Method of forming an ohmic layer and method of forming a metal wiring of a semiconductor device using the same
    11.
    发明申请
    Method of forming an ohmic layer and method of forming a metal wiring of a semiconductor device using the same 审中-公开
    形成欧姆层的方法和使用该欧姆层的半导体器件的金属布线的形成方法

    公开(公告)号:US20090233439A1

    公开(公告)日:2009-09-17

    申请号:US12382008

    申请日:2009-03-05

    IPC分类号: H01L21/768

    摘要: A metal organic precursor represented by a formula of R1-CpML is provided onto a substrate having a conductive pattern including silicon. Here, R1 is an alkyl group substituent of Cp, R1 including methyl, ethyl, propyl, pentamethyl, pentaethyl, diethyl, dimethyl or dipropyl, Cp is cyclopentadienyl, M includes nickel (Ni), cobalt (Co), titanium (Ti), platinum (Pt) zirconium (Zr) or ruthenium (Ru), and L is at least one ligand, the at least one ligand including a carbonyl. A deposition process is performed using the metal organic precursor to form a preliminary metal silicide layer and a metal layer on the substrate. The preliminary metal silicidation layer is formed on the conductive pattern. The preliminary metal silicide layer is transformed into a metal silicide layer.

    摘要翻译: 将由式R1-CpML表示的金属有机前体提供到具有包括硅的导电图案的基板上。 这里,R1是Cp的烷基取代基,R1包括甲基,乙基,丙基,五甲基,五乙基,二乙基,二甲基或二丙基,Cp是环戊二烯基,M包括镍(Ni),钴(Co),钛(Ti) 铂(Pt)锆(Zr)或钌(Ru),L是至少一种配体,所述至少一种配体包括羰基。 使用金属有机前体进行沉积工艺,以在衬底上形成初步金属硅化物层和金属层。 在导电图案上形成预备金属硅化层。 将初级金属硅化物层转变成金属硅化物层。

    Apparatus for analyzing a substrate employing a copper decoration
    15.
    发明授权
    Apparatus for analyzing a substrate employing a copper decoration 失效
    用于分析使用铜装饰的基板的装置

    公开(公告)号:US06919214B2

    公开(公告)日:2005-07-19

    申请号:US10688954

    申请日:2003-10-21

    IPC分类号: G01N33/00 H01L21/66 H01L21/00

    CPC分类号: H01L22/24 G01N2033/0095

    摘要: An apparatus for analyzing a substrate employing a copper decoration includes a bath having at least two receiving containers for receiving electrolytes, slots formed at insides of the receiving containers for receiving substrates to be analyzed in a direction that is normal to a bottom face of the bath, lower copper plates provided in the receiving containers, the lower copper plates making contact with entire rear faces of the substrates received in the receiving containers, upper copper plates provided in the receiving containers, each of the upper copper plates corresponding to a respective one of the lower copper plates, and separated from front faces of the substrates, and a power source connected to the upper copper plates and the lower copper plates for providing voltages to the same. A plurality of substrates may be simultaneously analyzed using one apparatus thereby greatly reducing an amount of time required for the analysis.

    摘要翻译: 用于分析使用铜装饰的基板的装置包括具有至少两个用于接收电解质的接收容器的浴槽,在接收容器的内侧形成的槽,用于接收正常于浴底面的方向分析的基板 设置在接收容器中的下铜板,与接收容器中容纳的基板的整个后表面接触的下铜板,设置在接收容器中的上铜板,每个上铜板对应于 下铜板,并且与基板的前表面分离,以及连接到上铜板和下铜板的电源,用于向其提供电压。 可以使用一个装置同时分析多个基板,从而大大减少了分析所需的时间量。

    Method of forming a thin film and methods of manufacturing a gate structure and a capacitor using same
    18.
    发明申请
    Method of forming a thin film and methods of manufacturing a gate structure and a capacitor using same 审中-公开
    形成薄膜的方法和使用其制造栅极结构和电容器的方法

    公开(公告)号:US20080057224A1

    公开(公告)日:2008-03-06

    申请号:US11790445

    申请日:2007-04-25

    IPC分类号: C23C8/00

    CPC分类号: C23C8/80 C23C4/123 C23C8/02

    摘要: A method of manufacturing a thin film includes providing a metal organic precursor onto a substrate where the metal organic precursor is heated to a temperature of about 60° C. to about 95° C. and has a saturated vapor pressure of about 1 Torr to about 5 Torr. An oxidizing agent including oxygen for oxidizing the metal organic precursor is provided onto the substrate. The metal organic precursor and the oxidizing agent are chemically reacted to form the thin film including metal oxide. The thin film is easily available in a gate insulation layer of a gate structure, a dielectric layer of a capacitor, and similar circuit components.

    摘要翻译: 制造薄膜的方法包括将金属有机前体提供到基底上,其中将金属有机前体加热至约60℃至约95℃的温度,并具有约1托至约 5乇 将包含用于氧化金属有机前体的氧的氧化剂提供到基底上。 金属有机前体和氧化剂在化学上反应以形成包括金属氧化物的薄膜。 该薄膜可容易地用于栅极结构的栅极绝缘层,电容器的介电层和类似的电路部件。