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公开(公告)号：US20240004768A1
公开(公告)日：2024-01-04
申请号：US18467597
申请日：2023-09-14
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
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公开(公告)号：US12216558B2
公开(公告)日：2025-02-04
申请号：US18467597
申请日：2023-09-14
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
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公开(公告)号：US12117486B2
公开(公告)日：2024-10-15
申请号：US16778262
申请日：2020-01-31
Applicant: Tektronix, Inc.
Inventor： Daniel S. Froelich , Shane A. Hazzard , Sarah R. Boen , Jed H. Andrews
IPC: G01R31/317 , G06F13/20 , G06F13/40 , G06F13/42 , G06F30/398 , G06F115/12
CPC classification number: G01R31/31715 , G06F13/20 , G06F13/4068 , G06F13/4282 , G06F30/398 , G06F2115/12 , G06F2213/0026
Abstract: Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link of a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.
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公开(公告)号：US12055603B2
公开(公告)日：2024-08-06
申请号：US17386384
申请日：2021-07-27
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
CPC classification number: G01R31/58 , G01R31/1218 , H01R13/64 , H01R13/6675
Abstract: A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.
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公开(公告)号：US11946970B2
公开(公告)日：2024-04-02
申请号：US16778249
申请日：2020-01-31
Applicant: Tektronix, Inc.
Inventor： Daniel S. Froelich , Shane A. Hazzard , Sarah R. Boen , Jed H. Andrews
IPC: G01R31/317 , G06F11/273 , G06F13/20 , G06F13/40 , G06F13/42 , G06F30/398 , H04L43/50 , G06F115/12
CPC classification number: G01R31/31715 , G06F13/20 , G06F13/4068 , G06F13/4282 , G06F30/398 , G06F2115/12 , G06F2213/0026
Abstract: Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link of a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.
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Patent Agency Ranking
公开(公告)号：US20220163587A1
公开(公告)日：2022-05-26
申请号：US17534404
申请日：2021-11-23
Applicant: Tektronix, Inc.
Inventor： Daniel S. Froelich , Sam J. Strickling
IPC: G01R31/317 , G06F30/367
Abstract: A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT). The margin test generator is structured to modify test signals for testing the DUT during one or more testing states of a test session to create testing results. The testing results are stored in a data repository along with a DUT identifier of the DUT tested during the test session. A comparator determine whether any results of the DUT test results match a predictive outcome that is based from an analysis of previous DUT tests. If so, a message generator produces an indication that the tested DUT matched the predictive outcome.
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公开(公告)号：US20220091185A1
公开(公告)日：2022-03-24
申请号：US17402382
申请日：2021-08-13
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
IPC: G01R31/317 , G06F11/273 , G01R31/01
Abstract: A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.
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公开(公告)号：US20220034975A1
公开(公告)日：2022-02-03
申请号：US17386384
申请日：2021-07-27
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.
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公开(公告)号：US20220034967A1
公开(公告)日：2022-02-03
申请号：US17375451
申请日：2021-07-14
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen , Shane A. Hazzard
IPC: G01R31/319 , G01R31/3185
Abstract: A calibrated test and measurement cable for connecting one or more devices under test and a test and measurement instrument, including a first port structured to electrically connect to a first signal lane, a second port structured to electrically connect to a second signal lane, a third port structured to electrically connect to a test and measurement instrument, and a multiplexer configured to switch between electrically connecting the first port to the third port and connected the second port to the third port. The first and second signal lanes can be included on the same device under test or different devices under test. An input can receive instructions to operate the multiplexer.
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公开(公告)号：US20210297882A1
公开(公告)日：2021-09-23
申请号：US17207091
申请日：2021-03-19
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Andrew McCann , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: Systems and methods for automated recognition of a device under test and retrieving data associated with the device under test based on the recognition. The systems and methods include receiving a recognition key based on an identifying characteristic of the device under test, matching the received recognition key to a stored key in a database, retrieving data related to the stored key when the received recognition key matches the stored key, transmitting instructions to perform an action on a test and measurement device based on the retrieved data, receiving new data related to the device under test, and updating the data in the database related to the stored key with the new data.
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