Implementing local evaluation of domino read SRAM with enhanced SRAM cell stability with minimized area usage
    22.
    发明授权
    Implementing local evaluation of domino read SRAM with enhanced SRAM cell stability with minimized area usage 失效
    实现对多米诺骨牌SRAM的局部评估,具有增强的SRAM单元稳定性,同时最小化区域使用率

    公开(公告)号:US07724586B2

    公开(公告)日:2010-05-25

    申请号:US12195151

    申请日:2008-08-20

    IPC分类号: G11C7/06 G06F17/50

    CPC分类号: G11C11/413

    摘要: A method and circuit for implementing domino static random access memory (SRAM) local evaluation with enhanced SRAM cell stability, and a design structure on which the subject circuit resides are provided. A SRAM local evaluation circuit enabling a read and write operations of an associated SRAM cell group includes true and complement bitlines, true and complement write data propagation inputs, a precharge signal, and a precharge write signal. A respective precharge device is connected between a voltage supply VDD and the true bitline and the complement bitline. A first passgate device is connected between the complement bitline and the true write data propagation input. A second passgate device is connected between the true bitline and the complement write data propagation input. The precharge write signal disables the passgate devices during a read operation. During write operations, the precharge write signal enables the passgate devices.

    摘要翻译: 一种用于实现具有增强的SRAM单元稳定性的多米诺骨牌静态随机存取存储器(SRAM)局部评估的方法和电路,以及提供主题电路所在的设计结构。 实现相关SRAM单元组的读和写操作的SRAM本地评估电路包括真和补补位线,真和补写写数据传播输入,预充电信号和预充电写信号。 相应的预充电装置连接在电压源VDD与真位线和补码位线之间。 第一传递门装置连接在补码位线和真实写入数据传播输入端之间。 第二个通路装置连接在真位线和补码写入数据传播输入之间。 在读取操作期间,预充电写信号禁用通路器件。 在写入操作期间,预充电写入信号使能通路装置。

    Implementing Local Evaluation of Domino Read SRAM With Enhanced SRAM Cell Stability and Enhanced Area Usage
    23.
    发明申请
    Implementing Local Evaluation of Domino Read SRAM With Enhanced SRAM Cell Stability and Enhanced Area Usage 失效
    实现具有增强的SRAM单元稳定性和增强区域使用的Domino读取SRAM的本地评估

    公开(公告)号:US20100046278A1

    公开(公告)日:2010-02-25

    申请号:US12195151

    申请日:2008-08-20

    IPC分类号: G11C11/00 G11C7/00

    CPC分类号: G11C11/413

    摘要: A method and circuit for implementing domino static random access memory (SRAM) local evaluation with enhanced SRAM cell stability, and a design structure on which the subject circuit resides are provided. A SRAM local evaluation circuit enabling a read and write operations of an associated SRAM cell group includes true and complement bitlines, true and complement write data propagation inputs, a precharge signal, and a precharge write signal. A respective precharge device is connected between a voltage supply VDD and the true bitline and the complement bitline. A first passgate device is connected between the complement bitline and the true write data propagation input. A second passgate device is connected between the true bitline and the complement write data propagation input. The precharge write signal disables the passgate devices during a read operation. During write operations, the precharge write signal enables the passgate devices.

    摘要翻译: 一种用于实现具有增强的SRAM单元稳定性的多米诺骨牌静态随机存取存储器(SRAM)局部评估的方法和电路,以及提供主题电路所在的设计结构。 实现相关SRAM单元组的读和写操作的SRAM本地评估电路包括真和补补位线,真和补写写数据传播输入,预充电信号和预充电写信号。 相应的预充电装置连接在电压源VDD与真位线和补码位线之间。 第一传递门装置连接在补码位线和真实写入数据传播输入端之间。 第二个通路装置连接在真位线和补码写入数据传播输入之间。 在读取操作期间,预充电写信号禁用通路器件。 在写入操作期间,预充电写入信号使能通路装置。

    Apparatus for implementing domino SRAM leakage current reduction
    26.
    发明授权
    Apparatus for implementing domino SRAM leakage current reduction 失效
    实现多米诺SRAM漏电流减少的装置

    公开(公告)号:US07715221B2

    公开(公告)日:2010-05-11

    申请号:US12143864

    申请日:2008-06-23

    IPC分类号: G11C11/00

    摘要: A method and apparatus implementing domino static random access memory (SRAM) leakage current reduction include a local evaluation circuit coupled to true and complement bit lines of a pair of local SRAM cell groups, receives precharge signals and provides an output connected to a global dot line. A sleep input is applied to SRAM sleep logic and a write driver including sleep control. Data true and data complement outputs of the write driver are forced to a respective selected level to discharge the bit lines and global dot lines when the sleep input transitions high. Discharging the bit lines and global dot lines is implemented through gating in the write driver without requiring any additional devices in the local evaluation circuit.

    摘要翻译: 实现多米诺骨牌静态随机存取存储器(SRAM)泄漏电流降低的方法和装置包括耦合到一对本地SRAM单元组的真和补位线的局部评估电路,接收预充电信号并提供连接到全局点线 。 休眠输入被应用于SRAM休眠逻辑和包括睡眠控制的写入驱动器。 当睡眠输入转变为高电平时,写入驱动器的数据真实和数据补码输出被强制到相应的选定电平以放电位线和全局点线。 通过写入驱动器中的选通来实现位线和全局点线的放电,而不需要本地评估电路中的任何额外的器件。

    APPARATUS FOR IMPLEMENTING DOMINO SRAM LEAKAGE CURRENT REDUCTION
    27.
    发明申请
    APPARATUS FOR IMPLEMENTING DOMINO SRAM LEAKAGE CURRENT REDUCTION 失效
    用于实现多米诺SRAM漏电流减少的装置

    公开(公告)号:US20080273402A1

    公开(公告)日:2008-11-06

    申请号:US12143864

    申请日:2008-06-23

    IPC分类号: G11C7/00 G11C5/14

    摘要: A method and apparatus implementing domino static random access memory (SRAM) leakage current reduction include a local evaluation circuit coupled to true and complement bit lines of a pair of local SRAM cell groups, receives precharge signals and provides an output connected to a global dot line. A sleep input is applied to SRAM sleep logic and a write driver including sleep control. Data true and data complement outputs of the write driver are forced to a respective selected level to discharge the bit lines and global dot lines when the sleep input transitions high. Discharging the bit lines and global dot lines is implemented through gating in the write driver without requiring any additional devices in the local evaluation circuit.

    摘要翻译: 实现多米诺骨牌静态随机存取存储器(SRAM)泄漏电流降低的方法和装置包括耦合到一对本地SRAM单元组的真和补位线的局部评估电路,接收预充电信号并提供连接到全局点线 。 休眠输入被应用于SRAM休眠逻辑和包括睡眠控制的写入驱动器。 当睡眠输入转变为高电平时,写入驱动器的数据真实和数据补码输出被强制到相应的选定电平以放电位线和全局点线。 通过写入驱动器中的选通来实现位线和全局点线的放电,而不需要本地评估电路中的任何额外的器件。

    ROM load balancing for bit lines
    28.
    发明授权
    ROM load balancing for bit lines 有权
    ROM负载平衡的位线

    公开(公告)号:US07218543B2

    公开(公告)日:2007-05-15

    申请号:US11232767

    申请日:2005-09-22

    IPC分类号: G11C17/00

    CPC分类号: G11C17/18 G11C7/12 G11C7/18

    摘要: An apparatus and method to improve a cycle time of a Read Only Memory (ROM). Loading of each bit line is controlled such that no bit line has less than a specified loading fraction of a loading of a maximally loaded bit line. No additional space or additional circuitry is required. Four NFET pair arrangements are personalizable by via placement by a designer or design automation program. One of the NFET pair arrangements is usable to pad load on a bit line without altering a logical personalization of the bit line. Proper selection from the four NFET pair arrangements ensure that no bit line has less than the specified loading fraction of the loading of the maximally loaded bit line, as well as providing proper logical personality of the bit line.

    摘要翻译: 一种用于改善只读存储器(ROM)的周期时间的装置和方法。 控制每个位线的加载使得没有位线小于装载最大负载位线的指定负载分数。 不需要额外的空间或额外的电路。 四个NFET对安排可以通过设计者或设计自动化程序的放置来个性化。 NFET对布置中的一个可用于在位线上填充负载而不改变位线的逻辑个性化。 来自四个NFET对布置的适当选择确保没有位线小于最大负载位线的负载的指定负载分数,以及提供位线的适当逻辑个性。

    Array redundancy supporting multiple independent repairs
    29.
    发明授权
    Array redundancy supporting multiple independent repairs 失效
    支持多个独立维修的阵列冗余

    公开(公告)号:US07206236B1

    公开(公告)日:2007-04-17

    申请号:US11330693

    申请日:2006-01-12

    IPC分类号: G11C29/00

    CPC分类号: G11C29/848

    摘要: Arrays such as SRAMs, DRAMs, CAMs & Programmable ROMs having multiple independent failures are repaired using redundant bit lines. A first embodiment provides redundant bit lines on one side of the array. During a write, data is shifted towards the redundant bit lines on the one side of the array, bypassing failed bit lines. A second embodiment provides a spare bit line on each side of the array. During a write, a first failing bit line is replaced by a first spare bit line on a first side of the array, and a second failing bit line is replaced by a second spare bit line on a second side of the array.

    摘要翻译: 使用冗余位线修复具有多个独立故障的诸如SRAM,DRAM,CAM和可编程ROM的阵列。 第一实施例在阵列的一侧提供冗余位线。 在写入期间,数据将朝着阵列一侧的冗余位线移动,绕过故障位线。 第二实施例在阵列的每一侧提供备用位线。 在写入期间,第一故障位线由阵列的第一侧上的第一备用位线替代,并且第二故障位线被阵列的第二侧上的第二备用位线替代。

    Pulse generator circuit and semiconductor device including same
    30.
    发明授权
    Pulse generator circuit and semiconductor device including same 失效
    脉冲发生器电路和包括它的半导体器件

    公开(公告)号:US07015600B2

    公开(公告)日:2006-03-21

    申请号:US10268287

    申请日:2002-10-10

    IPC分类号: H03K3/00 H03K3/64 G06F1/12

    CPC分类号: H03K5/06 H03K5/133

    摘要: A pulse generator circuit is disclosed including a delay element coupled to a logic circuit. The delay element receives a clock signal CLK and a signal X and produces a signal XN dependent upon the clock signal CLK and the signal X. The logic circuit receives the clock signal CLK and the signal XN and produces a signal ACLK such that ACLK=CLK·XN′. The signal ACLK may include a series of positive pulses. The delay element may be, for example, one of multiple delay elements coupled in series, and signal X may be an output of a preceding one of the delay elements. A semiconductor device is described including the above pulse generator circuit and a self-resetting logic circuit. The self-resetting logic circuit receives the signal ACLK and one or more input signals and performs a logic operation using the one or more input signals during the positive pulses. The semiconductor device may include, for example, a random access memory (RAM) device, and the self-resetting logic circuit may form a part of a decoder circuit of the RAM device.

    摘要翻译: 公开了一种脉冲发生器电路,其包括耦合到逻辑电路的延迟元件。 延迟元件接收时钟信号CLK和信号X,并产生取决于时钟信号CLK和信号X的信号XN。逻辑电路接收时钟信号CLK和信号XN,并产生信号ACLK,使得ACLK = CLK .XN'。 信号ACLK可以包括一系列正脉冲。 延迟元件可以是例如串联耦合的多个延迟元件中的一个,并且信号X可以是先前的一个延迟元件的输出。 描述了包括上述脉冲发生器电路和自复位逻辑电路的半导体器件。 自复位逻辑电路接收信号ACLK和一个或多个输入信号,并在正脉冲期间使用一个或多个输入信号执行逻辑运算。 半导体器件可以包括例如随机存取存储器(RAM)器件,并且自复位逻辑电路可以形成RAM器件的解码器电路的一部分。