摘要:
A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.
摘要:
The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.
摘要:
A position measurement system includes a photographing unit and an arithmetic processing unit. The photographing unit has a lens and a light-receiving element. The lens forms an optical ring image from light from a light source through spherical aberration. The light-receiving element detects the optical ring image formed by the lens. The arithmetic processing unit measures a distance to the light source on the basis of the quantity of light of the optical ring image detected by the light-receiving element.
摘要:
Provided is a semiconductor device that has pseudo lattice matched layers with good crystallinity, formed with lattice mismatched materials. Tensile-strained n-type Al0.5Ga0.5N layers (lower side) and compressive-strained n-type Ga0.9In0.1N layers (upper side) are grown on a GaN crystal layer substrate in 16.5 periods to form an n-type DBR mirror; an undoped GaN spacer layer and an active region are grown on the n-type DBR mirror; and an undoped a GaN spacer layer is grown on the active region. Further, tensile-strained p-type Al0.5Ga0.5N layers (lower side) and compressive-strained p-type Ga0.9In0.1N layers (upper side) are grown on the spacer layer in 12 periods to form a p-type DBR mirror and eventually complete a surface emitting semiconductor laser.
摘要翻译:提供具有晶格匹配层的具有良好结晶度的晶格匹配层的半导体器件,由晶格失配的材料形成。 拉伸应变n型Al0.5Ga0.5N层(下侧)和压应变n型Ga 0.9 In 0.1 N层(上侧)在16.5个周期内在GaN晶体层基板上生长以形成n型 DBR镜 在n型DBR镜上生长未掺杂的GaN间隔层和有源区; 并且在有源区上生长未掺杂的GaN间隔层。 此外,在间隔层中在12个时间段内生长拉伸应变的p型Al 0.5 Ga 0.5 N层(下侧)和压应变p型Ga 0.9 In 0.1 N层(上侧)以形成p型 DBR反射镜,最终完成表面发射半导体激光器。
摘要:
A semiconductor device includes a light-emitting element array including plural light-emitting elements and being formed on a semiconductor substrate, a switching element array formed on the semiconductor substrate monolithically with the light-emitting element array, and including switching elements laid out in a matrix form and each having an input end, an output end and a control end with one of the input end and the output end being connected to any one of the plural light-emitting elements, first connection means for connecting the control end of each of the plural switching elements disposed in the same column or the other of the input end and the output end thereof to a first external connection end different per the same column, and second connection means for connecting the control end of each of the plurality of switching elements disposed in the same column or one side of the other of the input end and the output end thereof not being connected to the first external connection end to a second external connection end different per the same row.
摘要:
A surface emitting semiconductor laser comprises a semiconductor multilayer reflecting film of a first conductivity type, a quantum well active layer having at least one quantum well structure, a semiconductor multilayer reflecting film of a second conductivity type and a contact layer of the second conductivity type sequentially stacked in a layered manner inside a concavity formed on a surface of a semiconductor substrate. The contact layer of the second conductivity type is formed in a buried manner so that the surface of the contact layer is approximately flush with the surface of the semiconductor substrate. A second electrode is formed on a part of the surface of the contact layer other than a part left for forming a light guiding region thereon.
摘要:
A longitudinal interference fringe pattern projection lens with a lens body is provided. The lens body includes a lens first surface that has two convex portions or two concave portions that extend in parallel to each other in a constant direction and have the same shape, and a lens second surface. Laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.
摘要:
A position measurement system includes a marker set attached to an object, a camera and a computing apparatus. The marker set includes three or more directed basic markers each having a shape indicating a direction. The directed basic markers are oriented in directions toward a specific point. A positional relationship among the directed basic markers is known. The camera includes a two-dimensional imaging device configured to take an image of the marker set. The computing apparatus computes at least one of a position of the object and an angle of the object based on an image, taken by the camera, of the directed basic markers, which are oriented in the directions toward the specific point.
摘要:
A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
摘要:
An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.