Adjusting log likelihood ratio values to compensate misplacement of read voltages
    23.
    发明授权
    Adjusting log likelihood ratio values to compensate misplacement of read voltages 有权
    调整对数似然比值以补偿读取电压的错位

    公开(公告)号:US09396792B2

    公开(公告)日:2016-07-19

    申请号:US14195058

    申请日:2014-03-03

    CPC classification number: G11C11/5642 G06F11/1048 G06F11/1072 G11C29/52

    Abstract: An apparatus having a circuit and an interface to a nonvolatile memory is disclosed. The circuit is configured to (i) perform one or more attempts of a soft-decision decode of data stored in the nonvolatile memory, where soft-decision decode uses a plurality of log likelihood ratio values stored in a table, (ii) generate one or more adjusted log likelihood ratio values by adding a constant value to one or more of the log likelihood ratio values in response to a failure to decode the data using the log likelihood ratio values and (iii) re-decode the data using the adjusted log likelihood ratio values.

    Abstract translation: 公开了一种具有电路和与非易失性存储器的接口的装置。 电路被配置为(i)执行对存储在非易失性存储器中的数据的软判决解码的一个或多个尝试,其中软判决解码使用存储在表中的多个对数似然比值,(ii)生成一个 或更多调整的对数似然比值,通过将响应于使用对数似然比值对数据进行解码的一个或多个对数似然比值来增加常数值,以及(iii)使用调整后的记录重新解码数据 似然比值。

    Mitigating data errors in a storage device

    公开(公告)号:US11500547B2

    公开(公告)日:2022-11-15

    申请号:US17168786

    申请日:2021-02-05

    Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

    MITIGATING DATA ERRORS IN A STORAGE DEVICE

    公开(公告)号:US20210181954A1

    公开(公告)日:2021-06-17

    申请号:US17168786

    申请日:2021-02-05

    Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

    Enhanced address compaction
    27.
    发明授权

    公开(公告)号:US10705970B1

    公开(公告)日:2020-07-07

    申请号:US15594524

    申请日:2017-05-12

    Abstract: An apparatus may include a circuit configured to determine a first encoded address is in a bitwise range of addresses, determine a first physical address in a storage memory from the first encoded address using bitwise mapping and retrieve first data from the first physical address in the storage memory. The circuit may further be configured to determine a second encoded address is in an offset linear range of addresses, determine a second physical address in the storage memory from the second encoded address using offset linear mapping and write second data to the second physical address in the storage memory.

    Read retry operations with estimation of written data based on syndrome weights

    公开(公告)号:US10276247B2

    公开(公告)日:2019-04-30

    申请号:US15205654

    申请日:2016-07-08

    Abstract: Methods and apparatus are provided for read retry operations that estimate written data based on syndrome weights. One method comprises reading a codeword from a memory multiple times using multiple read reference voltages; obtaining a syndrome weight for each of the readings of the codeword; identifying a given reading of the codeword having a substantially minimum syndrome weight; and estimating a written value of the codeword based on the given reading. Two cell voltage probability distributions of cell voltages are optionally calculated for each possible cell state of the memory, based on the estimated written value and plurality of readings of the codeword. The cell voltage probability distributions are used to (i) dynamically select log likelihood ratio values for a failing page, (ii) determine a read reference voltage that gives a desired log likelihood ratio value, or (iii) dynamically select log likelihood ratio values for the page populations associated with the distributions.

Patent Agency Ranking