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公开(公告)号:US11918831B2
公开(公告)日:2024-03-05
申请号:US17464665
申请日:2021-09-01
申请人: Susan L. Michaud , Ran Tu , Daniel J. Raymond
发明人: Susan L. Michaud , Ran Tu , Daniel J. Raymond
CPC分类号: A61N5/1077 , A61B6/03 , A61N5/1044 , A61N5/1067 , A61N5/1082 , G21K1/087 , G21K1/093 , G21K5/04 , A61N5/107 , A61N2005/1074 , A61N2005/1087 , A61N2005/1097 , H01J35/147
摘要: The invention comprises a method and apparatus for treating a tumor of a patient with positively charged particles, comprising the steps of transporting the positively charged particles along a beam transport path passing sequentially from an accelerator, through a beam transport line, through a nozzle, and toward a position of the patient, the step of transporting further comprising the steps of: (1) terminating a first Bragg peak, of a first set of the positively charged particles, in a position of the tumor and (2) flash treating the tumor with a second Bragg peak, of a second set of the positively charged particles, the second Bragg peak terminating post-patient relative to the nozzle. Optionally the second set of particles are delivered at a rate exceeding one MHz. Optionally, particles in common are used to both treat the tumor and image the tumor.
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公开(公告)号:US20240066325A1
公开(公告)日:2024-02-29
申请号:US18387604
申请日:2023-11-07
申请人: Susan L. Michaud , Daniel J. Raymond , Artur Teymurazyan , Ran Tu
发明人: Susan L. Michaud , Daniel J. Raymond , Artur Teymurazyan , Ran Tu
CPC分类号: A61N5/1077 , A61B6/03 , A61N5/1044 , A61N5/1067 , A61N5/1082 , G21K1/087 , G21K1/093 , G21K5/04 , A61N5/107 , A61N2005/1074 , A61N2005/1087 , A61N2005/1097 , H01J35/147
摘要: The invention comprises a method and apparatus for tuning a charged particle beam path of a charged particle beam system used to treat a tumor of a patient, comprising the steps of: positioning a two-dimensional charged particle detector in a beam line downstream from a magnet pair; operating windings of the magnet pair at a first power level to generate a first magnetic field; measuring a beam position with the first two-dimensional charged particle detector; adjusting a correction magnetic field by driving voltage of a correction coil at a second power level, the second power level less than five percent of the first power level, where the first magnetic field and the correction magnetic field combine to yield an operational magnetic field; and the steps of measuring and adjusting the correction magnetic field changing the operational magnetic field to adjust a measured beam position toward a target beam position.
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13.
公开(公告)号:US11894209B2
公开(公告)日:2024-02-06
申请号:US17275021
申请日:2018-09-14
申请人: COMET AG
发明人: André Schu
CPC分类号: H01J35/16 , H01J35/066 , H01J35/147 , H01J2235/083 , H01J2235/168
摘要: A component part in a vacuum area of an X-ray tube with an opening through which an electron beam is guided. The component part includes a base body made of a first material, wherein the first material is a metal. Arranged on a surface forming the opening is a second material having an atomic number which is smaller than an atomic number of the first material. A target support is attached to an end of the component part. The target support supports a target which is aligned with a lens diaphragm formed at the end of the component part. The target support has a base body made of a first material which is a metal, and a second material formed on a surface of the base body that is selectively exposed to the electron beam and which extends between the target and the lens diaphragm.
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14.
公开(公告)号:US11719652B2
公开(公告)日:2023-08-08
申请号:US17160006
申请日:2021-01-27
申请人: KLA Corporation
发明人: Yung-Ho Alex Chuang , John Fielden
IPC分类号: G01N23/20008 , G01N23/201 , H01J35/06 , H01J35/14 , H01J35/18 , H01J3/02 , H05G1/02 , G03F7/20 , G03F7/00
CPC分类号: G01N23/20008 , G01N23/201 , G03F7/70633 , H01J3/022 , H01J35/065 , H01J35/066 , H01J35/147 , H01J35/18 , H05G1/02 , G01N2223/03 , G01N2223/054 , G01N2223/1016 , G01N2223/204 , G01N2223/6116 , H01J2235/062 , H01J2235/068 , H01J2235/16 , H01J2235/18
摘要: Methods and systems for realizing a high radiance x-ray source based on a high density electron emitter array are presented herein. The high radiance x-ray source is suitable for high throughput x-ray metrology and inspection in a semiconductor fabrication environment. The high radiance X-ray source includes an array of electron emitters that generate a large electron current focused over a small anode area to generate high radiance X-ray illumination light. In some embodiments, electron current density across the surface of the electron emitter array is at least 0.01 Amperes/mm2, the electron current is focused onto an anode area with a dimension of maximum extent less than 100 micrometers, and the spacing between emitters is less than 5 micrometers. In another aspect, emitted electrons are accelerated from the array to the anode with a landing energy less than four times the energy of a desired X-ray emission line.
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公开(公告)号:US12125662B2
公开(公告)日:2024-10-22
申请号:US17657692
申请日:2022-04-01
IPC分类号: H01J35/14 , A61B6/03 , A61B6/40 , G01N23/046
CPC分类号: H01J35/153 , A61B6/032 , A61B6/4028 , G01N23/046 , H01J35/147 , H01J2235/086
摘要: Systems/techniques that facilitate correction of intra-scan focal-spot displacement are provided. In various embodiments, a system can access a first gantry angle of a medical scanner. In various aspects, the system can determine a first displacement of a focal-spot of the medical scanner based on the first gantry angle, by referencing a mapping that correlates gantry angles to focal-spot displacements. In various instances, the system can compensate, via one or more focal-spot position adjusters of the medical scanner, for the first displacement.
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16.
公开(公告)号:US11963284B2
公开(公告)日:2024-04-16
申请号:US17610831
申请日:2020-05-06
发明人: Heiner Daerr , Bernd Rudi David
IPC分类号: H05G1/58 , H01J35/14 , H05G1/52 , A61B6/00 , G01N23/046
CPC分类号: H05G1/58 , H01J35/147 , H05G1/52 , A61B6/482 , G01N23/046
摘要: An imaging system (202) includes an X-ray radiation source (210) configured to emit radiation that traverses an examination region. The imaging system further includes a controller (220). The controller is configured to control an X-ray tube peak voltage of the X-ray radiation source to switch between at least two different X-ray tube peak voltages during a kVp switched spectral scan. The controller is further configured to control a grid voltage of the X-ray radiation source to follow the X-ray tube peak voltage during the spectral scan. The controller adjusts the grid voltage based on a predetermined mapping between a currently applied X-ray tube peak voltage and a corresponding grid voltage for a given focal spot size, thereby maintaining the given focal spot size throughout the spectral scan.
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公开(公告)号:US20240062985A1
公开(公告)日:2024-02-22
申请号:US18447503
申请日:2023-08-10
申请人: incoatec GmbH
IPC分类号: H01J35/14
CPC分类号: H01J35/147
摘要: An x-ray tube includes a thermionic cathode generating an electron beam propagating from the cathode to a target along a beam axis. The x-ray tube has apertures in the form of a control electrode with a first aperture opening, a focusing electrode with a second aperture opening and a beam shaping electrode with a third aperture opening. The first aperture opening is smaller than the emission surface and has a contour rotationally symmetric with respect to the beam axis. The second aperture opening is larger than the first aperture opening and has a contour rotationally symmetric with respect to the beam axis. The third aperture opening has a contour which is aligned with an xy plane and non-rotationally symmetric with respect to the beam axis. The X-ray tube has a simple structure for generating an electron beam where the number of electrons can be varied easily over a wide range.
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公开(公告)号:US11798772B2
公开(公告)日:2023-10-24
申请号:US17292695
申请日:2019-11-07
申请人: PEKING UNIVERSITY
发明人: Xianlong Wei
CPC分类号: H01J35/025 , H01J35/064 , H01J35/16 , H01J35/186 , H01J9/18 , H01J35/12 , H01J35/147 , H01J2235/068
摘要: Provided are an on-chip miniature X-ray source and a method for manufacturing the same. The on-chip miniature X-ray source includes: an on-chip miniature electron source; a first insulating spacer provided on an electron-emitting side of the on-chip miniature electron source, where the first insulating spacer has a cavity structure; and an anode provided on the first insulating spacer, where a closed vacuum cavity is formed between the on-chip miniature electron source and the anode. The on-chip miniature X-ray source has the advantages of stable X-ray dose, low working requirements for vacuum, fast switch response, capability of integration and batch fabrication, and can be used in various types of small and portable X-ray detection, analysis and treatment devices.
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公开(公告)号:US20230317398A1
公开(公告)日:2023-10-05
申请号:US17657692
申请日:2022-04-01
IPC分类号: H01J35/14 , A61B6/00 , A61B6/03 , G01N23/046
CPC分类号: H01J35/153 , A61B6/4028 , A61B6/032 , H01J35/147 , G01N23/046 , H01J2235/086
摘要: Systems/techniques that facilitate correction of intra-scan focal-spot displacement are provided. In various embodiments, a system can access a first gantry angle of a medical scanner. In various aspects, the system can determine a first displacement of a focal-spot of the medical scanner based on the first gantry angle, by referencing a mapping that correlates gantry angles to focal-spot displacements. In various instances, the system can compensate, via one or more focal-spot position adjusters of the medical scanner, for the first displacement.
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公开(公告)号:US20240298401A1
公开(公告)日:2024-09-05
申请号:US18650039
申请日:2024-04-29
发明人: Guoping ZHU , Jinglin WU , Tieshan ZHANG , Siming CHEN , Xu CHU
CPC分类号: H05G1/52 , H01J35/147 , H05G1/58
摘要: A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.
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