SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20210082853A1

    公开(公告)日:2021-03-18

    申请号:US16573672

    申请日:2019-09-17

    Abstract: A semiconductor package structure includes a semiconductor die surface having a narrower pitch region and a wider pitch region adjacent to the narrower pitch region, a plurality of first type conductive pillars in the narrower pith region, each of the first type conductive pillars having a copper-copper interface, and a plurality of second type conductive pillars in the wider pitch region, each of the second type conductive pillars having a copper-solder interface. A method for manufacturing the semiconductor package structure described herein is also disclosed.

    MEASUREMENT EQUIPMENT
    26.
    发明申请
    MEASUREMENT EQUIPMENT 有权
    测量设备

    公开(公告)号:US20150211852A1

    公开(公告)日:2015-07-30

    申请号:US14167786

    申请日:2014-01-29

    CPC classification number: G01C11/04 G01B11/245 G01B2210/56

    Abstract: The measurement equipment includes a rack, a first image capturing device, a second image capturing device, a third image capturing device and a fourth image capturing device. Wherein, the first image capturing device and the second image capturing device capture an entire image of a to-be-measured object, the third image capturing device and the fourth image capturing device capture a plurality of local images of a plurality of local areas of the to-be-measured object, and the entire image and the local images and are simultaneously captured.

    Abstract translation: 测量设备包括机架,第一图像捕获设备,第二图像捕获设备,第三图像捕获设备和第四图像捕获设备。 其中,第一图像拍摄装置和第二图像拍摄装置捕获要被测量对象的整个图像,第三图像拍摄装置和第四图像拍摄装置捕获多个局部区域的多个局部区域 待测物体以及整个图像和局部图像并被同时捕获。

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