公开(公告)号：US06847068B2

公开(公告)日：2005-01-25

申请号：US10441801

申请日：2003-05-19

Applicant: Ying-Cheng Chuang ,  Chung-Lin Huang ,  Chi-Hui Lin

Inventor： Ying-Cheng Chuang ,  Chung-Lin Huang ,  Chi-Hui Lin

IPC: H01L21/28 ,  H01L29/423 ,  H01L21/8242

CPC classification number: H01L29/42324 ,  H01L21/28273

Abstract: A floating gate with multiple tips and a fabrication method thereof. A semiconductor substrate is provided, on which a patterned hard mask layer is formed, wherein the patterned hard mask layer has an opening. A gate dielectric layer and a first conducting layer with a first predetermined thickness are formed on the bottom of the opening. A spacer is formed on the sidewall of the opening. A conducting spacer is formed on the sidewall of the spacer. The first conducting layer is etched to a second predetermined thickness. A multi-tip floating gate is provided by the first conducting layer and the conducting spacer. A protecting layer is formed in the opening. The patterned hard mask layer, the gate dielectric layer, a portion of the protecting layer, and a portion of the first spacer are etched to expose the surface of the first conducting layer.

公开(公告)号：US07022573B2

公开(公告)日：2006-04-04

申请号：US10884701

申请日：2004-07-02

Applicant: Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

Inventor： Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

IPC: H01L21/336

CPC classification number: H01L27/11556 ,  H01L27/115 ,  H01L29/42336 ,  H01L29/7881

Abstract: A stacked gate vertical flash memory and a fabrication method thereof. The stacked gate vertical flash memory comprises a semiconductor substrate with a trench, a source conducting layer formed on the bottom of the trench, an insulating layer formed on the source conducting layer, a gate dielectric layer formed on a sidewall of the trench, a conducting spacer covering the gate dielectric layer as a floating gate, an inter-gate dielectric layer covering the conducting spacer, and a control gate conducting layer filled in the trench.

Abstract translation: 堆叠式门垂直闪存及其制造方法。 层叠栅极垂直闪速存储器包括具有沟槽的半导体衬底，形成在沟槽底部的源极导电层，形成在源极导电层上的绝缘层，形成在沟槽侧壁上的栅极电介质层，导电层 覆盖作为浮动栅极的栅极介电层的隔板，覆盖导电间隔物的栅极间介电层和填充在沟槽中的控制栅极导电层。

公开(公告)号：US20050127422A1

公开(公告)日：2005-06-16

申请号：US10707396

申请日：2003-12-10

Applicant: Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

Inventor： Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

IPC: H01L21/8242 ,  H01L27/108

CPC classification number: H01L27/10876 ,  H01L27/10841 ,  H01L27/10864 ,  H01L27/10885 ,  Y10S257/905 ,  Y10S257/906 ,  Y10S257/908

Abstract: A vertical DRAM and fabrication method thereof. The vertical DRAM has a plurality of memory cells on a substrate, and each of the memory cells has a trench capacitor, a vertical transistor, and a source-isolation oxide layer in a deep trench. The main advantage of the present invention is to form an annular source diffusion and an annular drain diffusion of the vertical transistor around the sidewall of the deep trench. As a result, when a gate of the transistor is turned on, an annular gate channel is provided. The width of the gate channel of the present invention is therefore increased.

Abstract translation: 垂直DRAM及其制造方法。 垂直DRAM在衬底上具有多个存储单元，并且每个存储单元在深沟槽中具有沟槽电容器，垂直晶体管和源极隔离氧化物层。 本发明的主要优点是在深沟槽的侧壁周围形成环形源极扩散和垂直晶体管的环形漏极扩散。 结果，当晶体管的栅极导通时，提供环形栅极沟道。 因此，本发明的栅极通道的宽度增加。

公开(公告)号：US06870216B2

公开(公告)日：2005-03-22

申请号：US10606702

申请日：2003-06-26

Applicant: Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

Inventor： Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

IPC: H01L21/8247 ,  H01L27/115 ,  H01L29/423 ,  H01L29/788 ,  H01L29/72

CPC classification number: H01L27/11556 ,  H01L27/115 ,  H01L29/42336 ,  H01L29/7881

Abstract: A stacked gate vertical flash memory and a fabrication method thereof. The stacked gate vertical flash memory comprises a semiconductor substrate with a trench, a source conducting layer formed on the bottom of the trench, an insulating layer formed on the source conducting layer, a gate dielectric layer formed on a sidewall of the trench, a conducting spacer covering the gate dielectric layer as a floating gate, an inter-gate dielectric layer covering the conducting spacer, and a control gate conducting layer filled in the trench.

Abstract translation: 堆叠式门垂直闪存及其制造方法。 层叠栅极垂直闪速存储器包括具有沟槽的半导体衬底，形成在沟槽底部的源极导电层，形成在源极导电层上的绝缘层，形成在沟槽侧壁上的栅极电介质层，导电层 覆盖作为浮动栅极的栅极介电层的隔板，覆盖导电间隔物的栅极间介电层和填充在沟槽中的控制栅极导电层。

公开(公告)号：US07476929B2

公开(公告)日：2009-01-13

申请号：US11269671

申请日：2005-11-09

Applicant: Ching-Nan Hsiao ,  Chi-Hui Lin ,  Ying-Cheng Chuang

Inventor： Ching-Nan Hsiao ,  Chi-Hui Lin ,  Ying-Cheng Chuang

IPC: H01L27/115 ,  H01L29/788

CPC classification number: H01L21/28273 ,  H01L29/66825 ,  H01L29/7887

Abstract: The present invention discloses a multi-bit stacked-type non-volatile memory having a spacer-shaped floating gate and a manufacturing method thereof. The manufacturing method includes forming a patterned dielectric layer containing arsenic on a semiconductor substrate, wherein the patterned dielectric layer defines an opening as an active area. A dielectric spacer is formed on a side wall of the patterned dielectric layer and a gate dielectric layer is formed on the semiconductor substrate. A source/drain region is formed by thermal driving method making arsenic diffusion from the patterned dielectric layer into the semiconductor substrate. A spacer-shaped floating gate is formed on the side wall of the dielectric spacer and the gate dielectric layer. An interlayer dielectric layer is formed on the spacer-shaped floating gate. A control gate is formed on the interlayer dielectric layer and fills the opening of the active area.

Abstract translation: 本发明公开了一种具有间隔型浮动栅极的多位堆叠型非易失性存储器及其制造方法。 制造方法包括在半导体衬底上形成含有砷的图案化电介质层，其中图案化电介质层限定开口作为有效区域。 在图案化电介质层的侧壁上形成介质间隔物，并在半导体衬底上形成栅极电介质层。 源极/漏极区域通过使从扩散图案化的介电层扩散到半导体衬底中的热驱动方法形成。 间隔物形状的浮栅形成在电介质隔离物的侧壁和栅介电层上。 在间隔物形浮栅上形成层间绝缘层。 在层间电介质层上形成控制栅极，填充有源区的开口。

公开(公告)号：US20060063339A1

公开(公告)日：2006-03-23

申请号：US11269671

申请日：2005-11-09

Applicant: Ching-Nan Hsiao ,  Chi-Hui Lin ,  Ying-Cheng Chuang

Inventor： Ching-Nan Hsiao ,  Chi-Hui Lin ,  Ying-Cheng Chuang

IPC: H01L21/331 ,  H01L21/8222

CPC classification number: H01L21/28273 ,  H01L29/66825 ,  H01L29/7887

Abstract: The present invention discloses a multi-bit stacked-type non-volatile memory having a spacer-shaped floating gate and a manufacturing method thereof. The manufacturing method includes forming a patterned dielectric layer containing arsenic on a semiconductor substrate, wherein the patterned dielectric layer defines an opening as an active area. A dielectric spacer is formed on a side wall of the patterned dielectric layer and a gate dielectric layer is formed on the semiconductor substrate. A source/drain region is formed by thermal driving method making arsenic diffusion from the patterned dielectric layer into the semiconductor substrate. A spacer-shaped floating gate is formed on the side wall of the dielectric spacer and the gate dielectric layer. An interlayer dielectric layer is formed on the spacer-shaped floating gate. A control gate is formed on the interlayer dielectric layer and fills the opening of the active area.

Abstract translation: 本发明公开了一种具有间隔型浮动栅极的多位堆叠型非易失性存储器及其制造方法。 制造方法包括在半导体衬底上形成含有砷的图案化电介质层，其中图案化电介质层限定开口作为有效区域。 在图案化电介质层的侧壁上形成介质间隔物，并在半导体衬底上形成栅极电介质层。 源极/漏极区域通过使从扩散图案化的介电层扩散到半导体衬底中的热驱动方法形成。 间隔物形状的浮栅形成在电介质隔离物的侧壁和栅介电层上。 在间隔物形浮栅上形成层间绝缘层。 在层间电介质层上形成控制栅极，填充有源区的开口。

公开(公告)号：US07135731B2

公开(公告)日：2006-11-14

申请号：US10707396

申请日：2003-12-10

Applicant: Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

Inventor： Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chi-Hui Lin

IPC: H01L27/108 ,  H01L29/76 ,  H01L29/94 ,  H01L31/119

CPC classification number: H01L27/10876 ,  H01L27/10841 ,  H01L27/10864 ,  H01L27/10885 ,  Y10S257/905 ,  Y10S257/906 ,  Y10S257/908

Abstract: A vertical DRAM and fabrication method thereof. The vertical DRAM has a plurality of memory cells on a substrate, and each of the memory cells has a trench capacitor, a vertical transistor, and a source-isolation oxide layer in a deep trench. The main advantage of the present invention is to form an annular source diffusion and an annular drain diffusion of the vertical transistor around the sidewall of the deep trench. As a result, when a gate of the transistor is turned on, an annular gate channel is provided. The width of the gate channel of the present invention is therefore increased.

Abstract translation: 垂直DRAM及其制造方法。 垂直DRAM在衬底上具有多个存储单元，并且每个存储单元在深沟槽中具有沟槽电容器，垂直晶体管和源极隔离氧化物层。 本发明的主要优点是在深沟槽的侧壁周围形成环形源极扩散和垂直晶体管的环形漏极扩散。 结果，当晶体管的栅极导通时，提供环形栅极沟道。 因此，本发明的栅极通道的宽度增加。

公开(公告)号：US06995061B2

公开(公告)日：2006-02-07

申请号：US10779607

申请日：2004-02-18

Applicant: Ching-Nan Hsiao ,  Chi-Hui Lin ,  Ying-Cheng Chuang

Inventor： Ching-Nan Hsiao ,  Chi-Hui Lin ,  Ying-Cheng Chuang

IPC: H01L21/336

CPC classification number: H01L21/28273 ,  H01L29/66825 ,  H01L29/7887

Abstract: The present invention discloses a multi-bit stacked-type non-volatile memory having a spacer-shaped floating gate and a manufacturing method thereof. The manufacturing method includes forming a patterned dielectric layer containing arsenic on a semiconductor substrate, wherein the patterned dielectric layer defines an opening as an active area. A dielectric spacer is formed on a side wall of the patterned dielectric layer and a gate dielectric layer is formed on the semiconductor substrate. A source/drain region is formed by thermal driving method making arsenic diffusion from the patterned dielectric layer into the semiconductor substrate. A spacer-shaped floating gate is formed on the side wall of the dielectric spacer and the gate dielectric layer. An interlayer dielectric layer is formed on the spacer-shaped floating gate. A control gate is formed on the interlayer dielectric layer and fills the opening of the active area.

公开(公告)号：US07700991B2

公开(公告)日：2010-04-20

申请号：US11946868

申请日：2007-11-29

Applicant: Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chung-Lin Huang ,  Shih-Yang Chiu

Inventor： Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chung-Lin Huang ,  Shih-Yang Chiu

IPC: H01L29/76

CPC classification number: H01L29/7881 ,  H01L29/66825

Abstract: A method for fabricating the memory structure includes: providing a substrate having a pad, forming an opening in the pad, forming a first spacer on a sidewall of the opening, filling the opening with a sacrificial layer, removing the first spacer and exposing a portion of the substrate, removing the exposed substrate to define a first trench and a second trench, removing the sacrificial layer to expose a surface of the substrate to function as a channel region, forming a first dielectric layer on a surface of the first trench, a surface of the second trench and a surface of the channel region, filling the first trench and the second trench with a first conductive layer, forming a second dielectric layer on a surface of the first conductive layer and the surface of the channel region, filling the opening with a second conductive layer, and removing the pad.

Abstract translation: 一种用于制造存储器结构的方法包括：提供具有焊盘的衬底，在焊盘中形成开口，在开口的侧壁上形成第一间隔物，用牺牲层填充开口，移除第一间隔物并露出一部分 去除所述暴露的衬底以限定第一沟槽和第二沟槽，去除所述牺牲层以暴露所述衬底的表面以用作沟道区域，在所述第一沟槽的表面上形成第一介电层， 第二沟槽的表面和沟道区的表面，用第一导电层填充第一沟槽和第二沟槽，在第一导电层的表面和沟道区的表面上形成第二介电层，填充第二沟槽 用第二导电层打开，并移除垫。

公开(公告)号：US20090014886A1

公开(公告)日：2009-01-15

申请号：US11951274

申请日：2007-12-05

Applicant: Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chung-Lin Huang ,  Shih-Yang Chiu

Inventor： Ching-Nan Hsiao ,  Ying-Cheng Chuang ,  Chung-Lin Huang ,  Shih-Yang Chiu

IPC: H01L23/522 ,  H01L21/768 ,  H02H9/00

CPC classification number: H01L27/0251 ,  H01L27/10894

Abstract: The invention provides a dynamic random access memory (DRAM) with an electrostatic discharge (ESD) region. The upper portion of the ESD plug is metal, and the lower portion of the ESD plug is polysilicon. This structure may improve the mechanical strength of the ESD region and enhance thermal conductivity from electrostatic discharging. In addition, the contact area between the ESD plugs and the substrate can be reduced without increasing aspect ratio of the ESD plugs. The described structure is completed by a low critical dimension controlled patterned photoresist, such that the processes and equipments are substantially maintained without changing by a wide margin.

Abstract translation: 本发明提供一种具有静电放电（ESD）区域的动态随机存取存储器（DRAM）。 ESD插头的上部是金属，ESD插头的下部是多晶硅。 该结构可以提高ESD区域的机械强度并增强静电放电的导热性。 此外，可以减少ESD插头和基板之间的接触面积，而不增加ESD插头的纵横比。 所描述的结构由低临界尺寸控制的图案化光致抗蚀剂完成，使得工艺和设备基本上保持而不会大幅变化。