摘要:
A graphics pipeline for use with a high resolution display is disclosed. The graphics pipeline comprises a frame buffer configuration. The frame buffer configuration includes a first mode area and a second mode area. The graphics pipeline further includes a display pipeline for obtaining data from the frame buffer configuration. The display pipeline includes a controller. The controller provides pixels from the first mode area to the display as is. Finally, the controller expands pixels from the second mode area and provides the expanded pixels to the display. Accordingly, a system and method in accordance with the present invention solves the GUI problem (small icon and small menu text) of high resolution display by allowing the 3D Graphics Window to display fine pitch pictures while being able to display images in the 2D graphics window in a useable form. The system and method in accordance does not depend on the types of drawing objects (line or surface), drawing order, and crossover.
摘要:
A compound represented by the general formula (1): Q1-Q2-T0-N(R1)-Q3-N(R2) -T1-Q4 (1) wherein R1 and R2 are hydrogen atoms or the like; Q1 is a saturated or unsaturated, 5- or 6-membered cyclic hydrocarbon group which may be substituted, or the like; Q2 is a single bond or the like; Q3 is a group in which Q5 is an alkylene group having 1 to 8 carbon atoms, or the like; and T0 and T1 are carbonyl groups or the like; a salt thereof, a solvate thereof, or an N-oxide thereof. The compound is useful as an agent for preventing and/or treating cerebral infarction, cerebral embolism, myocardial infarction, angina pectoris, pulmonary infarction, pulmonary embolism, Buerger's disease, deep venous thrombosis, disseminated intravascular coagulation syndrome, thrombus formation after valve or joint replacement, thrombus formation and reocclusion after angioplasty, systemic inflammatory response syndrome (SIRS), multiple organ dysfunction syndrome (MODS), thrombus formation during extracorporeal circulation, or blood clotting upon blood drawing.
摘要:
A program is provided for setting efficiently, and with precision, the inspection conditions of an inspection device that detects particles and deformed patterns in or on products such as semiconductor integrated circuits that are manufactured by simultaneously forming a plurality of products on a single substrate. In particular, the system achieves greater efficiency of the setting of cell comparison regions and the setting of non-inspection regions. Input processing of a product type code, input processing of chip size and configuration information, reading processing of circuit layout data, extraction processing of repeated pattern region coordinates, extraction processing of sparse region coordinates and circuit pattern condition registration processing are sequentially executed.
摘要:
A program is provided for setting efficiently, and with precision, the inspection conditions of an inspection device that detects particles and deformed patterns in or on products such as semiconductor integrated circuits that are manufactured by simultaneously forming a plurality of products on a single substrate. In particular, the system achieves greater efficiency of the setting of cell comparison regions and the setting of non-inspection regions. Input processing of a product type code, input processing of chip size and configuration information, reading processing of circuit layout data, extraction processing of repeated pattern region coordinates, extraction processing of sparse region coordinates and circuit pattern condition registration processing are sequentially executed.
摘要:
An inspection system comprises an inspection machine for inspecting a work which is processed in one of the manufacturing processes of a manufacturing line and an analysis system for outputting an inspection history list obtained by making calculations from the inspected result. The inspection history list shows a matrix of first information as the inspection processes in which the work is inspected or the manufacturing processes corresponding to the inspection processes in which the work is inspected and second information as to the works inspected by the inspection machine.
摘要:
The present invention relates to a method and system of inspecting a product, including extracting defects from the product, classifying the defects on the basis of information about the extracted defects representing the analogy of the defects, extracting the feature data of the defects on the basis of the result of defect classification, and feeding back the feature data of the extracted defects for inspection. The method and system is characterized in that the extracted feature data of the defects is fed back for inspecting the product. The present invention also relates to a method of manufacturing a semiconductor electric or electronic device, including extracting defects from the semiconductor electric or electronic device, classifying the defects on the basis of information about the extracted defects representing the analogy of the defects, extracting the feature data of the defects on the basis of the result of defect classification, and feeding back the feature data of the extracted defects to an apparatus for manufacturing the semiconductor electric or electronic device.
摘要:
A vertically extending menu bar is displayed at the right or left end of a screen, and a pull-down menu is further displayed which downwardly extends in an arc from a selected item of the menu bar to the center. The invention facilitates the use of a computer I/O device in which a liquid crystal display device and a touch sensor are integrated. The character string display of each menu bar item is inclined and space is omitted. The locus along which the pull-down menu extends can be calibrated to the user.
摘要:
The invention relates to a method of inspecting and correcting a thin film transistor liquid crystal substrate and an apparatus therefor, where a plurality of scan lines and signal lines are connected electrically in common at each one terminal side respectively, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of applying voltage between the scan lines and the signal lines, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of stopping the voltage application, and the scan lines and the signal lines relating to variation of the heating state are detected from difference or quotient between an infrared image at the voltage applying state and an infrared image at the stopping state of voltage application, thereby a pixel address with a shortcircuit defect occurring is specified. If an image part being equal to the set threshold value or more does not exist in the difference infrared image in the pixel address, a wiring pattern position in the pixel address is detected from a visible image of the pixel address, and this wiring pattern and one from a neighboring pixel address are compared to detect a short circuit defect which can be removed by laser.
摘要:
Modified PTFE fine powder which comprises colloidal particles of a copolymer comprising repeating units derived from tetrafluoroethylene and 0.02 to 0.3 % by weight, preferably 0.03 to 0.2% by weight of repeating units derived from at least one fluoroalkyl vinyl ether selected from compounds of the formula:X(CF.sub.2).sub.n OCF.dbd.CF.sub.2 (I)wherein X is a hydrogen, fluorine or chlorine atom and n is an integer of 1 to 6, andC.sub.3 F.sub.7 (OCF.sub.2 CF.sub.2 CF.sub.2).sub.m [OCF(CF.sub.3)CF.sub.2 ].sub.1 OCF.dbd.CF.sub.2 (II)wherein m and 1 are each an integer of 0 to 4 provided that at least one of them is not zero, which has a number average particle size of 0.05 to 0.6 .mu.m, wherein the copolymer has a specific melt viscosity of from 6.times.10.sup.10 to 30.times.10.sup.10 poise, preferably from 8.0.times.10.sup.10 to 25.times.10.sup.10 poise at 380.degree. C. and a standard specific gravity (SSG, hereinafter defined) of from 2.135 to 2.175, preferably from 2.140 to 2.160 and a paste extruded article of the polymer has a green elongation of at least 400% is provided.
摘要:
In an ultrasonic wave nebulizer having a piezoelectric vibrator (1) at the bottom of a water container for exciting ultrasonic vibration of water on the water surface to convert water to mist, a flat plate (16) having a center aperture (15) is provided above the vibrator (1) with a spacing (Z) between the plate (16) and the vibrator (1), so that the aperture (15) is positioned above the center of the vibrator (1). The plate (16) has no further apertures except the center aperture (15). The diameter (D) of the aperture (15) is smaller than the diameter (A) of the vibrator (1). The presence of the aperture (15) above the vibrator (1) improves the performance of the nebulizer, and increases the generation of mist.