摘要:
An overridable data protection mechanism for unlocking/locking a PLD includes a data protect override key register, an input key register, and a comparator. After the user inputs an access code to the input key register, the software program sends an enabling signal to the comparator which in turn compares the bits stored in the data protect override key register and the bits in the input key register. If the bits in the two registers are identical, then the comparator outputs a disable data protect signal, thereby allowing the user to modify the configuration data in that PLD. After an incremented version control number and the new configuration data are downloaded to the PLD, the program sends a disabling signal to the comparator, thereby preventing further modification to the configuration data on that PLD.
摘要:
The present invention provides an efficient programming verification system for Programmable Logic Devices (PLDs). Based upon IEEE JTAG standard boundary scan test architecture, the invention provides a novel test architecture including a configuration register and a signature analyzer coupled between the TDI and TDO pins of the JTAG architecture. The configuration register of the invention comprises three parts: an address register/counter, a data register, a status register. The address register/counter performs dual functions depending upon an instruction received by an instruction register. The invention eliminates the need to load each address sequentially into the address register/counter for programming by enabling the address register/counter to auto-increment the address for memory locations. After loading an initial address value, the address register/counter automatically increments the address for programming memory cells. To verify PLD programming, the invention applies a signature analyzer coupled between the TDI and TDO pins. A single input linear feedback shift register (SISR) or multiple LFSR (MISR) can be used to implement a signature analyzer in accordance with the invention. SISR or MISR uses a characteristic polynomial to generate a near-unique signature checksum for an input sequence. The accumulated signature checksum is then provided serially through the TDO pin for inspection.
摘要:
A voltage regulator for a charge pump is provided with two input paths from a reference input voltage to a comparator, each path having a node between a capacitor pair. The two paths are alternately initialized and used to control the charge pump which generates a reference output voltage, so that the reference output voltage tracks the reference input voltage at all times. Each path has its own capacitor divider and switching circuitry to alternately connect the nodes between the respective pairs of capacitors to the comparator, which compares the nodes to a second voltage reference. Since the circuit is alternately initialized, any alterations to the voltage introduced at the nodes between each of the two capacitor pairs, are corrected to the proper level within a short time.
摘要:
A programmable logic device (PLD) including configurable circuitry for altering the speed-versus-power characteristics of the PLD after production, and for allowing the PLD to selectively operate on either a 3.3-volt or a 5-volt power supply. The configurable circuitry includes an input buffer, an output buffer and a reference generator. The input buffer includes a dedicated P-channel transistor connected in series with a dedicated N-channel transistor, and a plurality of trip-point adjustment transistors which are selectively connected in parallel with the dedicated transistors to adjust the trip-point of the input buffer by altering the N-to-P ratio. The output buffer includes two configurable buffers whose trip-points are also adjustable. A configurable reference generator is also provided for generating a high precision reference voltage which is supplied to the sense amplifiers located in the function blocks and interconnect matrix of the PLD.
摘要:
A programmable logic device (PLD) performs a self-test erase check operation on memory elements to verify if the PLD is completely erased. The output signals of the sense amplifiers associated with the PLD bitlines drive a plurality of NMOS devices. The NMOS devices share a common source (node), thereby providing in effect an n-input NOR gate, where n is the number of bitlines in the array. The memory cells associated with an entire wordline of the PLD memory array are simultaneously checked for an erased state by bringing the wordline under test high while keeping all other wordlines low. If all of the memory cells on a wordline are erased, every sense amplifier output is low, all of the NMOS devices are off, and the output signal of the NOR gate is high due to a weak pull-up on the common node, thereby indicating that the whole column is properly erased. If one or more memory cells on the selected wordline are not completely erased, then at least one sense amplifier output is high because the cell is not able to pull its bitline low to switch the sense amplifier. The high output of the sense amplifier turns on its associated NMOS device, thereby pulling down the voltage on the common node and providing a low output signal from the NOR gate, thereby indicating that additional erasing of the array is necessary.
摘要:
A sense amplifier is provided that automatically determines its enabled/disabled state. The sense amplifier includes a latch to store the enable/disable signals. A global power-on-reset signal during initialization sets the state of this latch to a default configuration which disables, i.e. powers down, the sense amplifier. During configuration, an active latch enable signal forces the sense amplifier into an enable ready state. Then, a high signal is provided to each wordline associated with the bitline of the sense amplifier. This causes any erased memory cell driven by the wordlines to pull the associated bitline into a bitline low state and causes the sense amplifier output signal to switch states. This switch causes the latch to be overwritten with the opposite state, thereby enabling the sense amplifier. When the latch enable signal goes inactive after configuration of the device, the latch is set such that the sense amplifier remains enabled, i.e. powered up. If there are no erased cells on the bitline, i.e. all of the cells are programmed, then the sense amplifier output signal remains the same, and the latch is not overwritten. Thus, when the latch enable signal returns to a high state, the sense amplifier remains disabled. Therefore, any sense amplifier that is not needed in the design, indicated by the lack of erased memory cells, remains disabled. In this manner, the present invention advantageously powers down all unused sense amplifiers automatically, thereby significantly reducing power consumption and minimizing overhead while maximizing the programmability of the device.