公开(公告)号：US4401518A

公开(公告)日：1983-08-30

申请号：US231689

申请日：1981-02-05

Applicant: Helmut Fischer ,  Willi Steegmuller

Inventor： Helmut Fischer ,  Willi Steegmuller

IPC: G01B7/06 ,  G01N27/416 ,  G01N27/26 ,  G01N27/28

CPC classification number: G01B7/06 ,  G01N27/4161

Abstract: An electrolyte chamber has an opening on the side facing the foil to be measured for letting the electrolyte through to the foil, a hollow cathode in the chamber, a supply line connected to the chamber through the hollow cathode for supplying the electrolyte to the chamber, and a negative pressure flow-off line connected to the chamber located at a distance from the mouth of the supply line. A negative pressure generator is connected to the flow-off line through a separator vessel which has a level switch which shuts off the generator when the electrolyte reaches a predetermined level. The supply line is connected to a supply vessel containing the electrolyte and runs continuously into the liquid volume in the vessel. The vessel has a connection to the atmosphere.

Abstract translation: 电解质室在面向待测量的箔的一侧上具有开口，用于使电解质通过箔，腔室中的中空阴极，通过空心阴极连接到室的供应线，用于将电解质供应到室， 以及连接到位于距离供给管嘴的一定距离处的室的负压流出线。 负压发生器通过分离器容器连接到流出线路，分离器容器具有在电解液达到预定水平时切断发电机的液位开关。 供应管线连接到容纳电解质的供应容器，并连续运行到容器中的液体容积中。 船只与大气连接。

公开(公告)号：US4293767A

公开(公告)日：1981-10-06

申请号：US69610

申请日：1979-08-24

Applicant: Helmut Fischer ,  Albert Ott ,  Willi Steegmuller

Inventor： Helmut Fischer ,  Albert Ott ,  Willi Steegmuller

IPC: G01N23/203 ,  G01N23/00

CPC classification number: G01N23/203

Abstract: The apparatus measures the thickness of thin layers on strips and wires which are moved relative to the apparatus. The apparatus is stationary and includes one or more beta emitters directed towards the layer and spatially arranges relative to the longitudinal axis of a beta radiation detector or counting tube which is arranged to the rear of the beta emitter for counting the backscattered beta radiation, and a guide for the strip or wire at a specified distance from the beta emitter. The ratio of the characteristic cross-sectional dimension (D) of the window of the beta radiation detector to the intersecting surface diameter (d) of the intersecting surface layer/intensity distribution curve of the beta emitter, being expressed as D/d=15 . . . 2; with the distance between the layer and the beta radiation emitter being in the plateau region of the curve of the counting rate/distance characteristic obtained by the above feature.

Abstract translation: 该装置测量相对于装置移动的条和线上的薄层的厚度。 该装置是静止的并且包括一个或多个指向该层的β发射体，并相对于β辐射检测器或计数管的纵向轴线在空间上布置，该β辐射检测器或计数管被布置到用于计数背散射β辐射的β发射器的后部， 在距离beta发射器一定距离处的条或导线的引导。 β辐射检测器的窗口的特征截面尺寸（D）与β发射体的相交表面层/强度分布曲线的交叉表面直径（d）的比值表示为D / d = 15 。 。 。 2; 其中层和β辐射发射器之间的距离在通过上述特征获得的计数速率/距离特性的曲线的平台区域中。

公开(公告)号：US4025169A

公开(公告)日：1977-05-24

申请号：US671129

申请日：1976-03-29

Applicant: Helmut Fischer ,  Erhard Glatzel ,  Walter Jahn ,  Heinz Zajadatz

Inventor： Helmut Fischer ,  Erhard Glatzel ,  Walter Jahn ,  Heinz Zajadatz

IPC: G02B9/64 ,  G02B13/04 ,  G02B13/18

CPC classification number: G02B9/64

Abstract: An extremely high speed wide angle objective lens system, wherein a reducing Newtonian finder telescope is arranged in front of an objective lens group which produces a real image on an image plane. Rules or conditions are stated, and several specific examples are given. In many of the examples, the back focus distance is relatively large, thus making the lens system suitable for use with a mirror reflex camera where room is needed for swinging the reflex mirror.

Abstract translation: 一种极高速度的广角物镜系统，其中在物镜组前方设置有还原牛顿型望远镜望远镜，该物镜组在图像平面上产生实像。 说明规则或条件，并给出了几个具体示例。 在许多示例中，后焦距距离相对较大，因此使得透镜系统适用于需要用于摆动反射镜的房间的镜面反射照相机。

公开(公告)号：US11385151B2

公开(公告)日：2022-07-12

申请号：US16070617

申请日：2017-01-09

Applicant: Helmut Fischer GmbH Institut für Elektronik und Messtechnik

Inventor： Helmut Fischer

IPC: G01N3/46

Abstract: A measuring device for detection pf measurement signals during a penetrating movement of a penetrating member into a surface of a test object or during a sensing movement of the penetrating member on the surface of the test object. The measuring device includes a housing which accommodates a force generating device and on which a holding element is arranged remote from the force generating device, which holding element is movable relative to the housing at least in one direction along a longitudinal axis of the housing and which accommodates the penetrating member. The measuring device also includes at least one first measuring element for measuring the penetration depth of the penetrating member into the surface of the test object or a traversing movement of the penetrating member along the longitudinal axis relative to the housing during a sensing movement on the surface of the test object, wherein a transmission element is provided which extends between the force generating device and the penetrating member.

公开(公告)号：US09857171B2

公开(公告)日：2018-01-02

申请号：US13066796

申请日：2011-04-25

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01R7/06 ,  G01B21/08 ,  G01B7/06

CPC classification number: G01B21/08 ,  G01B7/105

Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers on an object with a measuring head, which comprises at least one sensor element for contact on a measurement surface of an object, and with a support device for receiving the measuring head, which is at least partly surrounded by a housing, wherein at least one further measuring head, which is adjacent to and separated from the first measuring head, is arranged on the support device, which can be controlled independently of the first measuring head.

公开(公告)号：US20130240918A1

公开(公告)日：2013-09-19

申请号：US13823726

申请日：2011-07-27

Applicant: Siegfried Herrmann ,  Helmut Fischer

Inventor： Siegfried Herrmann ,  Helmut Fischer

IPC: H01L33/62 ,  H01L33/48

CPC classification number: H01L33/62 ,  H01L33/0079 ,  H01L33/38 ,  H01L33/48 ,  H01L33/486 ,  H01L33/647 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2924/01068 ,  H01L2933/0016 ,  H01S5/0217 ,  H01S5/02256 ,  H01L2924/00014

Abstract: The invention relates to an optoelectronic seminconductor component, comprising a substrate-free optoelectronic semiconductor chip (1), which has a first main surface (1a) on an upper face and a second main surface (1b) on a lower face, and a metal carrier (2), which is arranged on the lower face of the optoelectronic seminconductor chip (1), wherein the metal carrier (2) protrudes over the optoelectronic semiconductor chip (1) in at least one lateral direction (1) and the metal carrier (2) is deposited on the second main surface (1b) of the optoelectronic semiconductor chip (1) using a galvanic or electroless plating method.

Abstract translation: 本发明涉及一种光电半导体元件，它包括一个无衬底的光电半导体芯片（1），它在上表面上具有第一主表面（1a），在下表面上具有第二主表面（1b） 载体（2），其布置在光电半导体芯片（1）的下表面上，其中金属载体（2）在至少一个横向方向（1）上突出超过光电半导体芯片（1），并且金属载体 （2）使用电镀或无电镀方法沉积在光电半导体芯片（1）的第二主表面（1b）上。

公开(公告)号：US20120296519A1

公开(公告)日：2012-11-22

申请号：US13475313

申请日：2012-05-18

Applicant: Johannes Karl Eberharter ,  Klaus Schneider ,  Eugen Schobesberger ,  Helmut Fischer

Inventor： Johannes Karl Eberharter ,  Klaus Schneider ,  Eugen Schobesberger ,  Helmut Fischer

IPC: B63B27/10 ,  B66C13/16

CPC classification number: B63B27/10 ,  B66C13/02 ,  B66C23/52 ,  B66C23/905

Abstract: The present invention relates to a crane control for a crane arranged on a ship, having a load moment limitation system which determines a maximum permitted payload, wherein the load moment limitation system is in communication with a measuring unit for measuring the movement of the ship and determines the maximum permitted payload on the basis of data of the measuring unit.

Abstract translation: 本发明涉及一种布置在船上的起重机的起重机控制装置，具有确定最大允许有效载荷的负载力矩限制系统，其中负载力矩限制系统与用于测量船舶运动的测量单元相连通， 基于测量单元的数据确定最大允许有效载荷。

公开(公告)号：US20110271750A1

公开(公告)日：2011-11-10

申请号：US13068407

申请日：2011-05-10

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B21/08

CPC classification number: G01B7/105

Abstract: The invention relates to a method and a device for measuring the thickness of thin layers over large-area surfaces to be measured (12), in which at least one measuring probe (28), which comprises at least one sensor element (29) and at least one contact spherical cap (31) associated with the sensor element (29), is applied to the surface to be measured (12) in order to obtain a measured value, wherein the large-area surface to be measured (12) is subdivided into individual partial areas (14), a matrix of measurement points (16) is determined for each partial area (14) to be inspected, measured values are ascertained at equidistant measurement points (16) along at least one row (17) of the matrix of the partial area (14) using a device (21) carrying the at least one measuring probe (28), and the measured values are ascertained successively for all rows (17) in the matrix in the partial area (14) and evaluated for this partial area (14).

Abstract translation: 本发明涉及一种用于测量要测量的大面积表面（12）上的薄层的厚度的方法和装置，其中至少一个测量探针（28）包括至少一个传感器元件（29）和 将与传感器元件（29）相关联的至少一个接触球形盖（31）施加到被测量表面（12）以获得测量值，其中待测量的大面积表面（12）为 被分为单独的部分区域（14），对于要检查的每个部分区域（14）确定测量点（16）的矩阵，测量值沿着至少一行（17）的等距测量点（16）确定 使用承载至少一个测量探针（28）的装置（21）的部分区域（14）的矩阵以及在部分区域（14）中的矩阵中的所有行（17）连续地确定测量值，以及 评估该部分区域（14）。

公开(公告)号：US20110260721A1

公开(公告)日：2011-10-27

申请号：US13066797

申请日：2011-04-25

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B7/06 ,  G01D21/00

CPC classification number: G01B7/10 ,  G01B7/001 ,  G01B7/105 ,  G01B21/08

Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.

Abstract translation: 本发明涉及一种用于非破坏性地测量薄层厚度的测量探针，特别是在通过开口或弯曲表面可访问的空腔中，测量头包括至少一个传感器元件并且至少包括 分配给待检查的空腔中的传感器元件的一个接触球形盖，以及用于在测量表面上和/或沿着待测量表面定位和引导测量探针的夹持元件，其中在夹持元件上 提供了一种长而弹性屈服的导向杆，其在其与夹持元件相对的端部上接收至少一个测量头，使得其可相对于导向杆至少一个自由度移动。

公开(公告)号：US07323936B2

公开(公告)日：2008-01-29

申请号：US11128625

申请日：2005-05-13

Applicant: Rory Dickman ,  Helmut Fischer

Inventor： Rory Dickman ,  Helmut Fischer

IPC: H03F3/45 ,  G06G7/12

CPC classification number: H03F1/301 ,  H03F3/45183

Abstract: The present invention relates to an input circuit for receiving an input signal in an integrated circuit, having a differential amplifier whose first input can have a predetermined reference voltage applied to it and whose second input can have the input signal applied to it, and having a current source for operating the differential amplifier at its operating point, wherein a setting circuit is connected to the current source in order to set the operating point of the differential amplifier in an optimum manner on the basis of the predetermined reference voltage.

Abstract translation: 本发明涉及一种用于在集成电路中接收输入信号的输入电路，其具有差分放大器，该差分放大器的第一输入可以具有施加到其上的预定参考电压，并且其第二输入可以具有施加到其上的输入信号，并且具有 用于在其工作点操作差分放大器的电流源，其中设置电路连接到电流源，以便基于预定参考电压以最佳方式设置差分放大器的工作点。