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231.
公开(公告)号:US20220215239A1
公开(公告)日:2022-07-07
申请号:US17219352
申请日:2021-03-31
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Nghia Le , Toan Le , Hien Pham
Abstract: Numerous embodiments for reading or verifying a value stored in a selected non-volatile memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The embodiments comprise various designs of input blocks for applying inputs to the VMM array during a read or verify operation and various designs of output blocks for receiving outputs from the VMM array during the read or verify operation.
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公开(公告)号:US11308383B2
公开(公告)日:2022-04-19
申请号:US15594439
申请日:2017-05-12
Inventor: Farnood Merrikh Bayat , Xinjie Guo , Dmitri Strukov , Nhan Do , Hieu Van Tran , Vipin Tiwari , Mark Reiten
Abstract: An artificial neural network device that utilizes one or more non-volatile memory arrays as the synapses. The synapses are configured to receive inputs and to generate therefrom outputs. Neurons are configured to receive the outputs. The synapses include a plurality of memory cells, wherein each of the memory cells includes spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over and insulated from a first portion of the channel region and a non-floating gate disposed over and insulated from a second portion of the channel region. Each of the plurality of memory cells is configured to store a weight value corresponding to a number of electrons on the floating gate. The plurality of memory cells are configured to multiply the inputs by the stored weight values to generate the outputs.
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公开(公告)号:US11270771B2
公开(公告)日:2022-03-08
申请号:US16382051
申请日:2019-04-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C11/54 , G11C16/10 , G11C16/04 , G11C16/26 , G06N3/04 , G11C14/00 , G06N3/063 , H01L27/115 , H01L27/11521
Abstract: A neural network device with synapses having memory cells each having source and drain regions in a semiconductor substrate with a channel region extending there between, a floating gate over an entirety of the channel region, and a first gate over the floating gate. First lines each electrically connect together the first gates in one of the memory cell rows, second lines each electrically connect together the source regions in one of the memory cell rows, and third lines each electrically connect together the drain regions in one of the memory cell columns. The synapses are configured to receive a first plurality of inputs as electrical voltages on the first lines or on the second lines, and to provide a first plurality of outputs as electrical currents on the third lines.
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公开(公告)号:US20220067499A1
公开(公告)日:2022-03-03
申请号:US17190376
申请日:2021-03-02
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran
Abstract: Numerous embodiments of analog neural memory systems that enable concurrent write and verify operations are disclosed. In some embodiments, concurrent operations occur among different banks of memory. In other embodiments, concurrent operations occur among different blocks of memory, where each block comprises two or more banks of memory. The embodiments substantially reduce the timing overhead for weight writing and verifying operations in analog neural memory systems.
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公开(公告)号:US11188237B2
公开(公告)日:2021-11-30
申请号:US16228313
申请日:2018-12-20
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Vipin Tiwari , Nhan Do
IPC: G06F3/06 , G11C16/28 , G11C7/06 , G11C29/48 , G11C29/02 , G11C29/18 , G06F11/07 , G11C16/04 , G11C16/08 , G11C16/10 , G11C16/26 , G11C16/34 , H01L21/78 , H01L27/11521 , H01L29/423 , G11C29/04 , G11C29/12 , G11C29/44 , H01L23/00
Abstract: Multiple embodiments are disclosed for enhancing security and preventing hacking of a flash memory device. The embodiments prevent malicious actors from hacking a flash memory chip to obtain data that is stored within the chip. The embodiments include the use of fault detection circuits, address scrambling, dummy arrays, password protection, improved manufacturing techniques, and other mechanisms.
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236.
公开(公告)号:US20210334639A1
公开(公告)日:2021-10-28
申请号:US17367542
申请日:2021-07-05
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran
Abstract: Numerous embodiments are disclosed for programmable output blocks for use with a VMM array within an artificial neural network. In one embodiment, the gain of an output block can be configured by a configuration signal. In another embodiment, the resolution of an ADC in the output block can be configured by a configuration signal.
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237.
公开(公告)号:US20210264983A1
公开(公告)日:2021-08-26
申请号:US16985147
申请日:2020-08-04
Applicant: Silicon Storage Technology, Inc.
Inventor: Steven Lemke , Hieu Van Tran , Yuri Tkachev , Louisa Schneider , Henry A. Om'Mani , Thuan Vu , Nhan Do , Vipin Tiwari
Abstract: Embodiments for ultra-precise tuning of a selected memory cell are disclosed. The selected memory cell optionally is first programmed using coarse programming and fine programming methods. The selected memory cell then undergoes ultra-precise programming through the programming of an adjacent memory cell. As the adjacent memory cell is programmed, capacitive coupling between the floating gate of the adjacent memory cell and the floating gate of the selected memory cell will cause the voltage of the floating gate of the selected memory cell to increase, but in smaller increments than could be achieved by programming the selected memory cell directly. In this manner, the selected memory cell can be programmed with ultra-precise gradations.
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公开(公告)号:US20210241839A1
公开(公告)日:2021-08-05
申请号:US17239397
申请日:2021-04-23
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Anh Ly , Thuan Vu
Abstract: The present invention relates to a flash memory cell with only four terminals and a high voltage row decoder for operating an array of such flash memory cells. The invention allows for fewer terminals for each flash memory cell compared to the prior art, which results in a simplification of the decoder circuitry and overall die space required per flash memory cells. The invention also provides for the use of high voltages on one or more of the four terminals to allow for read, erase, and programming operations despite the lower number of terminals compared to prior art flash memory cells.
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239.
公开(公告)号:US20210142156A1
公开(公告)日:2021-05-13
申请号:US16751202
申请日:2020-01-23
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G06N3/063 , G06N3/04 , G06F17/16 , G11C16/04 , G11C16/10 , G11C16/14 , G11C16/34 , G11C16/26 , G11C11/56
Abstract: Numerous embodiments of a precision programming algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.
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240.
公开(公告)号:US20210098477A1
公开(公告)日:2021-04-01
申请号:US17121555
申请日:2020-12-14
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , STEVEN LEMKE , VIPIN TIWARI , NHAN DO , MARK REITEN
IPC: H01L27/11531 , G06N3/08 , G11C16/04 , H01L29/788
Abstract: Numerous embodiments for reading a value stored in a selected memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one embodiment, an input comprises a set of input bits that result in a series of input pulses applied to a terminal of the selected memory cell, further resulting in a series of output signals that are summed to determine the value stored in the selected memory cell. In another embodiment, an input comprises a set of input bits, where each input bit results in a single pulse or no pulse being applied to a terminal of the selected memory cell, further resulting in a series of output signals which are then weighted according to the binary bit location of the input bit, and where the weighted signals are then summed to determine the value stored in the selected memory cell.
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