Centralized power loss management system for data storage devices

    公开(公告)号:US10976795B2

    公开(公告)日:2021-04-13

    申请号:US16398664

    申请日:2019-04-30

    Abstract: A power management circuit includes at least one energy storage device and a power controller coupled to the at least one energy storage device. The power controller is configured to enable temporary power to be provided from the at least one energy storage device to a plurality of data storage devices upon a system power loss event. The power controller is further configured to receive a power loss indication signal associated with any individual one of the plurality of data storage devices and responsively enable power loss protection for the data storage device.

    Robust secure testing of integrated circuits

    公开(公告)号:US10481205B2

    公开(公告)日:2019-11-19

    申请号:US15704515

    申请日:2017-09-14

    Abstract: A method includes configuring a first set of blocks of a plurality of blocks of an IC chip as secure data blocks, and configuring a second set of blocks of the plurality of blocks as non-secure data blocks. The method further includes receiving a test mode entry request in the IC chip. In response to the IC chip receiving the test mode entry request, carrying out a data-initialization operation on the plurality of blocks independently of whether any blocks of the plurality of blocks are configured as the secure data blocks or the non-secure data blocks. An IC chip data output is disabled during the data-initialization operation.

    ADAPTIVE CACHING IN A STORAGE DEVICE
    13.
    发明申请

    公开(公告)号:US20190065404A1

    公开(公告)日:2019-02-28

    申请号:US15691193

    申请日:2017-08-30

    Abstract: Implementations described and claimed herein provide a method and system for adaptive caching in a storage device. The method includes receiving an adaptive caching policy from a host for caching host read data and host write data in a hybrid drive using NAND cache, and allocating read cache for the host read data and write cache for the host write data in the NAND cache based on the adaptive caching policy. In some implementations, the method also includes iteratively performing an input/output (I/O) profiling operation to generate an I/O profile. An adaptive caching policy may be applied based on the I/O profile. When a unit time has completed, a new I/O profile may be compared with a current I/O profile. A new adaptive caching policy is applied based on determining the new I/O profile is different than the current I/O profile.

    Rapid scan testing of integrated circuit chips

    公开(公告)号:US10921372B2

    公开(公告)日:2021-02-16

    申请号:US16511792

    申请日:2019-07-15

    Abstract: A method of testing an IC chip having a plurality of programmable blocks and at least one memory. The method includes configuring a first programmable block of the plurality of programmable blocks with scan test logic for carrying out a scan test on other ones of the plurality of programmable blocks. The method further includes generating scan patterns and expected results for the scan test outside the IC chip. The generated scan patterns and expected results are loaded into the memory. The scan patterns from the memory are injected into the other programmable blocks. An output response of the other programmable blocks to the scan patterns is obtained. The output response is compared with the expected results by the scan test logic within the first programmable block. A scan test result based on the comparison between the output response and the expected results is provided.

    RAPID SCAN TESTING OF INTEGRATED CIRCUIT CHIPS

    公开(公告)号:US20180348298A1

    公开(公告)日:2018-12-06

    申请号:US15611047

    申请日:2017-06-01

    Abstract: A method of testing an IC chip having a plurality of programmable blocks and at least one memory. The method includes configuring a first programmable block of the plurality of programmable blocks with scan test logic for carrying out a scan test on other ones of the plurality of programmable blocks. The method further includes generating scan patterns and expected results for the scan test outside the IC chip. The generated scan patterns and expected results are loaded into the memory. The scan patterns from the memory are injected into the other programmable blocks. An output response of the other programmable blocks to the scan patterns is obtained. The output response is compared with the expected results by the scan test logic within the first programmable block. A scan test result based on the comparison between the output response and the expected results is provided.

    RAPID SYSTEM DEBUGGING USING FINITE STATE MACHINES

    公开(公告)号:US20170329686A1

    公开(公告)日:2017-11-16

    申请号:US15154839

    申请日:2016-05-13

    CPC classification number: G06F11/26 G06F1/10 G06F13/24

    Abstract: Systems and methods for improving system debugging using finite state machines are described. In one embodiment, the systems and methods includes selecting, by a first multiplexor, a period of a timer tick for one or more blocks of a system on a chip (SoC), comparing, by a first comparator, a current state of the one or more blocks to a previous state of the one or more blocks, and receiving, by a finite state machine (FSM), the result from the first comparator as a first input, receiving a pulse based on the selected period of the timer tick from the first multiplexor as a second input, and based on the first and second inputs generating an output indicating whether the current and previous states remain unchanged after a time of at least two timer ticks. In one embodiment, a result from the first comparator indicates whether the current state equals the previous state of the one or more blocks.

Patent Agency Ranking