea of the present disclosure includes a syndrome generation circuit configured to receive data and generate a plurality of syndromes for the data, a partial coefficient generation circuit configured to generate partial coefficient information on a part of a coefficient of an error location polynomial by using the data while the plurality of syndromes are generated, an error location determination circuit configured to determine the coefficient of the error location polynomial based on the plurality of syndromes and the partial coefficient information, and obtain a location of an error in the data by using the error location polynomial, and an error correction circuit configured to correct the error in the data according to the location of the error.
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公开(公告)号:US11631448B1
公开(公告)日:2023-04-18
申请号:US17244466
申请日:2021-04-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Eunae Lee , Sunghye Cho , Kijun Lee , Junjin Kong , Yeonggeol Song
IPC: G11C11/406 , G06F12/06
Abstract: A memory device includes a memory cell array, an address manager and a refresh controller. The memory cell array includes a plurality of memory cells coupled to a plurality of word-lines. The address manager samples access addresses provided from a memory controller to generate sampling addresses and determines a capture address from among the access addresses, based on a time interval between refresh commands from the memory controller. The refresh controller refreshes target memory cells from among the plurality of memory cells based on one of a maximum access address from among the sampling address and the captured address.
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公开(公告)号:US20230037996A1
公开(公告)日:2023-02-09
申请号:US17718422
申请日:2022-04-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Myungkyu Lee , Kijun Lee , Sunghye Cho
Abstract: An operating method of a memory device includes storing position information regarding a codeword including an erasure and erasure information including position information regarding the erasure in a memory region, loading the position information regarding the codeword to a row decoder and a column decoder, determining whether a read address corresponding to a read instruction is identical to the position information regarding the codeword including the erasure, in response to the read instruction from a host, transmitting the position information of the erasure to an error correction code (ECC) decoder, when the read address is identical to the position information regarding the codeword including the erasure, and correcting, by the ECC decoder, an error in a codeword received from a memory cell array using the position information regarding the erasure.
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公开(公告)号:US11106535B2
公开(公告)日:2021-08-31
申请号:US16926000
申请日:2020-07-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunghye Cho , Kijun Lee , Yeonggeol Song , Sungrae Kim , Chanki Kim , Myungkyu Lee , Sanguhn Cha
Abstract: An error correction circuit includes an error correction code (ECC) encoder and an ECC decoder. The ECC encoder generates, based on a main data, a parity data using an ECC represented by a generation matrix and stores a codeword including the main data and the parity data in a target page. The ECC decoder reads the codeword from the target page as a read codeword based on an externally provided address to generate different syndromes based on the read codeword and a parity check matrix which is based on the ECC, and applies the different syndromes to the main data in the read codeword to correct a single bit error when the single bit error exists in the main data or to correct two bit errors when the two bit errors occur in adjacent two memory cells in the target page.
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