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公开(公告)号:US20180330787A1
公开(公告)日:2018-11-15
申请号:US16044280
申请日:2018-07-24
Inventor: Marco Pasotti , Marcella Carissimi , Vikas Rana
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0004 , G11C13/0026 , G11C2013/0078
Abstract: A method is provided for operating a memory device that includes an array of memory cells coupled to a plurality of bitlines. A memory cell is selected from among the array of memory cells. The selected memory cell is coupled to a selected bitline. During a program operation, a program current pulse is injected into the selected memory cell via a first switch coupled to the bitline. At an end of the program current pulse, the selected bitline is discharged via a second switch coupled to the bitline.
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公开(公告)号:US20170178727A1
公开(公告)日:2017-06-22
申请号:US15433795
申请日:2017-02-15
Inventor: Marco Pasotti , Marcella Carissimi , Vikas Rana
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0004 , G11C13/0026 , G11C2013/0078
Abstract: An integrated circuit includes an array of phase-change memory (PCM) cells, and bitlines coupled to the array of PCM cells. The integrated circuit also includes a first decoder circuit having a respective plurality of transistors having a first conductivity type being coupled together and to a given bitline from among the plurality thereof and configured to inject a program current pulse into a selected PCM cell. In addition, the integrated circuit includes a second decoder circuit having a plurality of transistors having a second conductivity type being coupled together and to the given bitline and configured to discharge the given bitline at an end of the program current pulse.
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公开(公告)号:US09613692B1
公开(公告)日:2017-04-04
申请号:US14971488
申请日:2015-12-16
Inventor: Marco Pasotti , Marcella Carissimi , Rajat Kulshrestha , Chantal Auricchio
IPC: G11C13/00
CPC classification number: G11C13/004 , G11C7/065 , G11C7/08 , G11C13/0004 , G11C13/0026 , G11C13/0028 , G11C13/0061 , G11C13/0097 , G11C2013/0042 , G11C2207/002
Abstract: A memory device includes an array of phase-change memory (PCM) cells and complementary PCM cells. A column decoder is coupled to the array of PCM cells and complementary PCM cells, and a sense amplifier is coupled to the column decoder. The sense amplifier includes a current integrator configured to receive first and second currents of a given PCM cell and complementary PCM cell, respectively. A current-to-voltage converter is coupled to the current integrator and is configured to receive the first and second currents, and to provide first and second voltages of the given PCM cell and complementary PCM cell to first and second nodes, respectively. A logic circuit is coupled to the first and second nodes and is configured to disable the column decoder and to discharge the bitline and complementary bitline voltages in response to the first and second voltages.
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公开(公告)号:US20230110870A1
公开(公告)日:2023-04-13
申请号:US17490976
申请日:2021-09-30
Inventor: Laura Capecchi , Marcella Carissimi , Marco Pasotti , Vikas Rana , Vivek Tyagi
Abstract: A system and method for operating a memory cell is provided. A non-volatile memory storage device includes an array of memory cells of differential or single-ended type. In an embodiment, a regulator is coupled to a sense amplifier. The regulator is configured to generate a voltage to gate terminals of one or two transistors of the sense amplifier. In the differential type, the voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a maximum current flowing in a memory cell being in a RESET state and a fixed current. In the single-ended type, the regulated voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a fixed current and the reference current generated by the reference current source across temperature.
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公开(公告)号:US11282573B2
公开(公告)日:2022-03-22
申请号:US16904869
申请日:2020-06-18
Applicant: STMicroelectronics S.r.l.
Inventor: Davide Manfre′ , Laura Capecchi , Marcella Carissimi , Marco Pasotti
Abstract: A non-volatile memory device includes a memory array, a reading circuit, a column decoder stage, and a read supply voltage generator. The column decoder stage includes selectable bitlines and selection switches. A read supply voltage generator includes a voltage regulation circuit and a dummy column decoder coupled to an output of the voltage regulation circuit and having electrical characteristics correlated to the selected read path. The voltage regulation circuit is configured to receive a first electrical quantity correlated to a desired voltage value on the selected bitline and a second electrical quantity correlated to a desired current value for the selected bitline and to generate a regulated read supply voltage for the column decoder stage.
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公开(公告)号:US20210366554A1
公开(公告)日:2021-11-25
申请号:US17306266
申请日:2021-05-03
Inventor: Fabio Enrico Carlo Disegni , Laura Capecchi , Marcella Carissimi , Vikas Rana , Cesare Torti
Abstract: An embodiment non-volatile memory device includes an array of memory cells in rows and columns; a plurality of local bitlines, the memory cells of each column being coupled to a corresponding local bitline; a plurality of main bitlines, each main bitline being coupleable to a corresponding subset of local bitlines; a plurality of program driver circuits, each having a corresponding output node and injecting a programming current in the corresponding output node, each output node coupleable to a corresponding subset of main bitlines. Each program driver circuit further includes a corresponding limiter circuit that is electrically coupled, for each main bitline of the corresponding subset, to a corresponding sense node whose voltage depends, during writing, on the voltage on the corresponding main bitline. Each limiter circuit turns off the corresponding programming current, in case the voltage on any of the corresponding sense nodes overcomes a reference voltage.
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公开(公告)号:US20210035637A1
公开(公告)日:2021-02-04
申请号:US16940837
申请日:2020-07-28
Applicant: STMicroelectronics S.r.l.
Inventor: Laura Capecchi , Marco Pasotti , Marcella Carissimi , Riccardo Zurla
Abstract: A current-generator circuit includes an output-current generator circuit having a control branch to be coupled to a control current generator and adapted to provide a control current pulse and a driver electrically coupled between the control branch and the output leg. A compensation circuit includes a first compensation branch configured to generate a compensation current pulse that is a function of the control current pulse and a second compensation branch coupled in a current mirror configuration with the first compensation branch to receive the compensation current pulse. The second compensation branch includes a resistive block having an electrical resistance that is a function of a resistance of an output load. The second compensation branch is electrically coupled to the control branch and the driver is electrically coupled to the control branch and to the output leg.
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公开(公告)号:US20210020237A1
公开(公告)日:2021-01-21
申请号:US16931335
申请日:2020-07-16
Applicant: STMicroelectronics S.r.l.
Inventor: Marcella Carissimi , Laura Capecchi , Marco Pasotti , Fabio Enrico Carlo Disegni
IPC: G11C13/00
Abstract: A sense amplifier and a method for accessing a memory device are disclosed. In an embodiment a sense amplifier for a memory device includes a first input node selectively coupled to a first memory cell through a first local bitline and a first main bitline, a second input node selectively coupled through a second local bitline and a second main bitline to a second memory cell or to a reference generator configured to generate a reference current, a first current generator controllable so as to inject a first variable current into the first input node, a second current generator controllable so as to inject a second variable current into the second input node, a first branch coupled to the first input node and comprising a first switch circuit, a first sense transistor and a first forcing transistor and a second branch coupled to the second input node and including a second switch circuit, a second sense transistor and a second forcing transistor.
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29.
公开(公告)号:US20190130970A1
公开(公告)日:2019-05-02
申请号:US16169763
申请日:2018-10-24
Applicant: STMicroelectronics S.r.l.
Inventor: Marcella Carissimi , Marco Pasotti , Chantal Auricchio
IPC: G11C13/00
Abstract: The ROM device has a memory array including memory cells formed by an access element and a data storage element; a high voltage column decoder stage; a high voltage row decoder stage; an analog stage; and a writing stage, wherein the data storage elements are electrically non-programmable and non-modifiable. The memory array is formed by memory cells having a first logic state and by memory cells having a second logic state. The data storage element of the memory cells having the first logic state is formed by a continuous conductive path uninterruptedly connecting the access transistor to the respective bit line, the data storage element of the memory cells having the second logic state is formed by a region of dielectric material insulating the access transistor from the respective bit line.
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公开(公告)号:US20170200483A1
公开(公告)日:2017-07-13
申请号:US15471028
申请日:2017-03-28
Applicant: STMicroelectronics S.r.l.
Inventor: Marcella Carissimi , Marco Pasotti , Fabio De Santis
CPC classification number: G11C7/22 , G11C7/06 , G11C7/062 , G11C7/08 , G11C7/10 , G11C16/0441 , G11C16/28
Abstract: A non-volatile memory of a complementary type includes sectors of memory cells, with each cell formed by a direct memory cell and a complementary memory cell. Each sector is in a non-written condition when the corresponding memory cells are in equal states and is in a written condition wherein each location thereof stores a first logic value or a second logic value when the memory cells of the location are in a first combination of different states or in a second combination of different states, respectively. A sector is selected and a determination is made as to a number of memory cells in the programmed state and a number of memory cells in the erased state. From this information, the condition of the selected sector is identified from a comparison between the number of memory cells in the programmed state and the number of memory cells in the erased state.
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