摘要:
An electron emitter can include: a plurality of elongate rungs connected together end to end from a first emitter end to a second emitter end in a plane so as to form a planar pattern; a plurality of corners, wherein each elongate rung is connected to another elongate rung through a corner having a corner apex and an opposite corner nadir; a first gap between adjacent non-connected elongate rungs, wherein the first gap extends from the first emitter end to a middle rung; a second gap between adjacent non-connected elongate rungs, wherein the second gap extends from the second emitter end to the middle rung, wherein the first gap does not intersect the second gap; and one or more cutouts at one or more of the corners of the plurality of corners between the corner apex and corner nadir or at the corner nadir.
摘要:
An x-ray source is described. During operation of the x-ray source, an electron source emits a beam of electrons. This beam of electrons is focused to a spot on a target by a magnetic focusing lens. In response to receiving the beam of focused electrons, the target provides a transmission source of x-rays. Moreover, a repositioning mechanism selectively repositions the beam of focused electrons to different locations on a surface of the target based on a feedback parameter associated with operation of the x-ray source. This feedback parameter may be based on: an intensity of the x-rays output by the x-ray source; a position of the x-rays output by the x-ray source; an elapsed time during operation of the x-ray source; a cross-sectional shape of the x-rays output by the x-ray source; and/or a spot size of the x-rays output by the x-ray source.
摘要:
A rapidly regulable high-voltage supply for the electrical focusing of an electron beam using a high-voltage final stage is provided. The high-voltage final stage includes a plurality of amplification elements that are interconnected in a series configuration with a first high-voltage connection, and a potential dividing chain including a series of potential dividing elements. The potential dividing chain is interconnected with the first high-voltage connection and has a signal interconnection with the plurality of amplification elements, so that when a voltage is applied across the potential dividing chain, a difference in voltages between a signal input to any amplification element of the plurality of amplification elements and a signal input to a next amplification element of the plurality of amplification elements has a same sign.
摘要:
During operation of an x-ray source, an electron source emits a beam of electrons. Moreover, a repositioning mechanism selectively repositions the beam of electrons on a surface of a target based on a feedback parameter, where a location of the beam of electrons on the surface of the target defines a spot size of x-rays output by the x-ray source. In response to receiving the beam of electrons, the target provides a transmission source of the x-rays. Furthermore, a beam-parameter detector provides the feedback parameter based on a physical characteristic associated with the beam of electrons and/or the x-rays output by the x-ray source. This physical characteristic may include: at least a portion of an optical spectrum emitted by the target, secondary electrons emitted by the target based on a cross-sectional shape of the beam of electrons; an intensity of the x-rays output by the target; and/or a current from the target.
摘要:
The invention relates to an X-ray tube, especially a microfocus X-ray tube (2), comprising means (18) for orienting an electron beam (10) towards a target (4). A control device (20) is used to control the means for orienting the electron beam (10) towards the target (4) in such a way that the electron beam (10) scans the target (4), in addition to a measuring device (22) for measuring the intensity of the target current which flows to different scanning sites when the target (4) is scanned by the electron beam (10), or a measuring variable dependent on the target current, and an evaluation device (24) for associating each measured value of the target flow with the corresponding scanning site. Said X-ray tube enables the easy and economical implementation of a method for checking the operability of the target (4).
摘要:
An X-ray tube includes: a Wehnelt electrode having a dent inside; a filament arranged in the dent of the Wehnelt electrode and configured to emit an electron beam when electricity is passed therethrough; an anode configured to emit an X-ray in response to the incident electron beam; an electrode part configured by at least one pair of electrode members, the electrode members facing each other across a path of the electron beam, a voltage being applied to each of the electrode members; a voltage controller configured to control the voltage applied to the electrode part; and a shield member arranged in contact with the Wehnelt electrode and configured to cover part of the dent by a projecting part.
摘要:
An x-ray source is described. This x-ray source includes an electron source with a refractory binary compound having a melting temperature greater than that of tungsten. For example, the refractory binary compound may include: hafnium carbide, zirconium carbide, tantalum carbide, lanthanum hexaboride and/or compounds that include two or more of these elements.
摘要:
An X-ray tube includes: a Wehnelt electrode having a dent inside; a filament arranged in the dent of the Wehnelt electrode and configured to emit an electron beam when electricity is passed therethrough; an anode configured to emit an X-ray in response to the incident electron beam; an electrode part configured by at least one pair of electrode members, the electrode members facing each other across a path of the electron beam, a voltage being applied to each of the electrode members; a voltage controller configured to control the voltage applied to the electrode part; and a shield member arranged in contact with the Wehnelt electrode and configured to cover part of the dent by a projecting part.
摘要:
Systems and methods for data acquisition in computed tomography (CT) applications are provided. The systems and methods are particularly adapted for scanning and acquiring/processing data in connection with high-power cone-beam CT applications. The electron beam is moved/scanned along the anode surface to multiple focal positions. Data acquisition for a full projection at one focus position and one view angle is achieved by activating each focus position multiple times during the data acquisition for one angle of the gantry. The detector array and associated data processing system are adapted to rapidly switch between the different focus positions during the acquisitions for one view angle and to collect all data belonging to the same projection into the same data set. Adaptive electron optics are utilized to move/scan the electron beam along the anode surface to the various focus positions. Alternatively, a plurality of cathodes may be provided for respective focus positions and the system may support fast switching therebetween to achieve desirably short spot times. The disclosed CT system permits greater power densities without risk of heat damage to the anode and effectively increases the track velocity of the electron beam on the anode surface. The CT system and associated data acquisition methods have particular utility in CT applications requiring increased time resolution and/or spatial resolution, e.g., cardiac CT applications.
摘要:
In a method for stabilizing the size of a focal spot of an X-ray tube and contrast modulation function of a X-ray tube, the tube has a cathode comprising a concentrator and a heating filament. It has an anode is placed so as to be facing the cathode. With the filament, the cathode produces an electron beam bombarding the focal spot of the anode. A bias voltage is applied between a terminal of the filament and a terminal of the concentrator. The tube has means to measure the size of the focal spot and the function of contrast modulation. It also has means to regulate the size of the focal spot and the contrast modulation function by means of a bias voltage.