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38 条记录 (耗时 0.031 秒)

    ON-LINE COMPENSATION OF INSTRUMENTAL RESPONSE DRIFT IN MINIATURIZED SPECTROMETERS
    13.
    发明公开
    ON-LINE COMPENSATION OF INSTRUMENTAL RESPONSE DRIFT IN MINIATURIZED SPECTROMETERS 审中-公开

    公开(公告)号：US20230152216A1

    公开(公告)日：2023-05-18

    申请号：US17989317

    申请日：2022-11-17

    申请人： Si-Ware Systems

    发明人： Bassem Mortada ,  Yasser M. Sabry ,  Samir Abozyd

    IPC分类号： G01N21/31

    CPC分类号： G01N21/31 ,  G01N2201/0231 ,  G01N2201/1211

    摘要： Aspects relate to on-line compensation of instrumental drifts in miniaturized spectrometers due to variations in environmental conditions and due to other sources of instrumental drift. The spectrometer may include a light modulator, a detector, and a processor. The spectrometer may further include a sensor configured to obtain a value of a condition contributing to instrumental drifts in the spectrometer. The processor may be configured to extract a set of correction parameters from a correction matrix associating a plurality of sets of correction parameters with sensor values based on the value and to apply the set of correction parameters to an output of the detector to produce a corrected spectrum of a sample under test. The correction matrix may be generated for the spectrometer or may be based on a global correction matrix fitted to the spectrometer.

    INTEGRATED DEVICE FOR FLUID ANALYSIS
    16.
    发明申请
    INTEGRATED DEVICE FOR FLUID ANALYSIS 审中-公开

    公开(公告)号：US20200378892A1

    公开(公告)日：2020-12-03

    申请号：US16885186

    申请日：2020-05-27

    申请人： Si-Ware Systems

    发明人： Yasser M. Sabry ,  Alaa Fathy ,  Diaa Abdelmaguid Khalil ,  Tarik Bourouina ,  Bassam A. Saadany

    IPC分类号： G01N21/61 ,  G01N21/03 ,  G01N21/05

    摘要： Aspects relate to a miniaturized gas cell that may be implemented into an integrated device for gas analysis. The miniaturized gas cell may be a multi-pass gas cell or a hollow waveguide gas cell. In some aspects, the miniaturized gas cell may include a bottom surface and sidewalls formed in a substrate (e.g., a silicon substrate or silicon on insulator (SOI) substrate). The gas cell further includes at least one gas inlet and at least one gas outlet coupled for injection of a gas into and out of the gas cell, respectively. In addition, the gas cell further includes an optical input and an optical output, each optically coupled to direct light into and out of the gas cell, respectively. In addition, a capping layer may be bonded to the substrate to form a top surface of the gas cell.

    HIGH PERFORMANCE PARALLEL SPECTROMETER DEVICE
    18.
    发明申请
    HIGH PERFORMANCE PARALLEL SPECTROMETER DEVICE 有权
    高性能并行光谱仪器件

    公开(公告)号：US20160282184A1

    公开(公告)日：2016-09-29

    申请号：US15009755

    申请日：2016-01-28

    申请人： Si-Ware Systems

    发明人： Diaa Khalil ,  Bassam A. Saadany ,  Yasser M. Sabry

    IPC分类号： G01J3/45 ,  G01J3/10

    CPC分类号： G01J3/45 ,  G01J3/0256 ,  G01J3/108 ,  G01J3/26 ,  G01J3/453 ,  G01J3/4531 ,  G01J3/4532 ,  G01J3/4535

    摘要： A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.

    摘要翻译： 具有增加的光学吞吐量和/或光谱分辨率的光谱仪包括并联耦合的多个干涉仪。 光分路器将源光束分成多个输入光束，并将每个输入光束引导到多个干涉仪中的相应一个。 一个或多个检测器被光学耦合以从多个干涉仪中的每一个接收相应的输出，并且被配置为检测作为输出结果产生的干涉图。

    MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTICAL SURFACES
    19.
    发明申请
    MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTICAL SURFACES 审中-公开
    具有高/可选光控表面的微光学设备

    公开(公告)号：US20160246002A1

    公开(公告)日：2016-08-25

    申请号：US15047205

    申请日：2016-02-18

    申请人： Si-Ware Systems

    发明人： Bassam Saadany ,  Yasser M. Sabry ,  Mostafa Medhat ,  Bassem Mortada ,  Muhammed Nagi ,  Mohamed Sadek ,  Yasseen Nada ,  Khaled Hassan

    IPC分类号： G02B6/136 ,  G02B6/36

    CPC分类号： G02B6/136 ,  B81B2201/047 ,  B81C1/00833 ,  G01B9/02051 ,  G01J3/0259 ,  G01J3/453 ,  G02B6/3692

    摘要： A micro-optical bench device is fabricated by a process that provides control over one or more properties of the micro-optical bench device and/or one or more properties of optical surfaces in the micro-optical bench device. The process includes etching a substrate to form a permanent structure including optical elements and a temporary structure. The shape of the temporary structure and gaps between the temporary structure and permanent structure facilitate control of a property of the micro-optical bench and/or optical surfaces therein. The process further includes removing the temporary structure from an optical path of the micro-optical bench device.

    摘要翻译： 通过提供对微型光学台装置的一个或多个特性的控制和/或微型光学台装置中的光学表面的一个或多个特性的方法制造微型光学台装置。 该方法包括蚀刻衬底以形成包括光学元件和临时结构的永久结构。 临时结构的形状和临时结构和永久结构之间的间隙便于控制微光学台和/或其中的光学表面的性质。 该方法还包括从微型光学平台装置的光路中移除临时结构。

    Aspherical optical surfaces and optical scanners
    20.
    发明申请
    Aspherical optical surfaces and optical scanners 有权
    非球面光学表面和光学扫描仪

    公开(公告)号：US20140022618A1

    公开(公告)日：2014-01-23

    申请号：US13943846

    申请日：2013-07-17

    申请人： Si-Ware Systems

    发明人： Yasser M. Sabry ,  Diaa Abdel Maged Khalil ,  Bassam A. Saadany ,  Tarik E. Bourouina

    IPC分类号： G02B26/10

    CPC分类号： G02B26/10 ,  G02B5/10 ,  G02B26/101

    摘要： Optical systems with aspherical optical elements are described. The aspherical optical elements have surfaces in which the in-plane radius of curvature spatially varies and the in-plane cross section surface profile is characterized in that the multiplication of the cosine of the incidence angle raised to a non-zero exponent by the in-plane radius of curvature varies less than twenty percent between any two points on the in-plane cross section surface profile.

    摘要翻译： 描述了具有非球面光学元件的光学系统。 非球面光学元件具有表面，其中面内曲率半径在空间上变化，并且面内截面表面轮廓的特征在于，入射角的余弦乘以非零指数， 平面曲率半径在平面截面表面轮廓上的任意两个点之间变化小于百分之二十。