公开(公告)号：US11507816B2

公开(公告)日：2022-11-22

申请号：US16576533

申请日：2019-09-19

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G06N3/063 ,  G06F17/16 ,  G11C11/54 ,  G11C11/56

Abstract: Numerous embodiments of a precision tuning algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.

公开(公告)号：US20220336020A1

公开(公告)日：2022-10-20

申请号：US17850447

申请日：2022-06-27

Applicant: Silicon Storage Technology, Inc.

Inventor： Steven Lemke ,  Hieu Van Tran ,  Yuri Tkachev ,  Louisa Schneider ,  Henry A. Om'mani ,  Thuan Vu ,  Nhan Do ,  Vipin Tiwari

IPC: G11C16/10 ,  G06N3/063 ,  G11C16/26 ,  G11C16/14

Abstract: Examples for ultra-precise tuning of a selected memory cell are disclosed. In one example, a method of programming a first memory cell in a neural memory to a target value is disclosed, the method comprising programming a second memory cell by applying programming voltages to terminals of the second memory cell; and determining if an output of the first memory cell has reached the target value.

公开(公告)号：US20220320125A1

公开(公告)日：2022-10-06

申请号：US17845782

申请日：2022-06-21

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Hung Quoc Nguyen ,  Nhan Do

IPC: H01L27/11526 ,  H01L27/11519 ,  H01L27/11521 ,  G11C16/04 ,  G11C16/14 ,  G11C16/26 ,  H01L29/423 ,  H01L29/788

Abstract: A memory device with memory cell pairs each having a single continuous channel region, first and second floating gates over first and second portions of the channel region, an erase gate over a third portion of the channel region between the first and second channel region portions, and first and second control gates over the first and second floating gates. For each of the pairs of memory cells, the first region is electrically connected to the second region of an adjacent pair of memory cells in the same active region, and the second region is electrically connected to the first region of an adjacent pair of the memory cells in the same active region.

公开(公告)号：US11443175B2

公开(公告)日：2022-09-13

申请号：US16150606

申请日：2018-10-03

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/063 ,  G11C11/56 ,  G06N3/04 ,  G06F3/06 ,  G06F17/16 ,  G06N3/08 ,  G11C13/00 ,  G11C16/04 ,  G11C16/28

Abstract: Numerous embodiments are disclosed for compensating for differences in the slope of the current-voltage characteristic curve among reference transistors, reference memory cells, and flash memory cells during a read operation in an analog neural memory in a deep learning artificial neural network. The embodiments are able to compensate for slope differences during both sub-threshold and linear operation of reference transistors.

公开(公告)号：US11423979B2

公开(公告)日：2022-08-23

申请号：US16503355

申请日：2019-07-03

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Stephen Trinh ,  Anh Ly ,  Han Tran ,  Kha Nguyen ,  Hien Pham

IPC: G11C11/56 ,  G11C11/16 ,  G06N3/06 ,  G11C11/4074 ,  G06F17/16

Abstract: Various embodiments of word line decoders, control gate decoders, bit line decoders, low voltage row decoders, and high voltage row decoders and various types of physical layout designs for non-volatile flash memory arrays in an analog neural system are disclosed. Shared and segmented embodiments of high voltage row decoders are disclosed.

公开(公告)号：US20220215239A1

公开(公告)日：2022-07-07

申请号：US17219352

申请日：2021-03-31

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Nghia Le ,  Toan Le ,  Hien Pham

IPC: G06N3/063 ,  G11C16/10 ,  G11C16/34 ,  G06F7/523 ,  H03M1/38

Abstract: Numerous embodiments for reading or verifying a value stored in a selected non-volatile memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The embodiments comprise various designs of input blocks for applying inputs to the VMM array during a read or verify operation and various designs of output blocks for receiving outputs from the VMM array during the read or verify operation.

公开(公告)号：US11308383B2

公开(公告)日：2022-04-19

申请号：US15594439

申请日：2017-05-12

Applicant: Silicon Storage Technology, Inc. ,  The Regents of the University of California

Inventor： Farnood Merrikh Bayat ,  Xinjie Guo ,  Dmitri Strukov ,  Nhan Do ,  Hieu Van Tran ,  Vipin Tiwari ,  Mark Reiten

IPC: G06N3/04 ,  G06N3/063 ,  G06F3/06

Abstract: An artificial neural network device that utilizes one or more non-volatile memory arrays as the synapses. The synapses are configured to receive inputs and to generate therefrom outputs. Neurons are configured to receive the outputs. The synapses include a plurality of memory cells, wherein each of the memory cells includes spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over and insulated from a first portion of the channel region and a non-floating gate disposed over and insulated from a second portion of the channel region. Each of the plurality of memory cells is configured to store a weight value corresponding to a number of electrons on the floating gate. The plurality of memory cells are configured to multiply the inputs by the stored weight values to generate the outputs.

公开(公告)号：US11270771B2

公开(公告)日：2022-03-08

申请号：US16382051

申请日：2019-04-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G11C11/54 ,  G11C16/10 ,  G11C16/04 ,  G11C16/26 ,  G06N3/04 ,  G11C14/00 ,  G06N3/063 ,  H01L27/115 ,  H01L27/11521

Abstract: A neural network device with synapses having memory cells each having source and drain regions in a semiconductor substrate with a channel region extending there between, a floating gate over an entirety of the channel region, and a first gate over the floating gate. First lines each electrically connect together the first gates in one of the memory cell rows, second lines each electrically connect together the source regions in one of the memory cell rows, and third lines each electrically connect together the drain regions in one of the memory cell columns. The synapses are configured to receive a first plurality of inputs as electrical voltages on the first lines or on the second lines, and to provide a first plurality of outputs as electrical currents on the third lines.

公开(公告)号：US20220067499A1

公开(公告)日：2022-03-03

申请号：US17190376

申请日：2021-03-02

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran

IPC: G06N3/063 ,  G11C11/40 ,  G06F7/523

Abstract: Numerous embodiments of analog neural memory systems that enable concurrent write and verify operations are disclosed. In some embodiments, concurrent operations occur among different banks of memory. In other embodiments, concurrent operations occur among different blocks of memory, where each block comprises two or more banks of memory. The embodiments substantially reduce the timing overhead for weight writing and verifying operations in analog neural memory systems.

公开(公告)号：US11188237B2

公开(公告)日：2021-11-30

申请号：US16228313

申请日：2018-12-20

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G06F3/06 ,  G11C16/28 ,  G11C7/06 ,  G11C29/48 ,  G11C29/02 ,  G11C29/18 ,  G06F11/07 ,  G11C16/04 ,  G11C16/08 ,  G11C16/10 ,  G11C16/26 ,  G11C16/34 ,  H01L21/78 ,  H01L27/11521 ,  H01L29/423 ,  G11C29/04 ,  G11C29/12 ,  G11C29/44 ,  H01L23/00

Abstract: Multiple embodiments are disclosed for enhancing security and preventing hacking of a flash memory device. The embodiments prevent malicious actors from hacking a flash memory chip to obtain data that is stored within the chip. The embodiments include the use of fault detection circuits, address scrambling, dummy arrays, password protection, improved manufacturing techniques, and other mechanisms.