SEMICONDUCTOR MEMORY DEVICE
    21.
    发明申请

    公开(公告)号:US20220352170A1

    公开(公告)日:2022-11-03

    申请号:US17725069

    申请日:2022-04-20

    Abstract: A semiconductor memory device includes a word line extending in a vertical direction, a semiconductor pattern having a ring-shaped horizontal cross-section that extends around the word line, a bit line disposed at a first end of the semiconductor pattern, and a capacitor structure disposed at second end of the semiconductor pattern. The capacitor structure includes a lower electrode layer electrically connected to the second end of the semiconductor pattern, having a ring-shaped horizontal cross-section, and including a connector extending in the vertical direction. A first segment extends in a horizontal direction from an upper end of the connector, and a second segment extends in the horizontal direction from a lower end of the connector. An upper electrode layer surrounded by the lower electrode layer, extends in the vertical direction, and a capacitor dielectric layer is between the lower electrode layer and the upper electrode layer.

    SEMICONDUCTOR MEMORY DEVICE
    22.
    发明申请

    公开(公告)号:US20220216239A1

    公开(公告)日:2022-07-07

    申请号:US17503713

    申请日:2021-10-18

    Abstract: A semiconductor memory device is disclosed. The semiconductor memory device may include a data storage layer including data storage devices, an interconnection layer disposed on the data storage layer, and a selection element layer provided between the data storage layer and the interconnection layer. The interconnection layer may include bit lines extending in a first direction. The selection element layer may include a cell transistor connected between one of the data storage devices and one of the bit lines, and the cell transistor may include an active pattern and a word line, which crosses the active pattern and is extended in a second direction crossing the first direction.

    SEMICONDUCTOR DEVICES INCLUDING SEMICONDUCTOR PATTERN

    公开(公告)号:US20250113590A1

    公开(公告)日:2025-04-03

    申请号:US18976522

    申请日:2024-12-11

    Abstract: A semiconductor device includes a first conductive line and a second conductive line spaced apart from the first conductive line. A semiconductor pattern is disposed between the first conductive line and the second conductive line. The semiconductor pattern includes a first semiconductor pattern having first-conductivity-type impurities disposed adjacent to the first conductive line. A second semiconductor pattern having second-conductivity-type impurities is disposed adjacent to the second conductive line. A third semiconductor pattern is disposed between the first semiconductor pattern and the second semiconductor pattern. The third semiconductor pattern includes a first region disposed adjacent to the first semiconductor pattern and a second region disposed between the first region and the second semiconductor pattern. At least one of the first region and the second region comprises an intrinsic semiconductor layer. A first gate line crosses the first region and a second gate line crosses the second region.

    ELECTRONIC DEVICE AND METHOD FOR CONTROLLING BATTERY CHARGING IN THE ELECTRONIC DEVICE

    公开(公告)号:US20240421613A1

    公开(公告)日:2024-12-19

    申请号:US18742518

    申请日:2024-06-13

    Inventor: Kyunghwan LEE

    Abstract: An electronic device according to an embodiment may include: a battery, load, charging circuitry, and control circuitry. The charging circuitry may include a plurality of switches and be configured to, in a PPS mode, receive power adjusted in each specified charging period according to a charge amount of the battery from an external electronic device, convert a voltage of the received power based on a specified voltage conversion ratio using the plurality of switches, and supply the voltage-converted power to the battery and the load. The control circuitry may be configured to: control a gate voltage of at least one specified switch of the plurality of switches, based on a voltage of the battery being higher than a maximum allowed charging voltage or a current of the battery being higher than a maximum allowed charging current during the PPS mode.

    INTERGRATED CIRCUIT DEVICES
    25.
    发明公开

    公开(公告)号:US20240322048A1

    公开(公告)日:2024-09-26

    申请号:US18606081

    申请日:2024-03-15

    CPC classification number: H01L29/7926 H10B12/482 H10B12/485 H10B12/488

    Abstract: Provided is an integrated circuit device including a source line extending in a first horizontal direction on a substrate, a channel layer extending in a vertical direction, disposed on the source line, and having a first sidewall and a second sidewall, a trapping layer on the first sidewall of the channel layer and including an oxide semiconductor, a word line on at least one sidewall of the trapping layer and extending in a second horizontal direction crossing the first horizontal direction, a gate insulation layer between the at least one sidewall of the trapping layer and the word line, and a bit line electrically connected to the channel layer and extending in the first horizontal direction, wherein the channel layer has a first bandgap energy, and the trapping layer has a second bandgap energy that is greater than the first bandgap energy.

    SEMICONDUCTOR DEVICE
    27.
    发明公开

    公开(公告)号:US20230389290A1

    公开(公告)日:2023-11-30

    申请号:US18200135

    申请日:2023-05-22

    Abstract: A semiconductor device includes a first single crystal semiconductor pattern including a first source/drain region, a second source/drain region, and a first vertical channel region between the first source/drain region and the second source/drain region, the second source/drain region being at a higher level than the first source/drain region; a first gate electrode facing a first side surface of the first single crystal semiconductor pattern; a first gate dielectric layer, the first gate dielectric layer including a portion between the first single crystal semiconductor pattern and the first gate electrode; and a complementary structure in contact with a second side surface of the first single crystal semiconductor pattern, wherein the complementary structure includes an oxide semiconductor layer.

    SEMICONDUCTOR DEVICE
    28.
    发明公开

    公开(公告)号:US20230380176A1

    公开(公告)日:2023-11-23

    申请号:US18102349

    申请日:2023-01-27

    CPC classification number: H10B51/30 H10B51/40

    Abstract: A semiconductor device includes a cell region including a plurality of memory cells, and a peripheral circuit region controlling the plurality of memory cells. Each of the plurality of memory cells includes a first active region and a second active region adjacent to each other, a first channel layer and a second channel layer extending in the first direction, connected to the first active region and the second active region, and separated from each other in the third direction, a first ferroelectric layer and a first gate electrode layer sequentially provided on the first channel layer, and a second ferroelectric layer and a second gate electrode layer sequentially provided on the second channel layer. The first gate electrode layer and the second gate electrode layer are separated from each other in the third direction.

    THREE-DIMENSIONAL NON-VOLATILE MEMORY DEVICE INCLUDING HORIZONTAL CHANNEL REGION

    公开(公告)号:US20230292522A1

    公开(公告)日:2023-09-14

    申请号:US18055974

    申请日:2022-11-16

    CPC classification number: H10B51/20 H10B51/10 H10B51/40

    Abstract: A three-dimensional non-volatile memory device includes a memory cell array including a plurality of memory cells repeatedly arranged in a first lateral direction, a second lateral direction, and a vertical direction on a substrate. The first lateral direction and the second lateral direction are parallel to a main surface of the substrate and perpendicular to each other, and the vertical direction is perpendicular to the main surface of the substrate. The memory cell array includes a plurality of horizontal channel regions and a vertical word line. The plurality of horizontal channel regions extend in the first lateral direction on the substrate. The plurality of horizontal channel regions overlap each other and are apart from each other in the vertical direction. The vertical word line passes through the plurality of horizontal channel regions in the vertical direction.

    MEMORY DEVICE
    30.
    发明公开
    MEMORY DEVICE 审中-公开

    公开(公告)号:US20230180453A1

    公开(公告)日:2023-06-08

    申请号:US18054986

    申请日:2022-11-14

    CPC classification number: H01L27/10802

    Abstract: A memory device is provided. The memory device includes a substrate, a fin structure on the substrate, a gate structure on the fin structure, a first source/drain at one end of the fin structure, and a second source/drain at the other end of the fin structure, wherein the gate structure includes a trap layer, a blocking layer, and a gate electrode layer sequentially stacked on the fin structure, the first source/drain is doped with or has incorporated therein dopants of a first conductivity-type, and the second source/drain is doped with or has incorporated therein dopants of a second conductivity-type dopants that are different from the dopants of the first conductivity-type.

Patent Agency Ranking