摘要:
Fringe image data obtained by use of the phase shift method is Fourier-transformed, so as to determine the carrier frequency and the complex amplitude which occur due to the deviation between the respective wavefronts from the object to be observed and a reference. According to the carrier frequency and the complex amplitude, the amount of translational displacement of phase shift and the amount of inclination are detected, so as to correct the results determined by the phase shift method. Thus, the influences of errors in the amount of inclination/amount of displacement in the phase shift element can be eliminated easily.
摘要:
The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light that travels while being converged by a Mirau objective interference optical system is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.
摘要:
A wavefront measuring apparatus for optical pickup includes: a beam splitting section; a wavefront shaping section; a beam combining section that generate interference light; an interference fringe image-acquiring section that acquires an interference fringe image including wavefront information of the light beam; and an analyzing section that analyzes a wavefront of the light beam on the basis of the interference fringe image. The analyzing section includes: an image processing section that performs a filtering process on the interference fringe image to eliminate a frequency component corresponding to the sub beam, so as to acquire the filtering-processed interference fringe image, and a wavefront analyzing section that analyzes a wavefront of the main beam on the basis of the filtering-processed interference fringe image.
摘要:
The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.
摘要:
A circular region extracting method captures onto a coordinate system a fringe image of a sample having a circular region to be analyzed within an area to be observed, binary-codes the fringe image of the area by a fringe analysis method on the coordinate system, places a plurality of linear gratings in parallel with each other with a predetermined interval on thus binary-coded coordinate system, and uses the linear gratings so as to extract a circular image region representing the region to be analyzed on the coordinate system.
摘要:
A phase shift fringe image analysis method comprises the steps of shifting an object to be observed and a reference relative to each other by using a phase shift device, obtaining fringe image data at three or more phase shift positions having a given phase gap therebetween, and determining a phase of the object by analyzing thus obtained plurality of fringe image data items. The positional data of at least three phase positions are specified, and the whole or part of the fringe image data on which carrier fringes at these phase positions are superposed is subjected to a predetermined arithmetic operation so as to carry out a phase analysis and determine the phase of the object.
摘要:
When analyzing the fringe pattern of an object to be observed by using Fourier transform method with respect to closed interference fringe image data, the original data expressed by an orthogonal coordinate system are once converted into fringe image data represented by a polar coordinate system, the converted data are analyzed by the conventional Fourier transform method, and then the resulted data are converted back into the original orthogonal coordinate system by inverse coordinate transformation, so as to obtain the wavefront corresponding to the original wavefront to be observed.