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公开(公告)号：US20220018896A1
公开(公告)日：2022-01-20
申请号：US17379940
申请日：2021-07-19
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.
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公开(公告)号：US20200256893A1
公开(公告)日：2020-08-13
申请号：US16788176
申请日：2020-02-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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公开(公告)号：US10670632B2
公开(公告)日：2020-06-02
申请号：US15952547
申请日：2018-04-13
Applicant: Tektronix, Inc.
Inventor： David A. Holaday , Joshua J. O'Brien
Abstract: A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.
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公开(公告)号：US20200166546A1
公开(公告)日：2020-05-28
申请号：US16695795
申请日：2019-11-26
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien , Brian S. Mantel
Abstract: A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.
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公开(公告)号：US12222388B2
公开(公告)日：2025-02-11
申请号：US18488936
申请日：2023-10-17
Applicant: Tektronix, Inc.
Inventor： Pirooz Hojabri , Joshua J. O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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Patent Agency Ranking
公开(公告)号：US12210039B2
公开(公告)日：2025-01-28
申请号：US17721294
申请日：2022-04-14
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien , Josiah A. Bartlett
Abstract: A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.
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公开(公告)号：US20240159824A1
公开(公告)日：2024-05-16
申请号：US18510644
申请日：2023-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Joshua J. O'Brien
IPC: G01R31/28
CPC classification number: G01R31/2884
Abstract: An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.
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公开(公告)号：US11815548B2
公开(公告)日：2023-11-14
申请号：US17379940
申请日：2021-07-19
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
CPC classification number: G01R31/2886 , G01R29/26
Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.
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公开(公告)号：US20210270893A1
公开(公告)日：2021-09-02
申请号：US17324007
申请日：2021-05-18
Applicant: Tektronix, Inc.
Inventor： Pirooz Hojabri , Joshua J. O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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20.发明申请公开(公告)号：US20210149781A1
公开(公告)日：2021-05-20
申请号：US17094677
申请日：2020-11-10
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien
Abstract: A test and measurement device includes an input port for receiving a bus conducting data from a device under test, and processing element coupled to the input port. The processing element is configured to execute instructions that cause the processing element to determine a data sequence from a signal of the bus received on a main channel of the device, and use information from at least one other signal of the bus on an auxiliary channel of the device based upon a protocol associated with the bus to adjust parameters for performing error detection on the data sequence. A method of performing error detection in a test instrument includes receiving, at an input port of the test instrument, a bus conducting a data sequence from a device under test, determining the data sequence from a signal of the bus received on a main channel of the test instrument, and using information from at least one other signal of the bus received on an auxiliary channel of the test instrument to perform error detection on the data sequence.
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