Positional measurement system and lens for positional measurement
    21.
    发明申请
    Positional measurement system and lens for positional measurement 失效
    位置测量系统和位置测量镜头

    公开(公告)号:US20050185195A1

    公开(公告)日:2005-08-25

    申请号:US10940766

    申请日:2004-09-15

    申请人: Yasuji Seko

    发明人: Yasuji Seko

    CPC分类号: G01S5/16 G01B11/002

    摘要: A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.

    摘要翻译: 位置测量系统包括发射电磁波的电磁波源,具有第一透镜表面的透镜系统,围绕第一透镜表面的中心轴线设置的电磁波屏蔽部分和第二透镜表面,并且使得 通过第一透镜表面而不是电磁波屏蔽部分进入的电磁波从第二透镜表面离开,在与电磁波源相对的位置处形成电磁波集中区域,检测电磁波的接收装置 由透镜系统形成的集中区域,以及基于接收装置在电磁波集中区域检测出的信息来测量电磁波源的位置的计算装置。

    POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUTER READABLE MEDIUM
    22.
    发明申请
    POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUTER READABLE MEDIUM 有权
    位置测量系统,位置测量方法和计算机可读介质

    公开(公告)号:US20090070065A1

    公开(公告)日:2009-03-12

    申请号:US12099576

    申请日:2008-04-08

    IPC分类号: G06F15/00

    CPC分类号: G01B11/005 G01B11/26

    摘要: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.

    摘要翻译: 位置测量系统包括:摄像单元,其捕获作为在目标上布置的平面上的三个参考点和指定了彼此的位置关系的第一参考点,以及作为距离的单个参考点的第二参考点 指定与第一参考点的位置关系; 识别单元,基于图像之间的位置关系识别第一和第二参考点的图像; 以及计算单元,基于第一和第二参考点的图像之间的位置关系来计算目标的三维位置和三轴角度。 计算单元根据第二参考点的图像从第一参考点的图像和平面的法线方向指定包括目标上的第一参考点的平面。

    Position measurement system
    23.
    发明申请

    公开(公告)号:US20060215178A1

    公开(公告)日:2006-09-28

    申请号:US11206974

    申请日:2005-08-19

    IPC分类号: G01B11/14

    CPC分类号: G01B11/002

    摘要: A position measurement system includes a photographing unit and an arithmetic processing unit. The photographing unit has a lens and a light-receiving element. The lens forms an optical ring image from light from a light source through spherical aberration. The light-receiving element detects the optical ring image formed by the lens. The arithmetic processing unit measures a distance to the light source on the basis of the quantity of light of the optical ring image detected by the light-receiving element.

    Semiconductor device, surface emitting semiconductor laser and edge emitting semiconductor laser
    24.
    发明授权
    Semiconductor device, surface emitting semiconductor laser and edge emitting semiconductor laser 失效
    半导体器件,表面发射半导体激光器和边缘发射半导体激光器

    公开(公告)号:US06597017B1

    公开(公告)日:2003-07-22

    申请号:US09520188

    申请日:2000-03-07

    IPC分类号: H01L2715

    摘要: Provided is a semiconductor device that has pseudo lattice matched layers with good crystallinity, formed with lattice mismatched materials. Tensile-strained n-type Al0.5Ga0.5N layers (lower side) and compressive-strained n-type Ga0.9In0.1N layers (upper side) are grown on a GaN crystal layer substrate in 16.5 periods to form an n-type DBR mirror; an undoped GaN spacer layer and an active region are grown on the n-type DBR mirror; and an undoped a GaN spacer layer is grown on the active region. Further, tensile-strained p-type Al0.5Ga0.5N layers (lower side) and compressive-strained p-type Ga0.9In0.1N layers (upper side) are grown on the spacer layer in 12 periods to form a p-type DBR mirror and eventually complete a surface emitting semiconductor laser.

    摘要翻译: 提供具有晶格匹配层的具有良好结晶度的晶格匹配层的半导体器件,由晶格失配的材料形成。 拉伸应变n型Al0.5Ga0.5N层(下侧)和压应变n型Ga 0.9 In 0.1 N层(上侧)在16.5个周期内在GaN晶体层基板上生长以形成n型 DBR镜 在n型DBR镜上生长未掺杂的GaN间隔层和有源区; 并且在有源区上生长未掺杂的GaN间隔层。 此外,在间隔层中在12个时间段内生长拉伸应变的p型Al 0.5 Ga 0.5 N层(下侧)和压应变p型Ga 0.9 In 0.1 N层(上侧)以形成p型 DBR反射镜,最终完成表面发射半导体激光器。

    Semiconductor device and image formation apparatus using same
    25.
    发明授权
    Semiconductor device and image formation apparatus using same 失效
    半导体装置及使用该半导体装置的图像形成装置

    公开(公告)号:US06262540B1

    公开(公告)日:2001-07-17

    申请号:US09315134

    申请日:1999-05-20

    申请人: Yasuji Seko

    发明人: Yasuji Seko

    IPC分类号: G09G300

    CPC分类号: H01L27/156

    摘要: A semiconductor device includes a light-emitting element array including plural light-emitting elements and being formed on a semiconductor substrate, a switching element array formed on the semiconductor substrate monolithically with the light-emitting element array, and including switching elements laid out in a matrix form and each having an input end, an output end and a control end with one of the input end and the output end being connected to any one of the plural light-emitting elements, first connection means for connecting the control end of each of the plural switching elements disposed in the same column or the other of the input end and the output end thereof to a first external connection end different per the same column, and second connection means for connecting the control end of each of the plurality of switching elements disposed in the same column or one side of the other of the input end and the output end thereof not being connected to the first external connection end to a second external connection end different per the same row.

    摘要翻译: 半导体器件包括:包含多个发光元件并形成在半导体衬底上的发光元件阵列,与所述发光元件阵列整体形成在所述半导体衬底上的开关元件阵列,并且包括布置在所述发光元件阵列中的开关元件 矩阵形式,每个具有输入端,输出端和具有输入端和输出端中的一个的控制端连接到多个发光元件中的任一个,第一连接装置,用于连接多个发光元件中的每一个的控制端 所述多个开关元件配置在与所述列相同的第一外部连接端的输入端和输出端的同一列或另一个中,以及第二连接装置,用于连接所述多个开关元件中的每一个的控制端 设置在输入端的另一侧的相同列或一侧,其输出端未连接到第一外部连接 在第二个外部连接端到不同的同一行。

    Surface emitting semiconductor laser, its producing method and surface emitting semiconductor laser array
    26.
    发明授权
    Surface emitting semiconductor laser, its producing method and surface emitting semiconductor laser array 失效
    表面发射半导体激光器,其制造方法和表面发射半导体激光器阵列

    公开(公告)号:US06222866B1

    公开(公告)日:2001-04-24

    申请号:US08998624

    申请日:1997-12-29

    申请人: Yasuji Seko

    发明人: Yasuji Seko

    IPC分类号: H01S542

    摘要: A surface emitting semiconductor laser comprises a semiconductor multilayer reflecting film of a first conductivity type, a quantum well active layer having at least one quantum well structure, a semiconductor multilayer reflecting film of a second conductivity type and a contact layer of the second conductivity type sequentially stacked in a layered manner inside a concavity formed on a surface of a semiconductor substrate. The contact layer of the second conductivity type is formed in a buried manner so that the surface of the contact layer is approximately flush with the surface of the semiconductor substrate. A second electrode is formed on a part of the surface of the contact layer other than a part left for forming a light guiding region thereon.

    摘要翻译: 表面发射半导体激光器包括第一导电类型的半导体多层反射膜,具有至少一个量子阱结构的量子阱有源层,第二导电类型的半导体多层反射膜和第二导电类型的接触层顺序地 在形成在半导体基板的表面上的凹部内分层堆叠。 第二导电类型的接触层以掩埋的方式形成,使得接触层的表面与半导体衬底的表面大致齐平。 除了在其上形成导光区域的部分之外,在接触层的表面的一部分上形成第二电极。

    Longitudinal interference fringe pattern projection lens, optical system, and three-dimensional image acquisition apparatus
    27.
    发明授权
    Longitudinal interference fringe pattern projection lens, optical system, and three-dimensional image acquisition apparatus 有权
    纵向干涉条纹图案投影透镜,光学系统和三维图像采集装置

    公开(公告)号:US07830605B2

    公开(公告)日:2010-11-09

    申请号:US11750411

    申请日:2007-05-18

    申请人: Yasuji Seko

    发明人: Yasuji Seko

    摘要: A longitudinal interference fringe pattern projection lens with a lens body is provided. The lens body includes a lens first surface that has two convex portions or two concave portions that extend in parallel to each other in a constant direction and have the same shape, and a lens second surface. Laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.

    摘要翻译: 提供具有透镜体的纵向干涉条纹图案投影透镜。 透镜体包括透镜第一表面,其具有沿恒定方向彼此平行延伸并具有相同形状的两个凸部或两个凹部,以及透镜第二表面。 通过一个凸部或凹部的激光干涉通过另一个凸部或凹部的激光,形成纵向干涉条纹图案。

    POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUTER-READABLE MEDIUM
    28.
    发明申请
    POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUTER-READABLE MEDIUM 审中-公开
    位置测量系统,位置测量方法和计算机可读介质

    公开(公告)号:US20100231709A1

    公开(公告)日:2010-09-16

    申请号:US12545781

    申请日:2009-08-21

    IPC分类号: H04N7/18

    CPC分类号: G01B11/03

    摘要: A position measurement system includes a marker set attached to an object, a camera and a computing apparatus. The marker set includes three or more directed basic markers each having a shape indicating a direction. The directed basic markers are oriented in directions toward a specific point. A positional relationship among the directed basic markers is known. The camera includes a two-dimensional imaging device configured to take an image of the marker set. The computing apparatus computes at least one of a position of the object and an angle of the object based on an image, taken by the camera, of the directed basic markers, which are oriented in the directions toward the specific point.

    摘要翻译: 位置测量系统包括附接到物体的标记组,相机和计算装置。 标记组包括三个或更多个指向基本标记,每一个具有指示方向的形状。 有针对性的基本标记朝向特定点的方向。 有针对性的基本标记之间的位置关系是已知的。 相机包括被配置为拍摄标记集的图像的二维成像装置。 计算装置基于相机取得的图像,基于朝向特定点的方向定向的定向基本标记来计算物体的位置和物体的角度中的至少一个。

    Position measurement system
    29.
    发明申请

    公开(公告)号:US20090310142A1

    公开(公告)日:2009-12-17

    申请号:US12458867

    申请日:2009-07-24

    IPC分类号: G01B11/03

    CPC分类号: G01B11/002

    摘要: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.

    Optical lens system and position measurement system using the same
    30.
    发明授权
    Optical lens system and position measurement system using the same 有权
    光学透镜系统和位置测量系统使用相同

    公开(公告)号:US07274461B2

    公开(公告)日:2007-09-25

    申请号:US11013390

    申请日:2004-12-17

    申请人: Yasuji Seko

    发明人: Yasuji Seko

    IPC分类号: G01B9/02 G02B1/10 G02B13/22

    摘要: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.

    摘要翻译: 光学透镜系统包括能够在物体上形成同心干涉图案的透镜表面,就好像从单个光源发出的光从包含单个光源的光轴的平面内的两个或多个光源实际上发射出来。